J. T. Wallmark

1.1k citations
43 papers · 789 · h-index 12

Impact in

Papers in

J. T. Wallmark

40 papers receiving 698 citations

Peers

J. T. Wallmark
Comparison fields: 5 of 83
  • Management of Technology and Innovation 121
  • Instrumentation 35
  • Hardware and Architecture 54
  • Electrical and Electronic Engineering 421
  • Statistics, Probability and Uncertainty 49
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Citations per field
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Citations per year

Countries citing papers authored by J. T. Wallmark

Since Specialization
Citations

This map shows the geographic impact of J. T. Wallmark's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. T. Wallmark with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. T. Wallmark more than expected).

Fields of papers citing papers by J. T. Wallmark

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. T. Wallmark. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. T. Wallmark. The network helps show where J. T. Wallmark may publish in the future.

Co-authors

The 9 scholars most cited alongside J. T. Wallmark, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. T. Wallmark Line = papers co-authored together J. T. Wallmark links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 43 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1957294
2 196298
3 199768
4 198251
5 197350
6 196028
7 196922
8 198621
9 199119
10 198818
11
Field-effect transistors : physics, technology and applications
196616
12 198815
13 198411
14 196611
15 19798
16 19598
17 19825
18 19634
19 19634
20 19614

About J. T. Wallmark

J. T. Wallmark is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Control and Systems Engineering, Media Technology and Computer Science Applications, having authored 43 papers that have together received 789 indexed citations. Recurring topics across this work include Advancements in Semiconductor Devices and Circuit Design (10 papers), Semiconductor Quantum Structures and Devices (9 papers), Semiconductor materials and devices (7 papers), Gyrotron and Vacuum Electronics Research (5 papers), scientometrics and bibliometrics research (3 papers), Semiconductor Lasers and Optical Devices (3 papers), Advanced Semiconductor Detectors and Materials (3 papers) and GaN-based semiconductor devices and materials (2 papers). The work is most often cited by research in Management of Technology and Innovation (121 citations), Instrumentation (35 citations), Hardware and Architecture (54 citations), Electrical and Electronic Engineering (421 citations) and Statistics, Probability and Uncertainty (49 citations). J. T. Wallmark has collaborated with scholars based in United States, Sweden and Israel. Frequent co-authors include D H McQueen, Douglas H. McQueen, J. Orloff, Eric Munro, Bernard M. Kramer, Peter Mark, Robert L. Harvey, C. K. Wentworth and Ivan Gordon. Their work appears in journals such as IEEE Transactions on Engineering Management, IEEE Transactions on Electron Devices, Technovation, Omega and Journal of Applied Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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