J. Schardt

1.1k total citations
23 papers, 882 citations indexed

About

J. Schardt is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, J. Schardt has authored 23 papers receiving a total of 882 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Electrical and Electronic Engineering, 9 papers in Electronic, Optical and Magnetic Materials and 7 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in J. Schardt's work include Silicon Carbide Semiconductor Technologies (16 papers), Semiconductor materials and devices (10 papers) and Copper Interconnects and Reliability (9 papers). J. Schardt is often cited by papers focused on Silicon Carbide Semiconductor Technologies (16 papers), Semiconductor materials and devices (10 papers) and Copper Interconnects and Reliability (9 papers). J. Schardt collaborates with scholars based in Germany, Australia and Spain. J. Schardt's co-authors include Ulrich Starke, K. Heinz, J. Bernhardt, Matthias Franke, Karsten Reuter, H. Wedler, J. Furthmüller, P. Käckell, F. Bechstedt and W. Weiß and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

J. Schardt

23 papers receiving 862 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
J. Schardt Germany 17 624 406 257 205 76 23 882
Fredrik Owman Sweden 14 767 1.2× 479 1.2× 379 1.5× 212 1.0× 131 1.7× 15 1.1k
R. L. Hengehold United States 17 704 1.1× 603 1.5× 327 1.3× 234 1.1× 73 1.0× 84 1.0k
J. Bąk‐Misiuk Poland 15 508 0.8× 455 1.1× 370 1.4× 154 0.8× 22 0.3× 131 799
R. N. Kyutt Russia 13 337 0.5× 412 1.0× 280 1.1× 145 0.7× 33 0.4× 95 738
H. Niimi United States 17 1.0k 1.7× 495 1.2× 230 0.9× 156 0.8× 54 0.7× 52 1.1k
N. Hirashita Japan 17 866 1.4× 362 0.9× 219 0.9× 80 0.4× 83 1.1× 60 991
A. Misiuk Poland 17 821 1.3× 734 1.8× 415 1.6× 101 0.5× 25 0.3× 244 1.1k
N. Awaji Japan 13 243 0.4× 213 0.5× 109 0.4× 96 0.5× 45 0.6× 40 438
Hideo Sunami Japan 12 452 0.7× 190 0.5× 137 0.5× 63 0.3× 56 0.7× 40 566
J. P. Zielinger France 17 494 0.8× 483 1.2× 291 1.1× 80 0.4× 34 0.4× 43 783

Countries citing papers authored by J. Schardt

Since Specialization
Citations

This map shows the geographic impact of J. Schardt's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Schardt with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Schardt more than expected).

Fields of papers citing papers by J. Schardt

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Schardt. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Schardt. The network helps show where J. Schardt may publish in the future.

Co-authorship network of co-authors of J. Schardt

This figure shows the co-authorship network connecting the top 25 collaborators of J. Schardt. A scholar is included among the top collaborators of J. Schardt based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with J. Schardt. J. Schardt is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Starke, Ulrich, et al.. (2004). Tailoring the SiC Subsurface Stacking by the Chemical Potential. Materials science forum. 457-460. 415–418. 3 indexed citations
2.
Starke, U., J. Schardt, W. Weiß, et al.. (2001). Structural and compositional reversible phase transitions on low-index Fe 3 Si surfaces. Europhysics Letters (EPL). 56(6). 822–828. 26 indexed citations
3.
Heinz, K., Ulrich Starke, J. Bernhardt, & J. Schardt. (2000). Surface structure of hexagonal SiC surfaces: key to crystal growth and interface formation?. Applied Surface Science. 162-163. 9–18. 26 indexed citations
4.
Starke, Ulrich, et al.. (2000). Stacking Rearrangement on SiC Surfaces: A Possible Seed for Polytype Heterostructure Growth. Materials science forum. 338-342. 341–344. 5 indexed citations
5.
Schardt, J., J. Bernhardt, Ulrich Starke, & K. Heinz. (2000). Crystallography of the(3×3)surface reconstruction of3C−SiC(111),4H−SiC(0001),and6H−SiC(0001)surfaces retrieved by low-energy electron diffraction. Physical review. B, Condensed matter. 62(15). 10335–10344. 74 indexed citations
6.
Schardt, J., et al.. (2000). Interface structure of ultrathin CoSi2 films epitaxially grown on Si(111). Applied Physics Letters. 76(6). 727–729. 17 indexed citations
7.
Starke, Ulrich, J. Schardt, J. Bernhardt, Matthias Franke, & K. Heinz. (1999). Stacking Transformation from Hexagonal to Cubic SiC Induced by Surface Reconstruction: A Seed for Heterostructure Growth. Physical Review Letters. 82(10). 2107–2110. 106 indexed citations
8.
Starke, Ulrich, J. Schardt, J. Bernhardt, & K. Heinz. (1999). Reconstructed oxide structures stable in air: Silicate monolayers on hexagonal SiC surfaces. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 17(4). 1688–1692. 37 indexed citations
9.
Starke, Ulrich, J. Bernhardt, J. Schardt, & K. Heinz. (1999). SiC SURFACE RECONSTRUCTION: RELEVANCY OF ATOMIC STRUCTURE FOR GROWTH TECHNOLOGY. Surface Review and Letters. 6(6). 1129–1141. 33 indexed citations
10.
Bernhardt, J., J. Schardt, Ulrich Starke, & K. Heinz. (1999). Epitaxially ideal oxide–semiconductor interfaces: Silicate adlayers on hexagonal (0001) and (0001) SiC surfaces. Applied Physics Letters. 74(8). 1084–1086. 117 indexed citations
11.
Schardt, J., J. Bernhardt, Ulrich Starke, & K. Heinz. (1998). Atomic Structure of Hexagonal 6H– and 3C–SiC Surfaces. Surface Review and Letters. 5(1). 181–186. 19 indexed citations
12.
Starke, Ulrich, J. Schardt, W. Weiß, et al.. (1998). Structure of Epitaxial CoSi2 Films on Si(111) Studied with Low-Energy Electron Diffraction (LEED). Surface Review and Letters. 5(1). 139–144. 16 indexed citations
13.
Reuter, Karsten, J. Schardt, J. Bernhardt, et al.. (1998). LEED holography applied to a complex superstructure: A direct view of the adatom cluster on SiC(111)-(3×3). Physical review. B, Condensed matter. 58(16). 10806–10814. 11 indexed citations
14.
Schardt, J., J. Bernhardt, Matthias Franke, Ulrich Starke, & K. Heime. (1998). Polarity Dependent Step Bunching and Structure of Hexagonal SiC Surfaces. Materials science forum. 264-268. 343–346. 4 indexed citations
15.
Starke, Ulrich, J. Schardt, J. Bernhardt, et al.. (1998). Novel Reconstruction Mechanism for Dangling-Bond Minimization: Combined Method Surface Structure Determination ofSiC(111)-(3×3). Physical Review Letters. 80(4). 758–761. 147 indexed citations
16.
Starke, Ulrich, et al.. (1997). Phase transition and atomic structure of an Fe3Si(100) single crystal surface. Surface Science. 377-379. 539–543. 14 indexed citations
17.
Starke, Ulrich, J. Schardt, & Matthias Franke. (1997). Morphology, bond saturation and reconstruction of hexagonal SiC surfaces. Applied Physics A. 65(6). 587–596. 53 indexed citations
18.
Starke, Ulrich, J. Bernhardt, Matthias Franke, J. Schardt, & K. Heinz. (1997). Structure and morphology of SiC surfaces studied by LEED, AES, HREELS and STM. Diamond and Related Materials. 6(10). 1349–1352. 13 indexed citations
19.
Reuter, Karsten, J. Bernhardt, H. Wedler, et al.. (1997). Holographic Image Reconstruction from Electron Diffraction Intensities of Ordered Superstructures. Physical Review Letters. 79(24). 4818–4821. 48 indexed citations
20.
Schardt, J., et al.. (1995). LEED structure determination of hexagonal α-SiC surfaces. Surface Science. 337(3). 232–242. 33 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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