Iain D. Baikie
- Electrical and Electronic Engineering top 5%
- Materials Chemistry top 10%
- Atomic and Molecular Physics, and Optics top 5%
- Biomedical Engineering top 10%
- Polymers and Plastics top 5%
- Co-authors
- P. J. EstrupJ. A. MeyerB. LägelE. KopatzkiR. Jürgen BehmJi‐Seon KimJames C. SutherlandW. R. Salaneck
- Topics
- Force Microscopy Techniques and Applications (11 papers)Semiconductor materials and devices (11 papers)Surface and Thin Film Phenomena (9 papers)
- Partner nations
- United KingdomUnited StatesNetherlands
In The Last Decade
Iain D. Baikie
51 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 70
- Electrical and Electronic Engineering 1.0k
- Materials Chemistry 708
- Atomic and Molecular Physics, and Optics 455
- Biomedical Engineering 271
- Polymers and Plastics 267
Countries citing papers authored by Iain D. Baikie
This map shows the geographic impact of Iain D. Baikie's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Iain D. Baikie with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Iain D. Baikie more than expected).
Fields of papers citing papers by Iain D. Baikie
This network shows the impact of papers produced by Iain D. Baikie. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Iain D. Baikie. The network helps show where Iain D. Baikie may publish in the future.
Co-authorship network of co-authors of Iain D. Baikie
This figure shows the co-authorship network connecting the top 25 collaborators of Iain D. Baikie. A scholar is included among the top collaborators of Iain D. Baikie based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Iain D. Baikie. Iain D. Baikie is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 9 | |
| 2 | 10 | |
| 3 | 1 | |
| 4 | 7 | |
| 5 | 5 | |
| 6 | 20 | |
| 7 | 14 | |
| 8 | 8 | |
| 9 | 5 | |
| 10 | 33 | |
| 11 | 27 | |
| 12 | 2 | |
| 13 | 2 | |
| 14 | 171 | |
| 15 | 29 | |
| 16 | 9 | |
| 17 | 17 | |
| 18 | 5 | |
| 19 | 9 | |
| 20 | 9 |
About Iain D. Baikie
Iain D. Baikie is a scholar working on Surfaces, Coatings and Films, Structural Biology and Atomic and Molecular Physics, and Optics, having authored 52 papers that have together received 1.6k indexed citations. Recurring topics across this work include Force Microscopy Techniques and Applications (11 papers), Semiconductor materials and devices (11 papers) and Surface and Thin Film Phenomena (9 papers). The work is most often cited by research in Polymers and Plastics (267 citations), Electrical and Electronic Engineering (1.0k citations) and Bioengineering (99 citations). Iain D. Baikie has collaborated with scholars based in United Kingdom, United States and Netherlands. Frequent co-authors include P. J. Estrup, J. A. Meyer, B. Lägel, J. A. Meyer, E. Kopatzki, R. Jürgen Behm, Ji‐Seon Kim, James C. Sutherland, W. R. Salaneck and Ellen Moons. Their work appears in journals such as Nano Letters, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.