I. Golecki

1.2k citations

42 papers · 948 indexed · h-index 15

Impact in

Ceramics and Composites top 5%
- Advanced ceramic materials synthesis
Electrical and Electronic Engineering top 10%
- Semiconductor materials and devices
- Silicon Carbide Semiconductor Technologies
- Silicon and Solar Cell Technologies
- Thin-Film Transistor Technologies

Papers in

Ceramics and Composites 6
- Advanced ceramic materials synthesis 6
Computational Mechanics 17
- Ion-surface interactions and analysis 16

Co-authors: C. Jaccard F. Reidinger Jordi Martı́M‐A. Nicolet S.S. Lau J. W. Mayer B-Y. Tsaur H. M. Manasevit
Journals: Applied Physics Letters (9 papers)Journal of Electronic Materials (3 papers)Journal of The Electrochemical Society (2 papers)Thin Solid Films (2 papers)Physics Letters A (2 papers)
Partner nations: United States Switzerland Israel

In The Last Decade

I. Golecki

41 papers receiving 889 citations

Peers

Countries citing papers authored by I. Golecki

Since Specialization

Citations

This map shows the geographic impact of I. Golecki's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I. Golecki with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I. Golecki more than expected).

Fields of papers citing papers by I. Golecki

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by I. Golecki. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I. Golecki. The network helps show where I. Golecki may publish in the future.

Co-authors

The 25 scholars most cited alongside I. Golecki, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with I. Golecki Line = papers co-authored together I. Golecki links everyone, so they are left out of the graph.

All Works

Sort: Min cites: Since: Top N: Style:

20 of 20 papers shown

#	Work
1	INDUSTRIAL CARBON CHEMICAL VAPOR INFILTRATION (CVI) PROCESSES I. Golecki	2003	2
2	Properties of high thermal conductivity carbon-carbon composites for thermal management applications I. Golecki, John Alcides Camargo, 이영아, G. Malczewski, A. C. Anderson, Fahim Bakhtari Mohammad, Cathy Duncan, S. A. Sinyakina	2002	21
3	Structural characterization of nanometer SiC films grown on Si Applied Physics Letters ·Bhavana Mariserla, A. J. Steckl, I. Golecki, F. Reidinger, J. Collier, X. J. Ning, P. Pirouz	1993	70
4	Single-crystalline, epitaxial cubic SiC films grown on (100) Si at 750 °C by chemical vapor deposition Applied Physics Letters ·I. Golecki, F. Reidinger, Jordi Martı́	1992	150
5	Epitaxial Monocrystalline SiC Films Grown on Si by Low-Pressure Chemical Vapor Deposition at 750°C MRS Proceedings ·I. Golecki, F. Reidinger, Jordi Martı́	1992	6
6	Properties of buried SiC layers produced by carbon ion implantation in (100) bulk silicon and silicon-on-sapphire Journal of Electronic Materials ·I. Golecki, Samir Al-Taweel, H. L. Glass	1987	6
7	Influence of Growth Temperature on the Physical Properties of Si Films on Yttria‐Stabilized, Cubic Zirconia Substrates Journal of The Electrochemical Society ·Alice L. Lin, I. Golecki	1985	3
8	MOSFET performance enhancement by improved SOS material processes Microelectronics Journal ·J. Machura, Alice L. Lin, I. Golecki, H. L. Glass	1984	2
9	Rutherford backscattering and channeling analysis of epitaxial, low-mass films on high-mass substrates Nuclear Instruments and Methods in Physics Research ·I. Golecki	1983	5
10	ChemInform Abstract: SILICON ON CUBIC ZIRCONIA Chemischer Informationsdienst ·H. M. Manasevit, I. Golecki, L. A. Moudy, J. J. Yang, J. E. Mee	1983	1
11	Reduction in crystallographic surface defects and strain in 0.2-μm-thick silicon-on-sapphire films by repetitive implantation and solid-phase epitaxy Applied Physics Letters ·I. Golecki, H. L. Glass, G. Kinoshita	1982	8
12	Measurements of defects and strain in SOS films after cw Ar laser annealing in the liquid phase regime Applications of Surface Science ·I. Golecki, H. L. Glass, G. Kinoshita, T. J. Magee	1981	11
13	Improvement of crystalline quality of epitaxial silicon-on-sapphire by ion implantation and furnace regrowth Solid-State Electronics ·I. Golecki, M‐A. Nicolet	1980	15
14	Advanced undergraduate experiments in vacuum physics and mass spectrometry Journal of Vacuum Science and Technology ·I. Golecki, Andreia Teixeira de Oliveira Santos	1980	9
15	Steady-state thermally annealed GaAs with room-temperature-implanted Si Applied Physics Letters ·M. Färdig, M‐A. Nicolet, I. Golecki, J. L. Tandon, D. K. Sadana, J. Washburn	1980	21
16	A comparison of laser and electron beam pulsed annealing of deposited layers AIP conference proceedings ·S.S. Lau, W. F. Tseng, I. Golecki, Eamonn Kennedy, J. W. Mayer	1979	2
17	Pulsed electron beam induced recrystallization and damage in GaAs Applied Physics Letters ·J. L. Tandon, I. Golecki, M‐A. Nicolet, D. K. Sadana, J. Washburn	1979	6
18	Pulsed electron beam annealing of ion implanted Si layers Radiation Effects ·Eamonn Kennedy, S.S. Lau, I. Golecki, J. W. Mayer, W. F. Tseng, Daniel Ormelius, A. R. Kirkpatrick	1979	3
19	Radiation Damage in Ice at Low Temperatures Studied by Proton Channelling Journal of Glaciology ·I. Golecki, C. Jaccard	1978	0
20	Radiation Damage in Ice at Low Temperatures Studied by Proton Channelling Journal of Glaciology ·I. Golecki, C. Jaccard	1978	5

About I. Golecki

I. Golecki is a scholar working on Ceramics and Composites, Computational Mechanics, Structural Biology, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 42 papers that have together received 948 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (16 papers), Silicon and Solar Cell Technologies (12 papers), Semiconductor materials and interfaces (11 papers), Thin-Film Transistor Technologies (9 papers), Silicon Nanostructures and Photoluminescence (9 papers), Semiconductor materials and devices (7 papers), Advanced ceramic materials synthesis (6 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). The work is most often cited by research in Ceramics and Composites (150 citations), Electrical and Electronic Engineering (506 citations), Atmospheric Science (150 citations), Computational Mechanics (172 citations) and Materials Chemistry (371 citations). I. Golecki has collaborated with scholars based in United States, Switzerland and Israel. Frequent co-authors include C. Jaccard, F. Reidinger, Jordi Martı́, M‐A. Nicolet, S.S. Lau, J. W. Mayer, B-Y. Tsaur, H. M. Manasevit, L. A. Moudy and G. Kinoshita. Their work appears in journals such as Applied Physics Letters, Journal of Electronic Materials, Journal of The Electrochemical Society, Thin Solid Films and Physics Letters A.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact