I. A. Babalola
- Atomic and Molecular Physics, and Optics top 10%
- Electrical and Electronic Engineering
- Surfaces, Coatings and Films top 5%
- Materials Chemistry
- Biomedical Engineering
- Topics
- Surface and Thin Film Phenomena (12 papers)Semiconductor materials and interfaces (11 papers)Electron and X-Ray Spectroscopy Techniques (10 papers)
- Cited by
- Surfaces, Coatings and FilmsAtomic and Molecular Physics, and OpticsRadiological and Ultrasound Technology
- Partner nations
- United StatesNigeriaGreece
In The Last Decade
I. A. Babalola
19 papers receiving 325 citations
Peers
Comparison fields: 5 of 29
- Atomic and Molecular Physics, and Optics 272
- Electrical and Electronic Engineering 200
- Surfaces, Coatings and Films 141
- Materials Chemistry 55
- Biomedical Engineering 42
Countries citing papers authored by I. A. Babalola
This map shows the geographic impact of I. A. Babalola's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I. A. Babalola with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I. A. Babalola more than expected).
Fields of papers citing papers by I. A. Babalola
This network shows the impact of papers produced by I. A. Babalola. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I. A. Babalola. The network helps show where I. A. Babalola may publish in the future.
Co-authorship network of co-authors of I. A. Babalola
This figure shows the co-authorship network connecting the top 25 collaborators of I. A. Babalola. A scholar is included among the top collaborators of I. A. Babalola based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with I. A. Babalola. I. A. Babalola is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 3 | |
| 3 | 26 | |
| 4 | 1 | |
| 5 | 0 | |
| 6 | 27 | |
| 7 | 15 | |
| 8 | 28 | |
| 9 | 17 | |
| 10 | 25 | |
| 11 | 25 | |
| 12 | 22 | |
| 13 | 2 | |
| 14 | 19 | |
| 15 | 22 | |
| 16 | 11 | |
| 17 | 40 | |
| 18 | 37 | |
| 19 | 32 | |
| 20 | 2 |
About I. A. Babalola
I. A. Babalola is a scholar working on Surfaces, Coatings and Films, Radiological and Ultrasound Technology and Atomic and Molecular Physics, and Optics, having authored 20 papers that have together received 355 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (12 papers), Semiconductor materials and interfaces (11 papers) and Electron and X-Ray Spectroscopy Techniques (10 papers). The work is most often cited by research in Surfaces, Coatings and Films (141 citations), Atomic and Molecular Physics, and Optics (272 citations) and Radiological and Ultrasound Technology (26 citations). I. A. Babalola has collaborated with scholars based in United States, Nigeria and Greece. Frequent co-authors include W. E. Spicer, W Petro, I. Lindau, W. E. Spicer, T. Kendelewicz, P. W. Chye, P. E. Gregory, J. A. Silberman, G. Rossi and H. Sunami. Their work appears in journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.