H.F.W. Dekkers

31 papers receiving 588 citations

Peers

H.F.W. Dekkers
Comparison fields: 5 of 42
  • Electrical and Electronic Engineering 563
  • Materials Chemistry 272
  • Atomic and Molecular Physics, and Optics 99
  • Biomedical Engineering 66
  • Mechanics of Materials 27
Replace P. Y. Hung with:
P. Y. Hung United States
H. Rinnert France
Erwann Fourmond France
David Trémouilles France
М. І. Ілащук Ukraine
Yury Kuzminykh Switzerland
C. Huffman United States
Salim El Kazzi Belgium
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V. Hortelano Spain
H.F.W. Dekkers relative to P. Y. Hung United States P. Y. Hung's profile →
Citations per field
00.5×6.9×
P. Y. Hung · 1×
Citations per year

Countries citing papers authored by H.F.W. Dekkers

Since Specialization
Citations

This map shows the geographic impact of H.F.W. Dekkers's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by H.F.W. Dekkers with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites H.F.W. Dekkers more than expected).

Fields of papers citing papers by H.F.W. Dekkers

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by H.F.W. Dekkers. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by H.F.W. Dekkers. The network helps show where H.F.W. Dekkers may publish in the future.

Co-authorship network of co-authors of H.F.W. Dekkers

This figure shows the co-authorship network connecting the top 25 collaborators of H.F.W. Dekkers. A scholar is included among the top collaborators of H.F.W. Dekkers based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with H.F.W. Dekkers. H.F.W. Dekkers is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 2
2 2
3 8
4 20
5 9
6 1
7 47
8 18
9 21
10 63
11 6
12 2
13 37
14 13
15 1
16 52
17 20
18 2
19
Diffusion mechanism of hydrogen through PECVD SiNx:H for a fast defect passivation of mc-Si solar cells
3
20
The influence of surface preparation on rear surface passivation of mc-Si by thermally treated direct PECVD silicon nitride
3

About H.F.W. Dekkers

H.F.W. Dekkers is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Mechanics of Materials, having authored 31 papers that have together received 601 indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (19 papers), Semiconductor materials and devices (19 papers) and Silicon and Solar Cell Technologies (8 papers). The work is most often cited by research in Electrical and Electronic Engineering (563 citations), Materials Chemistry (272 citations) and Atomic and Molecular Physics, and Optics (99 citations). H.F.W. Dekkers has collaborated with scholars based in Belgium, United States and China. Frequent co-authors include G. Beaucarne, Wenzhong Shen, L. Carnel, Sven Van Elshocht, A. Slaoui, Lingling Wu, M. Hiller, Stefan De Gendt, Lucas Petersen Barbosa Lima and J. G. Lisoni. Their work appears in journals such as Applied Physics Letters, Journal of Applied Physics and The Journal of Physical Chemistry C.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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