Gundolf Kiefer

794 citations
24 papers · 630 indexed · h-index 9
Topics
Integrated Circuits and Semiconductor Failure Analysis (10 papers)VLSI and Analog Circuit Testing (10 papers)Advanced Vision and Imaging (7 papers)
Journals
SHILAP Revista de lepidopterologíaComputers & Electrical EngineeringJournal of Electronic Testing

In The Last Decade

Gundolf Kiefer

21 papers receiving 608 citations

Peers

Gundolf Kiefer
Comparison fields: 5 of 26
  • Electrical and Electronic Engineering 540
  • Hardware and Architecture 539
  • Control and Systems Engineering 100
  • Computer Vision and Pattern Recognition 78
  • Aerospace Engineering 46
Replace C. Vamsi Krishna with:
C. Vamsi Krishna United States
K. Masselos Greece
Rafael Garibotti Brazil
Marcin Kubica Poland
Jani Boutellier Finland
Recep O. Ozdag Türkiye
Aravind Dasu United States
Vasileios Leon Greece
Bruno Bodin United Kingdom
John Wright United States
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Citations per field
00.5×8.7×
C. Vamsi Krishna · 1×
Citations per year

Countries citing papers authored by Gundolf Kiefer

Since Specialization
Citations

This map shows the geographic impact of Gundolf Kiefer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Gundolf Kiefer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Gundolf Kiefer more than expected).

Fields of papers citing papers by Gundolf Kiefer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Gundolf Kiefer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Gundolf Kiefer. The network helps show where Gundolf Kiefer may publish in the future.

Co-authorship network of co-authors of Gundolf Kiefer

This figure shows the co-authorship network connecting the top 25 collaborators of Gundolf Kiefer. A scholar is included among the top collaborators of Gundolf Kiefer based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Gundolf Kiefer. Gundolf Kiefer is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
2 3
3 6
4 2
5 21
6 20
7 8
8 2
9 0
10 5
11 5
12 1
13 148
14 3
15 46
16 63
17 1
18 3
19
Deterministic BIST with Scan Chains
3
20 167

About Gundolf Kiefer

Gundolf Kiefer is a scholar working on Hardware and Architecture, Computer Graphics and Computer-Aided Design and Computer Vision and Pattern Recognition, having authored 24 papers that have together received 630 indexed citations. Recurring topics across this work include Integrated Circuits and Semiconductor Failure Analysis (10 papers), VLSI and Analog Circuit Testing (10 papers) and Advanced Vision and Imaging (7 papers). The work is most often cited by research in Hardware and Architecture (539 citations), Electrical and Electronic Engineering (540 citations) and Control and Systems Engineering (100 citations). Gundolf Kiefer has collaborated with scholars based in Germany, Finland and United States. Frequent co-authors include Hans-Joachim Wunderlich, H.-J. Wunderlich, Erik Jan Marinissen, Harald Vranken, Ulrich Hornung, Juergen Weese, Matthias Pohl, Vladimír Pekar, J. Leenstra and T.J.E. Schwarz. Their work appears in journals such as SHILAP Revista de lepidopterología, Computers & Electrical Engineering and Journal of Electronic Testing.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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