S. B. M. Hagström

3.5k citations
80 papers · 2.9k indexed · h-index 30

S. B. M. Hagström

80 papers receiving 2.8k citations

Peers

S. B. M. Hagström
Comparison fields: 5 of 64
  • Surfaces, Coatings and Films 837
  • Condensed Matter Physics 526
  • Radiation 361
  • Atomic and Molecular Physics, and Optics 1.2k
  • Materials Chemistry 1.4k
Replace L. I. Johansson with:
L. I. Johansson Sweden
R. A. Pollak United States
E. Bertel Austria
D. M. Zehner United States
M. L. Knotek United States
M. Šunjić Croatia
J. Lecante France
R. C. C. Perera United States
Hartmut Höchst United States
T. A. Callcott United States
S. B. M. Hagström relative to L. I. Johansson Sweden L. I. Johansson's profile →
Citations per field
00.5×1.5×
L. I. Johansson · 1×
Citations per year

Countries citing papers authored by S. B. M. Hagström

Since Specialization
Citations

This map shows the geographic impact of S. B. M. Hagström's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. B. M. Hagström with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. B. M. Hagström more than expected).

Fields of papers citing papers by S. B. M. Hagström

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. B. M. Hagström. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. B. M. Hagström. The network helps show where S. B. M. Hagström may publish in the future.

Co-authorship network

The 25 scholars most cited alongside S. B. M. Hagström, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. B. M. Hagström Line = papers co-authored together S. B. M. Hagström links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown
#Work
1 200015
2 199558
3 199346
4 19935
5 19925
6 199223
7 1992108
8 19917
9 19917
10 19834
11 197831
12 1977160
13 197786
14 197628
15 197624
16 197539
17 197125
18 197018
19 196719
20
Studies of some atomic properties by electron spectroscopy
19641

About S. B. M. Hagström

S. B. M. Hagström is a scholar working on Surfaces, Coatings and Films, Radiation and Atomic and Molecular Physics, and Optics, having authored 80 papers that have together received 2.9k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (29 papers), Semiconductor materials and devices (22 papers), Metal and Thin Film Mechanics (20 papers), Diamond and Carbon-based Materials Research (19 papers), Advanced Chemical Physics Studies (16 papers), X-ray Spectroscopy and Fluorescence Analysis (9 papers), Nuclear Physics and Applications (8 papers) and Atomic and Molecular Physics (8 papers). The work is most often cited by research in Surfaces, Coatings and Films (837 citations), Condensed Matter Physics (526 citations) and Radiation (361 citations). S. B. M. Hagström has collaborated with scholars based in United States, Sweden and Japan. Frequent co-authors include R. Z. Bachrach, L. I. Johansson, S. A. Flodström, J. W. Allen, R. S. Bauer, A. Bianconi, I. Lindau, Michael A. Kelly, H. B. Lyon and Gabor A. Somorjai. Their work appears in journals such as Science, Physical Review Letters and The Journal of Chemical Physics.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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