Frank J. Balbach
- Electrical and Electronic Engineering
- Hardware and Architecture top 5%
- Software top 10%
- Artificial Intelligence
- Computer Networks and Communications
- Co-authors
- Volkmar SiehMing LiEmre KarakoçLogan W. DonaldsonBabak AlipanahiXin GaoShuai Cheng LiJörn Altmann
- Topics
- VLSI and Analog Circuit Testing (3 papers)Radiation Effects in Electronics (3 papers)Software Reliability and Analysis Research (2 papers)
In The Last Decade
Frank J. Balbach
9 papers receiving 135 citations
Peers
Comparison fields: 5 of 29
- Electrical and Electronic Engineering 93
- Hardware and Architecture 88
- Software 40
- Artificial Intelligence 28
- Computer Networks and Communications 19
Countries citing papers authored by Frank J. Balbach
This map shows the geographic impact of Frank J. Balbach's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Frank J. Balbach with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Frank J. Balbach more than expected).
Fields of papers citing papers by Frank J. Balbach
This network shows the impact of papers produced by Frank J. Balbach. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Frank J. Balbach. The network helps show where Frank J. Balbach may publish in the future.
Co-authorship network of co-authors of Frank J. Balbach
This figure shows the co-authorship network connecting the top 25 collaborators of Frank J. Balbach. A scholar is included among the top collaborators of Frank J. Balbach based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Frank J. Balbach. Frank J. Balbach is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 18 | |
| 3 | 16 | |
| 4 | Models for Algorithmic Teaching | 1 |
| 5 | Teaching learners with restricted mind changes | 1 |
| 6 | 97 | |
| 7 | 2 | |
| 8 | Comparing Different Fault Models Using VERIFY1 | 2 |
| 9 | A Scalable Implementation of Fault Tolerance for Massively Parallel Systems | 3 |
| 10 | Fault Tolerance in Massively Parallel Systems | 7 |
About Frank J. Balbach
Frank J. Balbach is a scholar working on Hardware and Architecture, Software and Philosophy, having authored 10 papers that have together received 147 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (3 papers), Radiation Effects in Electronics (3 papers) and Software Reliability and Analysis Research (2 papers). The work is most often cited by research in Hardware and Architecture (88 citations), Software (40 citations) and Electrical and Electronic Engineering (93 citations). Frank J. Balbach has collaborated with scholars based in Germany, Canada and Japan. Frequent co-authors include Volkmar Sieh, Ming Li, Emre Karakoç, Logan W. Donaldson, Babak Alipanahi, Xin Gao, Shuai Cheng Li, Jörn Altmann, Rudy Lauwereins and Thomas Zeugmann. Their work appears in journals such as Theoretical Computer Science, Information and Computation and Journal of Bioinformatics and Computational Biology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.