F. Ferrieu

612 total citations
42 papers, 485 citations indexed

About

F. Ferrieu is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, F. Ferrieu has authored 42 papers receiving a total of 485 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Electrical and Electronic Engineering, 17 papers in Materials Chemistry and 12 papers in Computational Mechanics. Recurrent topics in F. Ferrieu's work include Thin-Film Transistor Technologies (13 papers), Semiconductor materials and devices (9 papers) and Ion-surface interactions and analysis (8 papers). F. Ferrieu is often cited by papers focused on Thin-Film Transistor Technologies (13 papers), Semiconductor materials and devices (9 papers) and Ion-surface interactions and analysis (8 papers). F. Ferrieu collaborates with scholars based in France, United States and Czechia. F. Ferrieu's co-authors include D. Bensahel, A. Halimaoui, M. Nechtschein, Jean‐Philippe Boucher, G. Auvert, D. Dutartre, J.L. Regolini, J.C. Oberlin, A. Golański and P. Boucaud and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

F. Ferrieu

42 papers receiving 428 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
F. Ferrieu France	14	314	228	156	124	75	42	485
C. H. Björkman United States	13	454 1.4×	284 1.2×	268 1.7×	49 0.4×	79 1.1×	27	630
G. J. Gerardi United States	14	936 3.0×	488 2.1×	327 2.1×	112 0.9×	42 0.6×	31	1.1k
Kate Kaminska Canada	12	236 0.8×	215 0.9×	258 1.7×	127 1.0×	80 1.1×	16	521
A. Zehe Germany	11	295 0.9×	218 1.0×	143 0.9×	77 0.6×	25 0.3×	115	498
L. C. Hopkins United States	12	335 1.1×	100 0.4×	304 1.9×	163 1.3×	37 0.5×	28	506
Juh Tzeng Lue Taiwan	12	222 0.7×	131 0.6×	180 1.2×	135 1.1×	32 0.4×	63	442
T. R. Hart United States	6	271 0.9×	317 1.4×	191 1.2×	152 1.2×	46 0.6×	13	564
P. M. Lenahan United States	15	776 2.5×	362 1.6×	167 1.1×	45 0.4×	26 0.3×	26	860
J. Woodhead United Kingdom	16	576 1.8×	134 0.6×	573 3.7×	69 0.6×	56 0.7×	61	739
Jesse G. Wales United States	4	372 1.2×	233 1.0×	261 1.7×	39 0.3×	44 0.6×	6	529

Countries citing papers authored by F. Ferrieu

Since Specialization

Citations

This map shows the geographic impact of F. Ferrieu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Ferrieu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Ferrieu more than expected).

Fields of papers citing papers by F. Ferrieu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Ferrieu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Ferrieu. The network helps show where F. Ferrieu may publish in the future.

Co-authorship network of co-authors of F. Ferrieu

This figure shows the co-authorship network connecting the top 25 collaborators of F. Ferrieu. A scholar is included among the top collaborators of F. Ferrieu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Ferrieu. F. Ferrieu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Ferrieu, F., et al.. (2010). Analysis of textured films and periodic grating structures with Mueller matrices: A new challenge in instrumentation with the generation of angle-resolved SE polarimeters. Thin Solid Films. 519(9). 2608–2612. 2 indexed citations

Ferrieu, F., et al.. (2009). Physical surface adsorption and Molecular Surface Fractal Analysis (MFSA) detected with Spectroscopic Ellipsometry. Applied Surface Science. 256(3). S96–S100. 2 indexed citations

Ferrieu, F., Erik M. Secula, David G. Seiler, et al.. (2009). Spectroscopic Polarimetry of Light scattered by Surface Roughness and Textured Films in Nanotechnologies. AIP conference proceedings. 379–384. 1 indexed citations

Ferrieu, F., S. Lhostis, Valentina Ivanova, et al.. (2007). Observation of HfO2 thin films by deep UV spectroscopic ellipsometry. Journal of Non-Crystalline Solids. 353(5-7). 658–662. 21 indexed citations

Ferrieu, F., C. Beitia, Anne‐Marie Papon, et al.. (2007). Metrology and Optical Characterization of Plasma Enhanced Chemical Vapor Deposition, (PECVD), low temperature deposited Amorphous Carbon films. AIP conference proceedings. 931. 99–104. 1 indexed citations

Vallon, S., et al.. (1997). Real-time ultraviolet ellipsometry monitoring of gate patterning in a high-density plasma. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 15(3). 865–870. 7 indexed citations

Ferrieu, F., et al.. (1994). In-Situ Spectroscopic Ellipsometry for the Control of Si based Thin Multi-Layers Grown by UHV-CVD. MRS Proceedings. 342. 1 indexed citations

Boucaud, P., et al.. (1994). Growth and in situ ellipsometric analysis of Si1-xGex alloys deposited by chemical beam epitaxy. Journal of Electronic Materials. 23(6). 565–568. 6 indexed citations

Ferrieu, F., et al.. (1990). Spectroscopic Ellipsometry for the Characterization of Thin Films. Journal of The Electrochemical Society. 137(7). 2203–2208. 14 indexed citations

10.

Ferrieu, F., et al.. (1988). Characterization of thin films and materials used in semiconductor technology by spectroscopic ellipsometry. Thin Solid Films. 164. 43–50. 6 indexed citations

11.

Ferrieu, F., et al.. (1987). Characterization of the silicon-on-insulator material formed by high-dose oxygen implantation using spectroscopic ellipsometry. Journal of Applied Physics. 62(8). 3458–3461. 17 indexed citations

12.

Ferrieu, F. & G. Auvert. (1983). Temperature evolutions in silicon induced by a scanned cw laser, pulsed laser, or an electron beam. Journal of Applied Physics. 54(5). 2646–2649. 19 indexed citations

13.

Bomchil, G., D. Bensahel, A. Golański, et al.. (1982). Formation kinetics of MoSi2 induced by cw scanned laser beam. Applied Physics Letters. 41(1). 46–48. 14 indexed citations

14.

Ferrieu, F.. (1982). Ion-beam induced atomic mixing at the Si02/Si interface studied by means of monte carlo simulation. Radiation Effects. 62(3-4). 231–236. 12 indexed citations

15.

Ferrieu, F. & M. Pomerantz. (1981). Determination of exchange constants of 2-D magnets from ESR in the paramagnetic state. Solid State Communications. 39(6). 707–710. 7 indexed citations

16.

Ferrieu, F., et al.. (1981). Recoil implantation of oxygen from SiO2 thin films on silicon. Nuclear Instruments and Methods. 182-183. 137–141. 11 indexed citations

17.

Ferrieu, F.. (1977). Coefficient de diffusion dans une chaîne linéaire de Heisenberg à haute température. Journal de Physique Lettres. 38(19). 381–383. 4 indexed citations

18.

Ferrieu, F.. (1974). Proton relaxation time and interchain couplings in the one-dimensional Heisenberg paramagnet: CsMnCl3,2(H2O). Physics Letters A. 49(3). 253–254. 9 indexed citations

19.

Boucher, Jean‐Philippe, F. Ferrieu, & M. Nechtschein. (1974). Nuclear relaxation and Overhauser effect in a nearly-one-dimensional Heisenberg system. Physical review. B, Solid state. 9(9). 3871–3884. 26 indexed citations

20.

Nechtschein, M., Hélène Marie Jouve, F. Ferrieu, & Jean‐Philippe Boucher. (1971). Anisotropic “underhauser” effect in a single crystal of tanol (tetramethyl -2, 2, 6, 6, piperidinol -4, oxyl -1). Physics Letters A. 36(4). 347–348. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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