Michael D. Kriese

1.3k total citations
34 papers, 1.0k citations indexed

About

Michael D. Kriese is a scholar working on Mechanics of Materials, Electrical and Electronic Engineering and Electronic, Optical and Magnetic Materials. According to data from OpenAlex, Michael D. Kriese has authored 34 papers receiving a total of 1.0k indexed citations (citations by other indexed papers that have themselves been cited), including 21 papers in Mechanics of Materials, 19 papers in Electrical and Electronic Engineering and 8 papers in Electronic, Optical and Magnetic Materials. Recurrent topics in Michael D. Kriese's work include Metal and Thin Film Mechanics (19 papers), Advancements in Photolithography Techniques (9 papers) and Copper Interconnects and Reliability (7 papers). Michael D. Kriese is often cited by papers focused on Metal and Thin Film Mechanics (19 papers), Advancements in Photolithography Techniques (9 papers) and Copper Interconnects and Reliability (7 papers). Michael D. Kriese collaborates with scholars based in United States, Germany and Japan. Michael D. Kriese's co-authors include W. W. Gerberich, Neville Reid Moody, N. R. Moody, David F. Bahr, Donald E. Kramer, Alex A. Volinsky, H. Tischmacher, N. Tymiak, W. W. Gerberich and Bernd Ponick and has published in prestigious journals such as Acta Materialia, Materials Science and Engineering A and Japanese Journal of Applied Physics.

In The Last Decade

Michael D. Kriese

34 papers receiving 978 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Michael D. Kriese United States 17 673 360 317 252 251 34 1.0k
I. Grimberg Israel 15 437 0.6× 404 1.1× 596 1.9× 118 0.5× 160 0.6× 28 851
Hongchuan Jiang China 20 263 0.4× 423 1.2× 284 0.9× 537 2.1× 167 0.7× 78 1.0k
M. Gantois France 17 579 0.9× 284 0.8× 583 1.8× 65 0.3× 474 1.9× 48 1.0k
E. Bergmann Liechtenstein 21 801 1.2× 256 0.7× 766 2.4× 170 0.7× 310 1.2× 44 1.1k
M. Werner Germany 21 382 0.6× 582 1.6× 865 2.7× 282 1.1× 139 0.6× 59 1.3k
A. Inspektor United States 16 794 1.2× 267 0.7× 889 2.8× 79 0.3× 385 1.5× 34 1.1k
J. Szmidt Poland 20 361 0.5× 751 2.1× 734 2.3× 192 0.8× 69 0.3× 124 1.3k
Marie-Hélène Nadal France 15 296 0.4× 253 0.7× 334 1.1× 185 0.7× 362 1.4× 46 944
Yunfei Qiao China 15 179 0.3× 291 0.8× 320 1.0× 222 0.9× 400 1.6× 28 1.0k
Jerzy Bodzenta Poland 17 240 0.4× 365 1.0× 440 1.4× 242 1.0× 82 0.3× 74 871

Countries citing papers authored by Michael D. Kriese

Since Specialization
Citations

This map shows the geographic impact of Michael D. Kriese's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Michael D. Kriese with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Michael D. Kriese more than expected).

Fields of papers citing papers by Michael D. Kriese

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Michael D. Kriese. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Michael D. Kriese. The network helps show where Michael D. Kriese may publish in the future.

Co-authorship network of co-authors of Michael D. Kriese

This figure shows the co-authorship network connecting the top 25 collaborators of Michael D. Kriese. A scholar is included among the top collaborators of Michael D. Kriese based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Michael D. Kriese. Michael D. Kriese is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Kriese, Michael D., et al.. (2015). Development and evaluation of interface-stabilized and reactive-sputtered oxide-capped multilayers for EUV lithography. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9422. 94220K–94220K. 2 indexed citations
2.
Kriese, Michael D., et al.. (2014). Development of an EUVL collector with infrared radiation suppression. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9048. 90483C–90483C. 15 indexed citations
3.
Kriese, Michael D., et al.. (2012). Influence of bearing currents on the bearing lifetime for converter driven machines. 1735–1739. 34 indexed citations
4.
Kriese, Michael D., et al.. (2011). Multilayers for next generation EUVL at 6.X nm. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8076. 80760N–80760N. 29 indexed citations
5.
Tischmacher, H., et al.. (2010). Bearing wear caused by converter-induced bearing currents. 784–791. 22 indexed citations
7.
Kriese, Michael D., et al.. (2010). Prediction of motor bearing currents for converter operation. 29 indexed citations
8.
Tymiak, N., et al.. (2000). The role of plasticity in bimaterial fracture with ductile interlayers. Metallurgical and Materials Transactions A. 31(3). 863–872. 3 indexed citations
9.
Kinoshita, Hiroo, et al.. (1999). <title>Progress in the development of three-aspherical mirror optics for EUVL</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3767. 164–171. 3 indexed citations
10.
Moody, N. R., David P. Adams, Alex A. Volinsky, Michael D. Kriese, & W. W. Gerberich. (1999). Annealing Effects on Interfacial Fracture of Gold-Chromium Films in Hybrid Microcircuits. MRS Proceedings. 586. 14 indexed citations
11.
Kriese, Michael D., W. W. Gerberich, & Neville Reid Moody. (1999). Quantitative adhesion measures of multilayer films: Part II. Indentation of W/Cu, W/W, Cr/W. Journal of materials research/Pratt's guide to venture capital sources. 14(7). 3019–3026. 77 indexed citations
12.
Kriese, Michael D., N. R. Moody, & W. W. Gerberich. (1998). Experimental Considerations for Indentation-Induced Adhesion Measurement of Multilayered Thin Films. MRS Proceedings. 522. 1 indexed citations
13.
Volinsky, Alex A., et al.. (1998). Quantitative Modeling and Measurement of Copper Thin Film Adhesion. MRS Proceedings. 539. 42 indexed citations
14.
Kriese, Michael D., N. R. Moody, & W. W. Gerberich. (1998). Effects of annealing and interlayers on the adhesion energy of copper thin films to SiO2/Si substrates. Acta Materialia. 46(18). 6623–6630. 74 indexed citations
15.
Kriese, Michael D., N. R. Moody, & W. W. Gerberich. (1997). Adhesion Assessment of Copper Thin Films. MRS Proceedings. 473. 8 indexed citations
16.
Kriese, Michael D., N. R. Moody, & W. W. Gerberich. (1997). Quantitative Measurement of the Effect of Annealing on the Adhesion of Thin Copper Films Using Superlayers. MRS Proceedings. 505. 2 indexed citations
17.
Boer, Maarten P., Michael D. Kriese, & W. W. Gerberich. (1997). Investigation of a new fracture mechanics specimen for thin film adhesion measurement. Journal of materials research/Pratt's guide to venture capital sources. 12(10). 2673–2685. 34 indexed citations
18.
Harvey, S. E., et al.. (1995). Environmental effects on fatigue crack development in HSLA steel and fine grain α-titanium. Scripta Metallurgica et Materialia. 33(5). 825–829. 7 indexed citations
19.
Neumann, S. & Michael D. Kriese. (1974). Sub-picogram detection of lead by non-flame atomic fluorescence spectrometry with dye laser excitation. Spectrochimica Acta Part B Atomic Spectroscopy. 29(5). 127–137. 28 indexed citations
20.
Kühl, J., S. Neumann, & Michael D. Kriese. (1973). Influence of Saturation Phenomena on Laser-Excited Atomic Fluorescence Flame Spectrometry. Zeitschrift für Naturforschung A. 28(2). 273–279. 19 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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