Eliezer Keren
- Computer Vision and Pattern Recognition top 2%
- Atomic and Molecular Physics, and Optics top 10%
- Electrical and Electronic Engineering
- Biomedical Engineering
- Mechanical Engineering
- Topics
- Optical measurement and interference techniques (14 papers)Advanced Measurement and Metrology Techniques (9 papers)Surface Roughness and Optical Measurements (8 papers)
- Partner nations
- IsraelUnited States
In The Last Decade
Eliezer Keren
27 papers receiving 734 citations
Peers
Comparison fields: 5 of 56
- Computer Vision and Pattern Recognition 482
- Atomic and Molecular Physics, and Optics 203
- Electrical and Electronic Engineering 187
- Biomedical Engineering 154
- Mechanical Engineering 136
Countries citing papers authored by Eliezer Keren
This map shows the geographic impact of Eliezer Keren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eliezer Keren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eliezer Keren more than expected).
Fields of papers citing papers by Eliezer Keren
This network shows the impact of papers produced by Eliezer Keren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eliezer Keren. The network helps show where Eliezer Keren may publish in the future.
Co-authorship network of co-authors of Eliezer Keren
This figure shows the co-authorship network connecting the top 25 collaborators of Eliezer Keren. A scholar is included among the top collaborators of Eliezer Keren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Eliezer Keren. Eliezer Keren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 13 | |
| 4 | 0 | |
| 5 | 2 | |
| 6 | 1 | |
| 7 | 102 | |
| 8 | 5 | |
| 9 | 3 | |
| 10 | 11 | |
| 11 | 4 | |
| 12 | 5 | |
| 13 | 11 | |
| 14 | 81 | |
| 15 | 51 | |
| 16 | 2 | |
| 17 | 18 | |
| 18 | 9 | |
| 19 | 6 | |
| 20 | 130 |
About Eliezer Keren
Eliezer Keren is a scholar working on Computer Vision and Pattern Recognition, Computational Mechanics and Media Technology, having authored 30 papers that have together received 813 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (14 papers), Advanced Measurement and Metrology Techniques (9 papers) and Surface Roughness and Optical Measurements (8 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (482 citations), Media Technology (73 citations) and Instrumentation (23 citations). Eliezer Keren has collaborated with scholars based in Israel and United States. Frequent co-authors include Oded Kafri, Ezra Bar‐Ziv, I. Glatt, S. Lavi, J.N.M. Stricker and Raanan Bavli. Their work appears in journals such as Optics Letters, AIAA Journal and Computer Physics Communications.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.