E. te Kaat
Impact in
- Radiation top 10%
- Advanced X-ray Imaging Techniques
- Computational Mechanics top 5%
- Ion-surface interactions and analysis
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 3
-
- Advanced X-ray Imaging Techniques 2
- Journals
- Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms (3 papers)Analytical and Bioanalytical Chemistry (1 paper)Applied Physics A (1 paper)Zeitschrift für Physik A Hadrons and Nuclei (2 papers)physica status solidi (a) (2 papers)
- Partner nations
- Germany
In The Last Decade
E. te Kaat
12 papers receiving 312 citations
Peers
Comparison fields: 5 of 31
- Radiation 68
- Computational Mechanics 154
- Condensed Matter Physics 55
- Ceramics and Composites 22
- Electrical and Electronic Engineering 202
Countries citing papers authored by E. te Kaat
This map shows the geographic impact of E. te Kaat's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. te Kaat with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. te Kaat more than expected).
Fields of papers citing papers by E. te Kaat
This network shows the impact of papers produced by E. te Kaat. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. te Kaat. The network helps show where E. te Kaat may publish in the future.
Co-authorship network
The 7 scholars most cited alongside E. te Kaat, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1987 | 25 | |
| 2 | 1986 | 14 | |
| 3 | 1986 | 134 | |
| 4 | 1984 | 6 | |
| 5 | 1984 | 17 | |
| 6 | 1983 | 12 | |
| 7 | 1980 | 22 | |
| 8 | 1979 | 13 | |
| 9 | 1978 | 19 | |
| 10 | 1971 | 37 | |
| 11 | 1968 | 39 | |
| 12 | 1965 | 1 |
About E. te Kaat
E. te Kaat is a scholar working on Surfaces, Coatings and Films, Radiation, Computational Mechanics, Statistics, Probability and Uncertainty and Electrical and Electronic Engineering, having authored 12 papers that have together received 339 indexed citations. Recurring topics across this work include Ion-surface interactions and analysis (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Silicon and Solar Cell Technologies (5 papers), Electron and X-Ray Spectroscopy Techniques (3 papers), Semiconductor materials and interfaces (2 papers), Advanced X-ray Imaging Techniques (2 papers), Thin-Film Transistor Technologies (2 papers) and Force Microscopy Techniques and Applications (1 paper). The work is most often cited by research in Radiation (68 citations), Computational Mechanics (154 citations), Condensed Matter Physics (55 citations), Ceramics and Composites (22 citations) and Electrical and Electronic Engineering (202 citations). E. te Kaat has collaborated with scholars based in Germany. Frequent co-authors include Klaus Heidemann, U. Bonse, H. Kappert, J.K.N. Lindner, Jürgen Belz, H. Bubert and Martin Schmidt. Their work appears in journals such as Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms, Analytical and Bioanalytical Chemistry, Applied Physics A, Zeitschrift für Physik A Hadrons and Nuclei and physica status solidi (a).
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.