David Mui

974 total citations
53 papers, 773 citations indexed

About

David Mui is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, David Mui has authored 53 papers receiving a total of 773 indexed citations (citations by other indexed papers that have themselves been cited), including 46 papers in Electrical and Electronic Engineering, 28 papers in Atomic and Molecular Physics, and Optics and 11 papers in Biomedical Engineering. Recurrent topics in David Mui's work include Semiconductor materials and devices (29 papers), Semiconductor Quantum Structures and Devices (14 papers) and Semiconductor materials and interfaces (11 papers). David Mui is often cited by papers focused on Semiconductor materials and devices (29 papers), Semiconductor Quantum Structures and Devices (14 papers) and Semiconductor materials and interfaces (11 papers). David Mui collaborates with scholars based in United States, Austria and Canada. David Mui's co-authors include H. Morkoç̌, P. M. Petroff, L. A. Coldren, D. Leonard, S. Strite, H. Morkoç, A. L. Demirel, J. Reed, D. Biswas and Daming Huang and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and IEEE Transactions on Electron Devices.

In The Last Decade

David Mui

52 papers receiving 730 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
David Mui United States 15 601 460 172 139 90 53 773
S. C. Palmateer United States 17 727 1.2× 486 1.1× 122 0.7× 146 1.1× 111 1.2× 54 911
F. Schrey United States 18 715 1.2× 840 1.8× 231 1.3× 121 0.9× 72 0.8× 49 988
C. Jagannath United States 16 585 1.0× 647 1.4× 204 1.2× 98 0.7× 126 1.4× 35 820
M. J. Hafich United States 18 1.0k 1.7× 904 2.0× 204 1.2× 98 0.7× 119 1.3× 103 1.1k
A. R. Clawson United States 18 795 1.3× 649 1.4× 153 0.9× 118 0.8× 56 0.6× 61 918
M. Quillec France 16 746 1.2× 782 1.7× 264 1.5× 85 0.6× 61 0.7× 61 982
M. T. Emeny United Kingdom 16 564 0.9× 678 1.5× 215 1.3× 97 0.7× 91 1.0× 43 803
R. Azoulay France 19 756 1.3× 708 1.5× 332 1.9× 83 0.6× 83 0.9× 71 1.1k
Jiro Ōsaka Japan 13 438 0.7× 498 1.1× 158 0.9× 64 0.5× 112 1.2× 39 690
R. E. Balderas‐Navarro Mexico 14 251 0.4× 352 0.8× 160 0.9× 87 0.6× 63 0.7× 76 535

Countries citing papers authored by David Mui

Since Specialization
Citations

This map shows the geographic impact of David Mui's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by David Mui with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites David Mui more than expected).

Fields of papers citing papers by David Mui

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by David Mui. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by David Mui. The network helps show where David Mui may publish in the future.

Co-authorship network of co-authors of David Mui

This figure shows the co-authorship network connecting the top 25 collaborators of David Mui. A scholar is included among the top collaborators of David Mui based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with David Mui. David Mui is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Mui, David, et al.. (2019). Spreading of rinsing liquids across a horizontal rotating substrate. Physical Review Fluids. 4(8). 3 indexed citations
2.
Mui, David, et al.. (2019). Evolution of rivulets during spreading of an impinging water jet on a rotating, precoated substrate. Physics of Fluids. 31(8). 3 indexed citations
3.
Wang, Yanming, et al.. (2018). Predicting stability of nanofin arrays against collapse by phase field modeling. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 36(5). 4 indexed citations
4.
Mui, David, et al.. (2018). Factors Influencing Drying Induced Pattern Collapse. Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena. 282. 201–206. 3 indexed citations
5.
Schmidt, H., Frank Holsteyns, Alexander R. Lippert, et al.. (2013). Particle Cleaning Technologies to Meet Advanced Semiconductor Device Process Requirements. ECS Journal of Solid State Science and Technology. 3(1). N3069–N3080. 45 indexed citations
6.
Mui, David, et al.. (2004). In-tool process control for advanced patterning based on integrated metrology. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5378. 10–10. 1 indexed citations
7.
Liu, Wei, et al.. (2003). Generating sub-30-nm polysilicon gates using PECVD amorphous carbon as hardmask and anti-reflective coating. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5040. 841–841. 18 indexed citations
8.
9.
Mui, David, D. Leonard, L. A. Coldren, & P. M. Petroff. (1995). Surface migration induced self-aligned InAs islands grown by molecular beam epitaxy. Applied Physics Letters. 66(13). 1620–1622. 141 indexed citations
10.
Zheng, Tianyue, J. M. Gibson, David Mui, & H. Morkoç̌. (1995). Optimal thickness for Si interlayer as diffusion barrier at the Si3N4/GaAs interface: A transmission electron microscopy study. Journal of materials research/Pratt's guide to venture capital sources. 10(5). 1126–1133. 11 indexed citations
11.
Mui, David, et al.. (1993). Characteristics of in situ Cl2 etched/regrown GaAs/GaAs interfaces. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(6). 2266–2269. 3 indexed citations
12.
Strite, S., M. Selim Ünlü, A. L. Demirel, David Mui, & H. Morkoç. (1992). A collector design study for GaAs/Ge/GaAs double heterojunction bipolar transistors. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 10(2). 675–682. 4 indexed citations
13.
Chyi, Jen‐Inn, et al.. (1991). Electrical characteristics of InSb-GaAs heterojunctions. Solid-State Electronics. 34(7). 747–750. 8 indexed citations
14.
Mui, David, S. F. Fang, & H. Morkoç. (1991). Electron cyclotron resonance assisted low temperature ultrahigh vacuum chemical vapor deposition of Si using silane. Applied Physics Letters. 59(15). 1887–1889. 41 indexed citations
15.
Huang, Daming, David Mui, & H. Morkoç̌. (1989). Interference effects probed by photoreflectance spectroscopy. Journal of Applied Physics. 66(1). 358–361. 48 indexed citations
16.
Mui, David, et al.. (1989). Modeling of the I–V characteristics of single and double barrier tunneling diodes using A k · p band model. Solid-State Electronics. 32(11). 1025–1031. 4 indexed citations
17.
Arora, Vikas, David Mui, & H. Morkoç̌. (1987). Mobility degradation and transferred electron effect in gallium arsenide and indium gallium arsenide. IEEE Transactions on Electron Devices. 34(6). 1231–1238. 10 indexed citations
18.
Arora, Vijay K., David Mui, & H. Morkoç̌. (1987). High-field electron-drift velocity and temperature in gallium phosphide. Journal of Applied Physics. 61(9). 4703–4704. 5 indexed citations
19.
Reddy, U. K., et al.. (1987). Enhanced ballistic transport in InGaAs/InAlAs hot-electron transistors. Applied Physics Letters. 51(16). 1254–1255. 4 indexed citations
20.
Mui, David, et al.. (1985). Devices for phase-alternated decoupling in liquids, liquid crystals, and solids. Journal of Magnetic Resonance (1969). 64(1). 124–130. 9 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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