F. Schrey

1.3k total citations
49 papers, 988 citations indexed

About

F. Schrey is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering and Materials Chemistry. According to data from OpenAlex, F. Schrey has authored 49 papers receiving a total of 988 indexed citations (citations by other indexed papers that have themselves been cited), including 39 papers in Atomic and Molecular Physics, and Optics, 37 papers in Electrical and Electronic Engineering and 9 papers in Materials Chemistry. Recurrent topics in F. Schrey's work include Semiconductor materials and interfaces (27 papers), Semiconductor materials and devices (17 papers) and Surface and Thin Film Phenomena (16 papers). F. Schrey is often cited by papers focused on Semiconductor materials and interfaces (27 papers), Semiconductor materials and devices (17 papers) and Surface and Thin Film Phenomena (16 papers). F. Schrey collaborates with scholars based in United States, Austria and Germany. F. Schrey's co-authors include R. T. Tung, James P. Sullivan, A. F. J. Levi, K. Unterrainer, G. Strasser, Thomas Müller, A. Appelbaum, L. Rebohle, R. Lévy and S. M. Yalisove and has published in prestigious journals such as Physical Review Letters, Applied Physics Letters and Journal of Applied Physics.

In The Last Decade

F. Schrey

48 papers receiving 947 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
F. Schrey United States 18 840 715 231 121 72 49 988
I. Teramoto Japan 17 521 0.6× 780 1.1× 308 1.3× 52 0.4× 67 0.9× 72 977
Mitsuru Sugo Japan 18 827 1.0× 1.0k 1.4× 157 0.7× 207 1.7× 99 1.4× 53 1.2k
Yoshifumi Mori Japan 17 632 0.8× 739 1.0× 297 1.3× 76 0.6× 128 1.8× 46 871
K. P. Homewood United Kingdom 18 651 0.8× 665 0.9× 406 1.8× 89 0.7× 104 1.4× 66 923
Tomasz J. Ochalski Ireland 20 517 0.6× 640 0.9× 298 1.3× 323 2.7× 89 1.2× 60 860
Masao Nishioka Japan 20 1.1k 1.3× 963 1.3× 512 2.2× 224 1.9× 92 1.3× 56 1.2k
B. R. Semyagin Russia 16 718 0.9× 536 0.7× 256 1.1× 203 1.7× 83 1.2× 129 878
M.G. Astles United Kingdom 14 531 0.6× 635 0.9× 275 1.2× 80 0.7× 99 1.4× 50 782
J. P. Stagg United Kingdom 13 335 0.4× 552 0.8× 151 0.7× 96 0.8× 87 1.2× 27 661
K. K. Shih United States 17 474 0.6× 502 0.7× 358 1.5× 63 0.5× 58 0.8× 39 850

Countries citing papers authored by F. Schrey

Since Specialization
Citations

This map shows the geographic impact of F. Schrey's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Schrey with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Schrey more than expected).

Fields of papers citing papers by F. Schrey

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. Schrey. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Schrey. The network helps show where F. Schrey may publish in the future.

Co-authorship network of co-authors of F. Schrey

This figure shows the co-authorship network connecting the top 25 collaborators of F. Schrey. A scholar is included among the top collaborators of F. Schrey based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with F. Schrey. F. Schrey is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Fasching, G., F. Schrey, A. M. Andrews, et al.. (2006). Single InAs/GaAs quantum dots: Photocurrent and cross-sectional AFM analysis. Physica E Low-dimensional Systems and Nanostructures. 32(1-2). 183–186. 8 indexed citations
2.
Schrey, F., Thomas Müller, G. Fasching, et al.. (2004). Intersublevel dynamics of semiconductor nanostructures. Physica E Low-dimensional Systems and Nanostructures. 25(2-3). 271–279. 1 indexed citations
3.
Schrey, F., G. Fasching, Thomas Müller, G. Strasser, & K. Unterrainer. (2004). Optically induced intraband electron transfer in self‐assembled InAs quantum dots. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics. 1(3). 434–437. 2 indexed citations
4.
Hsu, Julia W. P., Nils Weimann, Michael J. Manfra, et al.. (2003). Effect of dislocations on local transconductance in AlGaN/GaN heterostructures as imaged by scanning gate microscopy. Applied Physics Letters. 83(22). 4559–4561. 5 indexed citations
5.
Hsu, Julia W. P., F. Schrey, & H. M. Ng. (2003). Spatial distribution of yellow luminescence related deep levels in GaN. Applied Physics Letters. 83(20). 4172–4174. 17 indexed citations
6.
Tung, R. T. & F. Schrey. (1995). Ti-Interlayer Mediated Epitaxy of CoSi2 with Ti Capping. MRS Proceedings. 402. 18 indexed citations
7.
Tung, R. T. & F. Schrey. (1995). Increased uniformity and thermal stability of CoSi2 thin films by Ti capping. Applied Physics Letters. 67(15). 2164–2166. 46 indexed citations
8.
Tung, R. T., James P. Sullivan, & F. Schrey. (1993). Relationship Between Interface Structure and Schottky Barrier Height. MRS Proceedings. 318. 1 indexed citations
9.
Sullivan, James P., R. T. Tung, D. J. Eaglesham, F. Schrey, & W. R. M. Graham. (1993). Giant variation in Schottky barrier height observed in the Co/Si system. Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena. 11(4). 1564–1570. 24 indexed citations
10.
Sullivan, James P., W. R. M. Graham, R. T. Tung, & F. Schrey. (1993). Pitfalls in the measurement of metal/p-Si contacts: The effect of hydrogen passivation. Applied Physics Letters. 62(22). 2804–2806. 10 indexed citations
11.
Tung, R. T., D. J. Eaglesham, F. Schrey, & James P. Sullivan. (1992). Growth of Single Crystal Si/NiSi2/Si(100) and Si/CoSi2/Si(100) Structures by Molecular Beam Epitaxy and Furnace Annealing. MRS Proceedings. 281. 2 indexed citations
12.
Sullivan, James P., R. T. Tung, F. Schrey, & W. R. M. Graham. (1992). Correlation of the interfacial structure and electrical properties of epitaxial silicides on Si. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 10(4). 1959–1964. 12 indexed citations
13.
Tung, R. T., A. F. J. Levi, James P. Sullivan, & F. Schrey. (1991). Schottky-barrier inhomogeneity at epitaxialNiSi2interfaces on Si(100). Physical Review Letters. 66(1). 72–75. 164 indexed citations
14.
Tung, R. T., James P. Sullivan, F. Schrey, & A. F. J. Levi. (1991). Single Crystal NiSi2/Si Interfaces: Fabrication, Structures, and Schottky Barrier Heights. MRS Proceedings. 221. 2 indexed citations
15.
Tung, R. T. & F. Schrey. (1990). Epitaxial CoSi2/Si(111) interfaces. Applied Surface Science. 41-42. 223–229. 6 indexed citations
16.
Tung, R. T. & F. Schrey. (1988). Epitaxial Silicides: a Summary of Recent Developments. MRS Proceedings. 122. 10 indexed citations
17.
18.
Lévy, R., P. K. Gallagher, & F. Schrey. (1987). Low Pressure Chemical Vapor Deposition of Borophosphosilicate Glass Films Produced by Injection of Miscible DADBS‐TMB‐TMP Liquid Sources. Journal of The Electrochemical Society. 134(7). 1744–1749. 7 indexed citations
19.
Appelbaum, A., et al.. (1986). VIA-7 sputter Ni-P as an ohmic contact to n-InP, p-InGaAs and as a diffusion barrier. IEEE Transactions on Electron Devices. 33(11). 1864–1864. 21 indexed citations
20.
Schrey, F., et al.. (1970). Structure and properties of r.f. sputtered, superconducting tantalum films. Thin Solid Films. 5(1). 29–40. 12 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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