W. Jäger

3.6k total citations
150 papers, 2.9k citations indexed

About

W. Jäger is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, W. Jäger has authored 150 papers receiving a total of 2.9k indexed citations (citations by other indexed papers that have themselves been cited), including 76 papers in Electrical and Electronic Engineering, 76 papers in Materials Chemistry and 53 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in W. Jäger's work include Semiconductor materials and interfaces (35 papers), Ion-surface interactions and analysis (30 papers) and Semiconductor materials and devices (28 papers). W. Jäger is often cited by papers focused on Semiconductor materials and interfaces (35 papers), Ion-surface interactions and analysis (30 papers) and Semiconductor materials and devices (28 papers). W. Jäger collaborates with scholars based in Germany, United States and Sweden. W. Jäger's co-authors include H. Trinkaus, K. L. Merkle, R. C. Birtcher, J. Roth, M. Wilkens, Erdmann Spiecker, Dirk Stenkamp, S. Mantl, R. Manzke and J. Fink and has published in prestigious journals such as Physical Review Letters, Advanced Materials and Nano Letters.

In The Last Decade

W. Jäger

150 papers receiving 2.8k citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
W. Jäger Germany	31	1.6k	1.3k	1.1k	627	441	150	2.9k
R. Grötzschel Germany	27	1.3k 0.8×	1.2k 0.9×	489 0.5×	705 1.1×	250 0.6×	148	2.3k
W. F. van der Weg Netherlands	32	1.6k 1.0×	1.8k 1.4×	770 0.7×	878 1.4×	218 0.5×	149	3.1k
A. V. Drigo Italy	24	684 0.4×	1.2k 0.9×	986 0.9×	477 0.8×	216 0.5×	139	2.0k
Y. Horino Japan	23	1.3k 0.8×	845 0.6×	426 0.4×	440 0.7×	432 1.0×	167	2.3k
T. Aizawa Japan	32	2.2k 1.4×	737 0.6×	1.1k 1.1×	390 0.6×	209 0.5×	188	3.3k
J. Ferrón Argentina	28	966 0.6×	1.0k 0.8×	970 0.9×	833 1.3×	292 0.7×	130	2.6k
C. Boragno Italy	33	1.7k 1.0×	1.3k 1.0×	1.4k 1.4×	1.7k 2.7×	592 1.3×	115	3.5k
A. Carnera Italy	32	1.7k 1.0×	2.9k 2.2×	1.6k 1.5×	753 1.2×	546 1.2×	223	3.8k
Ф. Ф. Комаров Belarus	22	1.1k 0.7×	1.1k 0.8×	467 0.4×	1.0k 1.6×	220 0.5×	328	2.4k
L.S. Wieluński United States	27	985 0.6×	1.3k 1.0×	442 0.4×	387 0.6×	211 0.5×	126	2.1k

Countries citing papers authored by W. Jäger

Since Specialization

Citations

This map shows the geographic impact of W. Jäger's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W. Jäger with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W. Jäger more than expected).

Fields of papers citing papers by W. Jäger

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W. Jäger. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W. Jäger. The network helps show where W. Jäger may publish in the future.

Co-authorship network of co-authors of W. Jäger

This figure shows the co-authorship network connecting the top 25 collaborators of W. Jäger. A scholar is included among the top collaborators of W. Jäger based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W. Jäger. W. Jäger is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Spiecker, Erdmann, Magnus Garbrecht, W. Jäger, & Karsten Tillmann. (2009). Advantages of aberration correction for HRTEM investigation of complex layer compounds. Journal of Microscopy. 237(3). 341–346. 19 indexed citations

Häußler, D., et al.. (2009). Aperiodic W/B4C multilayer systems for X-ray optics: Quantitative determination of layer thickness by HAADF-STEM and X-ray reflectivity. Surface and Coatings Technology. 204(12-13). 1929–1932. 2 indexed citations

Schoene, Jens, et al.. (2006). Comparative TEM and HRXRD Analyses of Strain Relaxation in Step-Graded GaInAs Buffer-Layers for High-Efficiency Solar Cells. Microscopy and Microanalysis. 12(S02). 918–919. 1 indexed citations

Behrens, Malte, et al.. (2006). A study of the reactivity of elemental Cr/Se/Te thin multilayers using X-ray reflectometry, in situ X-ray diffraction and X-ray absorption spectroscopy. Journal of Solid State Chemistry. 179(11). 3330–3337. 4 indexed citations

Häußler, D., Erdmann Spiecker, W. Jäger, et al.. (2005). TEM characterization of La/B₄C multilayer systems by the geometric phase method. physica status solidi (a). 202(12). 2299–2308. 6 indexed citations

Spiecker, Erdmann, et al.. (2005). Self-Assembled Nanostructures on VSe₂Surfaces Induced by Cu Deposition. Microscopy and Microanalysis. 11(5). 456–471. 1 indexed citations

Jäger, W., et al.. (2003). Determination of high temperature surface crack formation criteria in continuous casting and thin slab casting. EP Europace. 1–161. 4 indexed citations

Spiecker, Erdmann, C. Dieker, W. Jäger, et al.. (2003). Self-assembled nanowire formation during Cu deposition on atomically flat Vse2 surfaces studied by microscopic methods. Materials Science and Engineering C. 23(1-2). 171–179. 12 indexed citations

Adelung, Rainer, F. Ernst, Anthony Scott, et al.. (2002). Self-Assembled Nanowire Networks by Deposition of Copper onto Layered-Crystal Surfaces. Advanced Materials. 14(15). 1056–1056. 33 indexed citations

10.

Andersson, Thomas, U. Södervall, C. Jäger, et al.. (2001). Microstructural characterization of GaN-GaAs alloys grown on (001) GaAs by molecular beam epitaxy. MRS Proceedings. 693. 1 indexed citations

11.

Averback, R. S., et al.. (1998). Radiation enhanced diffusion in MgO. Journal of Applied Physics. 83(12). 7576–7584. 32 indexed citations

12.

Jäger, W., et al.. (1997). Microstructure and growth of MWCVD diamond on Si1 − xCx buffer layers. Diamond and Related Materials. 6(5-7). 649–653. 13 indexed citations

13.

Rucki, A. & W. Jäger. (1997). Dopant Diffusion and Defect Formation in III-V Semiconductors: Zinc Diffusion in GaAs. Defect and diffusion forum/Diffusion and defect data, solid state data. Part A, Defect and diffusion forum. 143-147. 1095–1100. 2 indexed citations

14.

Peippo, K., et al.. (1997). JOULE/ASICOM: Amorphous silicon photovoltaics for commercial buildings. 2 indexed citations

15.

Jäger, W. & Joachim Mayer. (1995). Energy-filtered transmission electron microscopy of SimGen superlattices and SiGe heterostructures I. Experimental results. Ultramicroscopy. 59(1-4). 33–45. 31 indexed citations

16.

Forbes, David V., et al.. (1994). Damage and Lattice Strain in Ion-Irradiated Al_xGai-_xAs. MRS Proceedings. 354. 2 indexed citations

17.

Jäger, W., et al.. (1987). Periodic {001}Walls of Defects in Proton-Irradiated Cu and Ni. Materials science forum. 15-18. 881–888. 13 indexed citations

18.

Jäger, W., R. Lässer, T. Schober, & G.J. Thomas. (1983). Formation of helium bubbles and dislocation loops in tritium-charged vanadium. Radiation Effects. 78(1-4). 165–176. 32 indexed citations

19.

Merkle, K. L. & W. Jäger. (1981). Direct observation of spike effects in heavy-ion sputtering. Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties. 44(4). 741–762. 109 indexed citations

20.

Jäger, W., W. Frank, & K. Urban. (1980). High-voltage electron-microscope investigation of point-defect agglomerates in irradiated copper during in-situ annealing. Radiation Effects. 46(1-2). 47–57. 18 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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