C.H.M. van der Werf

1.2k citations
72 papers · 966 indexed · h-index 19
Topics
Thin-Film Transistor Technologies (61 papers)Silicon and Solar Cell Technologies (52 papers)Silicon Nanostructures and Photoluminescence (39 papers)

In The Last Decade

C.H.M. van der Werf

69 papers receiving 942 citations

Peers

C.H.M. van der Werf
Comparison fields: 5 of 46
  • Electrical and Electronic Engineering 828
  • Materials Chemistry 598
  • Biomedical Engineering 185
  • Atomic and Molecular Physics, and Optics 128
  • Surfaces, Coatings and Films 55
Replace Zhizhong Yuan with:
Zhizhong Yuan China
M. Lemiti France
Kyunghae Kim South Korea
P. Malar India
Jiho Chang South Korea
E. San Andrés Spain
Masashi Akabori Japan
Sisir Yalamanchili United States
Young Dong Kim South Korea
I. Dói Brazil
C.H.M. van der Werf relative to Zhizhong Yuan China Zhizhong Yuan's profile →
Citations per field
00.5×3.4×
Zhizhong Yuan · 1×
Citations per year

Countries citing papers authored by C.H.M. van der Werf

Since Specialization
Citations

This map shows the geographic impact of C.H.M. van der Werf's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.H.M. van der Werf with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.H.M. van der Werf more than expected).

Fields of papers citing papers by C.H.M. van der Werf

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by C.H.M. van der Werf. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.H.M. van der Werf. The network helps show where C.H.M. van der Werf may publish in the future.

Co-authorship network of co-authors of C.H.M. van der Werf

This figure shows the co-authorship network connecting the top 25 collaborators of C.H.M. van der Werf. A scholar is included among the top collaborators of C.H.M. van der Werf based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C.H.M. van der Werf. C.H.M. van der Werf is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 24
2 4
3 9
4 0
5 7
6 9
7 2
8 3
9 13
10 38
11 53
12 23
13 6
14 16
15 2
16 0
17 14
18 4
19 43
20 1

About C.H.M. van der Werf

C.H.M. van der Werf is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Surfaces, Coatings and Films, having authored 72 papers that have together received 966 indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (61 papers), Silicon and Solar Cell Technologies (52 papers) and Silicon Nanostructures and Photoluminescence (39 papers). The work is most often cited by research in Electrical and Electronic Engineering (828 citations), Materials Chemistry (598 citations) and Surfaces, Coatings and Films (55 citations). C.H.M. van der Werf has collaborated with scholars based in Netherlands, United States and Australia. Frequent co-authors include R.E.I. Schropp, J.K. Rath, R.H. Franken, J.K. Rath, M.K. van Veen, Reuben M. Bakker, J.W.A. Schüttauf, Z.S. Houweling, W.M. Arnoldbik and Wilfried van Sark. Their work appears in journals such as Advanced Materials, Journal of Applied Physics and Physical Review B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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