C. C. Chang
- Electrical and Electronic Engineering top 5%
- Atomic and Molecular Physics, and Optics top 5%
- Materials Chemistry top 10%
- Surfaces, Coatings and Films top 1%
- Computational Mechanics top 5%
- Co-authors
- M. S. HegdeC. J. SandroffKlaus MüllerJ. P. HarbisonL. A. FarrowG. QuintanaCorinne D. BoehmRandall K. Saiki
- Topics
- Semiconductor materials and devices (21 papers)Semiconductor materials and interfaces (9 papers)Electron and X-Ray Spectroscopy Techniques (9 papers)
- Partner nations
- United StatesTaiwanGermany
In The Last Decade
C. C. Chang
47 papers receiving 1.9k citations
Peers
Comparison fields: 5 of 118
- Electrical and Electronic Engineering 971
- Atomic and Molecular Physics, and Optics 744
- Materials Chemistry 612
- Surfaces, Coatings and Films 510
- Computational Mechanics 216
Countries citing papers authored by C. C. Chang
This map shows the geographic impact of C. C. Chang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. C. Chang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. C. Chang more than expected).
Fields of papers citing papers by C. C. Chang
This network shows the impact of papers produced by C. C. Chang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. C. Chang. The network helps show where C. C. Chang may publish in the future.
Co-authorship network of co-authors of C. C. Chang
This figure shows the co-authorship network connecting the top 25 collaborators of C. C. Chang. A scholar is included among the top collaborators of C. C. Chang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with C. C. Chang. C. C. Chang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 3 | |
| 2 | 12 | |
| 3 | 1 | |
| 4 | 2 | |
| 5 | 4 | |
| 6 | 26 | |
| 7 | Time Resolved Photoreflectance of GaAs and InAlAs | 1 |
| 8 | 48 | |
| 9 | 6 | |
| 10 | 26 | |
| 11 | 230 | |
| 12 | 11 | |
| 13 | 31 | |
| 14 | 7 | |
| 15 | 25 | |
| 16 | 3 | |
| 17 | 23 | |
| 18 | 14 | |
| 19 | 2 | |
| 20 | 96 |
About C. C. Chang
C. C. Chang is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics and Electrical and Electronic Engineering, having authored 49 papers that have together received 2.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (21 papers), Semiconductor materials and interfaces (9 papers) and Electron and X-Ray Spectroscopy Techniques (9 papers). The work is most often cited by research in Surfaces, Coatings and Films (510 citations), Atomic and Molecular Physics, and Optics (744 citations) and Structural Biology (31 citations). C. C. Chang has collaborated with scholars based in United States, Taiwan and Germany. Frequent co-authors include M. S. Hegde, C. J. Sandroff, Klaus Müller, J. P. Harbison, L. A. Farrow, G. Quintana, Corinne D. Boehm, Randall K. Saiki, Corey Levenson and Haig H. Kazazian. Their work appears in journals such as New England Journal of Medicine, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.