Boyang Du

507 citations
49 papers · 368 · h-index 11

Impact in

Papers in

    • Radiation Effects in Electronics 42
    • Low-power high-performance VLSI design 14
    • Integrated Circuits and Semiconductor Failure Analysis 9
    • Semiconductor materials and devices 6
    • VLSI and Analog Circuit Testing 28
    • Real-Time Systems Scheduling 6
    • Parallel Computing and Optimization Techniques 4
    • Embedded Systems Design Techniques 3

Boyang Du

45 papers receiving 361 citations

Peers

Boyang Du
Comparison fields: 5 of 30
  • Hardware and Architecture 241
  • Software 37
  • Electrical and Electronic Engineering 326
  • Computer Networks and Communications 54
  • Safety, Risk, Reliability and Quality 14
Replace Lucas Antunes Tambara with:
Lucas Antunes Tambara Brazil
Jorge Tonfat Brazil
Josie E. Rodriguez Condia Italy
Sarah Azimi Italy
Gennaro S. Rodrigues Brazil
H. Guzmán-Miranda Spain
Hortensia Mecha Spain
Yiorgos Tsiatouhas Greece
Kee Sup Kim United States
Sébastien Pillement France
Boyang Du relative to Lucas Antunes Tambara Brazil Lucas Antunes Tambara's profile →
Citations per field
00.5×1.5×1.9×
Lucas Antunes Tambara · 1×
Citations per year

Countries citing papers authored by Boyang Du

Since Specialization
Citations

This map shows the geographic impact of Boyang Du's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Boyang Du with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Boyang Du more than expected).

Fields of papers citing papers by Boyang Du

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Boyang Du. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Boyang Du. The network helps show where Boyang Du may publish in the future.

Co-authors

The 25 scholars most cited alongside Boyang Du, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Boyang Du Line = papers co-authored together Boyang Du links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 49 papers — load more, or switch the sort, to bring in the rest.

#Work
1 202047
2 201929
3 201926
4 201916
5 201815
6 201915
7 201315
8 201414
9 201514
10 201612
11 202011
12 201710
13 201910
14 201810
15 20219
16 20188
17 20198
18 20148
19 20158
20 20198

About Boyang Du

Boyang Du is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Software, Computer Networks and Communications and Safety, Risk, Reliability and Quality, having authored 49 papers that have together received 368 indexed citations. Recurring topics across this work include Radiation Effects in Electronics (42 papers), VLSI and Analog Circuit Testing (28 papers), Low-power high-performance VLSI design (14 papers), Integrated Circuits and Semiconductor Failure Analysis (9 papers), Real-Time Systems Scheduling (6 papers), Semiconductor materials and devices (6 papers), Parallel Computing and Optimization Techniques (4 papers) and Embedded Systems Design Techniques (3 papers). The work is most often cited by research in Hardware and Architecture (241 citations), Software (37 citations), Electrical and Electronic Engineering (326 citations), Computer Networks and Communications (54 citations) and Safety, Risk, Reliability and Quality (14 citations). Boyang Du has collaborated with scholars based in Italy, Netherlands and China. Frequent co-authors include Luca Sterpone, Sarah Azimi, M. Sonza Reorda, Josie E. Rodriguez Condia, M. Portela-García, Almudena Lindoso, Luis Entrena, Weitao Yang, Chaohui He and Véronique Ferlet-Cavrois. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Nuclear Science, IEEE Systems Journal, Journal of Physics D Applied Physics and IEEE Access.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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