Augustin Cathignol

608 total citations
19 papers, 384 citations indexed

About

Augustin Cathignol is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture and Biomedical Engineering. According to data from OpenAlex, Augustin Cathignol has authored 19 papers receiving a total of 384 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 4 papers in Hardware and Architecture and 4 papers in Biomedical Engineering. Recurrent topics in Augustin Cathignol's work include Advancements in Semiconductor Devices and Circuit Design (13 papers), Semiconductor materials and devices (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). Augustin Cathignol is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (13 papers), Semiconductor materials and devices (11 papers) and Integrated Circuits and Semiconductor Failure Analysis (5 papers). Augustin Cathignol collaborates with scholars based in France, Switzerland and United States. Augustin Cathignol's co-authors include G. Ghibaudo, B. Cheng, A. R. Brown, D. Chanemougame, Asen Asenov, A. Bajolet, T. Skotnicki, A. Pouydebasque, S. Monfray and Ernesto Perea and has published in prestigious journals such as IEEE Transactions on Electron Devices, IEEE Electron Device Letters and Solid-State Electronics.

In The Last Decade

Augustin Cathignol

18 papers receiving 364 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Augustin Cathignol France 7 377 37 27 27 19 19 384
A. Juge France 11 458 1.2× 35 0.9× 22 0.8× 13 0.5× 27 1.4× 47 466
M. Hargrove United States 11 493 1.3× 46 1.2× 29 1.1× 24 0.9× 21 1.1× 26 506
M.M. Pelella United States 11 380 1.0× 33 0.9× 23 0.9× 18 0.7× 15 0.8× 45 395
A. Bajolet France 10 280 0.7× 21 0.6× 23 0.9× 23 0.9× 19 1.0× 19 288
F. Nouri United States 11 507 1.3× 58 1.6× 16 0.6× 28 1.0× 43 2.3× 28 524
P. O'Sullivan Ireland 8 256 0.7× 13 0.4× 7 0.3× 25 0.9× 35 1.8× 42 276
Shiying Xiong United States 5 419 1.1× 65 1.8× 15 0.6× 23 0.9× 30 1.6× 5 435
D. Chanemougame France 8 207 0.5× 31 0.8× 17 0.6× 12 0.4× 12 0.6× 15 216
P. Fonteneau France 11 254 0.7× 18 0.5× 7 0.3× 30 1.1× 12 0.6× 22 262
M.-R. Lin United States 9 258 0.7× 26 0.7× 12 0.4× 19 0.7× 53 2.8× 20 268

Countries citing papers authored by Augustin Cathignol

Since Specialization
Citations

This map shows the geographic impact of Augustin Cathignol's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Augustin Cathignol with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Augustin Cathignol more than expected).

Fields of papers citing papers by Augustin Cathignol

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Augustin Cathignol. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Augustin Cathignol. The network helps show where Augustin Cathignol may publish in the future.

Co-authorship network of co-authors of Augustin Cathignol

This figure shows the co-authorship network connecting the top 25 collaborators of Augustin Cathignol. A scholar is included among the top collaborators of Augustin Cathignol based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Augustin Cathignol. Augustin Cathignol is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

19 of 19 papers shown
1.
Alberto, Diego, et al.. (2025). Accelerated aging tests for smart MV circuit breaker predictive maintenance. IET conference proceedings.. 2025(14). 3208–3212.
2.
3.
Rubaldo, Laurent, P. Fougères, A. Kerlain, et al.. (2018). Achievement of high image quality MCT sensors with Sofradir vertical industrial model. 9070. 31–31. 4 indexed citations
4.
Cathignol, Augustin, et al.. (2015). RMS noise modeling and detection for high-reliability HgCdTe infrared focal plane arrays development. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9451. 945126–945126. 5 indexed citations
5.
Bajolet, A., et al.. (2011). Characterization and Modeling of Transistor Variability in Advanced CMOS Technologies. IEEE Transactions on Electron Devices. 58(8). 2235–2248. 29 indexed citations
6.
Hook, Terence B., et al.. (2011). Comment on “Channel Length and Threshold Voltage Dependence of a Transistor Mismatch in a 32-nm HKMG Technology”. IEEE Transactions on Electron Devices. 58(4). 1255–1256. 9 indexed citations
7.
Bajolet, A., et al.. (2011). Drain-current variability in 45nm bulk N-MOSFET with and without pocket-implants. Solid-State Electronics. 65-66. 163–169. 4 indexed citations
8.
Bajolet, A., et al.. (2010). Modeling local electrical fluctuations in 45nm heavily pocket-implanted bulk MOSFET. Solid-State Electronics. 54(11). 1359–1366. 17 indexed citations
9.
Bajolet, A., et al.. (2010). Drain current variability in 45nm heavily pocket-implanted bulk MOSFET. 122–125. 6 indexed citations
10.
Cathignol, Augustin, et al.. (2009). Abnormally high local electrical fluctuations in heavily pocket-implanted bulk long MOSFET. Solid-State Electronics. 53(2). 127–133. 23 indexed citations
11.
Cathignol, Augustin, B. Cheng, D. Chanemougame, et al.. (2008). Quantitative Evaluation of Statistical Variability Sources in a 45-nm Technological Node LP N-MOSFET. IEEE Electron Device Letters. 29(6). 609–611. 66 indexed citations
12.
Cathignol, Augustin, et al.. (2008). Abnormally High Current Local Fluctuations in Heavily Pocket-implanted Bulk Long MOSFET. 49. 167–168. 1 indexed citations
13.
Asenov, Asen, Augustin Cathignol, B. Cheng, et al.. (2008). Origin of the Asymmetry in the Magnitude of the Statistical Variability of n- and p-Channel Poly-Si Gate Bulk MOSFETs. IEEE Electron Device Letters. 29(8). 913–915. 37 indexed citations
14.
Cathignol, Augustin, et al.. (2008). Spacing impact on MOSFET mismatch. 90–95. 5 indexed citations
15.
Skotnicki, T., C. Fenouillet-Béranger, C. Gallon, et al.. (2008). Innovative Materials, Devices, and CMOS Technologies for Low-Power Mobile Multimedia. IEEE Transactions on Electron Devices. 55(1). 96–130. 159 indexed citations
16.
Cathignol, Augustin, et al.. (2007). A Continuous Model for MOSFET VT Matching Considering Additional Length Effects. 226–229. 2 indexed citations
17.
Cathignol, Augustin, et al.. (2007). From MOSFET Matching Test Structures to Matching Data Utilization: Not an Ordinary Task. 230–233. 2 indexed citations
18.
Cathignol, Augustin, et al.. (2006). High Threshold Voltage Matching Performance on Gate-All-Around MOSFET. 1. 379–382. 4 indexed citations
19.
Cathignol, Augustin, et al.. (2006). Improved methodology for better accuracy on transistors matching characterization. 173–178. 6 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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