Andreas Pahlke

532 total citations
41 papers, 369 citations indexed

About

Andreas Pahlke is a scholar working on Electrical and Electronic Engineering, Radiation and Materials Chemistry. According to data from OpenAlex, Andreas Pahlke has authored 41 papers receiving a total of 369 indexed citations (citations by other indexed papers that have themselves been cited), including 25 papers in Electrical and Electronic Engineering, 13 papers in Radiation and 12 papers in Materials Chemistry. Recurrent topics in Andreas Pahlke's work include Semiconductor materials and devices (14 papers), Radiation Detection and Scintillator Technologies (10 papers) and Advancements in Semiconductor Devices and Circuit Design (10 papers). Andreas Pahlke is often cited by papers focused on Semiconductor materials and devices (14 papers), Radiation Detection and Scintillator Technologies (10 papers) and Advancements in Semiconductor Devices and Circuit Design (10 papers). Andreas Pahlke collaborates with scholars based in Germany, Japan and Italy. Andreas Pahlke's co-authors include Morten I. Lau, Thomas F. Rutherford, P. Lechner, H. Soltau, Michael Bachmann, Rupert Schreiner, Christoph Langer, M. Hofmann, Tobias Eggert and J. Kemmer and has published in prestigious journals such as Journal of Applied Physics, ACS Applied Materials & Interfaces and IEEE Transactions on Electron Devices.

In The Last Decade

Andreas Pahlke

34 papers receiving 347 citations

Peers

Andreas Pahlke
W.C. Sailor United States
H. Wenninger Switzerland
A. Huke Germany
E. Bertel France
I.A. Lebedev Kazakhstan
C. M. York United States
M. T. Butterfield United States
W.C. Sailor United States
Andreas Pahlke
Citations per year, relative to Andreas Pahlke Andreas Pahlke (= 1×) peers W.C. Sailor

Countries citing papers authored by Andreas Pahlke

Since Specialization
Citations

This map shows the geographic impact of Andreas Pahlke's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Andreas Pahlke with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Andreas Pahlke more than expected).

Fields of papers citing papers by Andreas Pahlke

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Andreas Pahlke. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Andreas Pahlke. The network helps show where Andreas Pahlke may publish in the future.

Co-authorship network of co-authors of Andreas Pahlke

This figure shows the co-authorship network connecting the top 25 collaborators of Andreas Pahlke. A scholar is included among the top collaborators of Andreas Pahlke based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Andreas Pahlke. Andreas Pahlke is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Bachmann, Michael, et al.. (2025). Highly Efficient Planar Hot Electron Emitters Based on Ultrathin Pyrolyzed Polymer Films. ACS Applied Materials & Interfaces. 17(23). 34637–34646.
2.
Bachmann, Michael, et al.. (2023). Quantitative Field Emission Imaging for Studying the Doping-Dependent Emission Behavior of Silicon Field Emitter Arrays. Micromachines. 14(11). 2008–2008. 2 indexed citations
3.
Bachmann, Michael, et al.. (2023). Beta Factor Mapping of Individual Emitting Tips During Integral Operation of Field Emission Arrays. 39. 224–226. 2 indexed citations
4.
Bachmann, Michael, Rupert Schreiner, Cormac Ó Coileáin, et al.. (2023). Characterization and Operation of Graphene-Oxide-Semiconductor Emitters at Atmospheric Pressure Levels. 14–16. 1 indexed citations
5.
Hänsch, W., et al.. (2022). In situ quantitative field emission imaging using a low-cost CMOS imaging sensor. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 40(1). 3 indexed citations
6.
Hänsch, W., et al.. (2021). Origin of the current saturation level of p-doped silicon field emitters. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 40(1). 2 indexed citations
7.
Hänsch, W., et al.. (2021). Publisher’s Note: “Silicon field emitters fabricated by dicing-saw and wet-chemical-etching” [J. Vac. Sci. Technol. B 39, 013205 (2021)]. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 39(2). 1 indexed citations
8.
Bachmann, Michael, et al.. (2020). Vacuum-sealed field emission electron gun. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 38(2). 10 indexed citations
9.
Pahlke, Andreas, et al.. (2018). High Performance Silicon Drift Detectors for Energy Dispersive Spectroscopy. Microscopy and Microanalysis. 24(S1). 1150–1151. 1 indexed citations
10.
Bachmann, Michael, et al.. (2018). Extraction of the current distribution out of saturated integral measurement data of p-type silicon field emitter arrays. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 36(5). 1 indexed citations
11.
Bachmann, Michael, et al.. (2017). Regulation of the Transmitted Electron Flux in a Field-Emission Electron Source Demonstrated on Si Nanowhisker Cathodes. IEEE Transactions on Electron Devices. 64(12). 5128–5133. 19 indexed citations
12.
Bachmann, Michael, et al.. (2017). Control of the electron source current. 34. 66–67. 2 indexed citations
13.
Bachmann, Michael, M. Hofmann, Andreas Pahlke, et al.. (2016). Extraction of the characteristics of current-limiting elements from field emission measurement data. Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena. 35(2). 11 indexed citations
14.
Pahlke, Andreas, et al.. (2015). High Performance X-Ray Transmission Windows Based on Graphenic Carbon. IEEE Transactions on Nuclear Science. 62(2). 588–593. 24 indexed citations
15.
Bachmann, Michael, et al.. (2015). Stability investigation of high aspect ratio n-type silicon field emitter arrays. 204–205. 5 indexed citations
16.
Schreiner, Rupert, Christoph Langer, Michael Bachmann, et al.. (2015). Semiconductor field emission electron sources using a modular system concept for application in sensors and x-ray-sources. 178–179. 10 indexed citations
17.
Eggert, Tobias, et al.. (2012). Reduction of optical crosstalk in silicon photomultipliers. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8460. 84601L–84601L. 3 indexed citations
18.
Yamaoka, K., Yusuke Arai, Andreas Pahlke, et al.. (2008). Development of a Gamma-ray Burst Detector Based on the Silicon Drift Detector Array and Scintillators. AIP conference proceedings. 1000. 624–627.
19.
Kemmer, J., et al.. (2005). Epitaxy — a new technology for fabrication of advanced silicon radiation detectors. Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment. 544(3). 612–619. 9 indexed citations
20.
Soltau, H., P. Lechner, G. Lutz, et al.. (2004). Silicon Drift Detectors for Fast and High Resolution Element Detection in Micro-Beam Analysis. Microscopy and Microanalysis. 10(S02). 1046–1047. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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