Alexandra Delvallée

509 total citations
24 papers, 318 citations indexed

About

Alexandra Delvallée is a scholar working on Atomic and Molecular Physics, and Optics, Biomedical Engineering and Surfaces, Coatings and Films. According to data from OpenAlex, Alexandra Delvallée has authored 24 papers receiving a total of 318 indexed citations (citations by other indexed papers that have themselves been cited), including 12 papers in Atomic and Molecular Physics, and Optics, 9 papers in Biomedical Engineering and 8 papers in Surfaces, Coatings and Films. Recurrent topics in Alexandra Delvallée's work include Force Microscopy Techniques and Applications (8 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Surface Roughness and Optical Measurements (6 papers). Alexandra Delvallée is often cited by papers focused on Force Microscopy Techniques and Applications (8 papers), Electron and X-Ray Spectroscopy Techniques (8 papers) and Surface Roughness and Optical Measurements (6 papers). Alexandra Delvallée collaborates with scholars based in France, Denmark and Netherlands. Alexandra Delvallée's co-authors include Nicolas Feltin, S. Ducourtieux, Jean‐François Hochepied, Laurent Devoille, C. Tromas, Nabil Anwer, Nicolas Fischer, François Piquemal, Carine Chivas‐Joly and Stephan Roche and has published in prestigious journals such as Physical Review B, Journal of Hazardous Materials and Review of Scientific Instruments.

In The Last Decade

Alexandra Delvallée

23 papers receiving 311 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Alexandra Delvallée France 12 120 105 80 66 50 24 318
Qingbin Jiao China 11 76 0.6× 115 1.1× 77 1.0× 34 0.5× 18 0.4× 35 326
Virpi Korpelainen Finland 9 51 0.4× 91 0.9× 76 0.9× 98 1.5× 67 1.3× 25 305
C. G. Frase Germany 10 93 0.8× 123 1.2× 181 2.3× 93 1.4× 83 1.7× 27 462
Xiaolu Chen China 13 171 1.4× 115 1.1× 231 2.9× 70 1.1× 15 0.3× 32 468
Mingkang Wang China 11 81 0.7× 75 0.7× 80 1.0× 163 2.5× 10 0.2× 32 428
Joo Yeon Kim South Korea 9 68 0.6× 246 2.3× 186 2.3× 29 0.4× 26 0.5× 19 400
Guodong Zhang China 10 275 2.3× 144 1.4× 95 1.2× 16 0.2× 63 1.3× 31 566
Vasyl Ryukhtin Czechia 12 180 1.5× 98 0.9× 29 0.4× 27 0.4× 19 0.4× 57 395
Hanqing Liu China 12 87 0.7× 106 1.0× 237 3.0× 55 0.8× 23 0.5× 44 539
Kaiqing Luo China 10 99 0.8× 61 0.6× 39 0.5× 17 0.3× 9 0.2× 50 324

Countries citing papers authored by Alexandra Delvallée

Since Specialization
Citations

This map shows the geographic impact of Alexandra Delvallée's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alexandra Delvallée with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alexandra Delvallée more than expected).

Fields of papers citing papers by Alexandra Delvallée

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Alexandra Delvallée. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alexandra Delvallée. The network helps show where Alexandra Delvallée may publish in the future.

Co-authorship network of co-authors of Alexandra Delvallée

This figure shows the co-authorship network connecting the top 25 collaborators of Alexandra Delvallée. A scholar is included among the top collaborators of Alexandra Delvallée based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alexandra Delvallée. Alexandra Delvallée is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Delvallée, Alexandra, et al.. (2025). Measurement of wettability and surface roughness for metrology and quality control in microfluidics. International Journal of Metrology and Quality Engineering. 16. 2–2.
2.
Delvallée, Alexandra, R. Bellotti, Matteo Fretto, et al.. (2024). AFM interlaboratory comparison for nanodimensional metrology on silicon nanowires. Measurement Science and Technology. 35(10). 105014–105014. 1 indexed citations
3.
Xu, Jiushuai, Alexandra Delvallée, Christian H. Schwalb, et al.. (2024). Deep-reactive ion etching of silicon nanowire arrays at cryogenic temperatures. Applied Physics Reviews. 11(2). 19 indexed citations
4.
Feltin, Nicolas, et al.. (2024). Strategy for Ensuring the Metrological Traceability of Nanoparticle Size Measurements by SEM. Nanomaterials. 14(11). 931–931. 5 indexed citations
5.
Chekri, Rachida, Johanna Noireaux, Alexandra Delvallée, et al.. (2024). Characterisation of titanium dioxide (nano)particles in foodstuffs and E171 additives by single particle inductively coupled plasma-tandem mass spectrometry using a highly efficient sample introduction system. Food Additives & Contaminants Part A. 41(8). 867–884. 1 indexed citations
6.
Feltin, Nicolas, Alexandra Delvallée, Francesco Pellegrino, et al.. (2021). Correlative Analysis of the Dimensional Properties of Bipyramidal Titania Nanoparticles by Complementing Electron Microscopy with Other Methods. Nanomaterials. 11(12). 3359–3359. 6 indexed citations
7.
Feltin, Nicolas, et al.. (2021). Deep Learning Based Instance Segmentation of Titanium Dioxide Particles in the Form of Agglomerates in Scanning Electron Microscopy. Nanomaterials. 11(4). 968–968. 33 indexed citations
8.
Delvallée, Alexandra, et al.. (2021). Influence of electron landing energy on the measurement of the dimensional properties of nanoparticle populations imaged by SEM. Ultramicroscopy. 226. 113300–113300. 7 indexed citations
9.
Piquemal, François, et al.. (2021). Progress in Traceable Nanoscale Capacitance Measurements Using Scanning Microwave Microscopy. Nanomaterials. 11(3). 820–820. 5 indexed citations
10.
Kaja, Khaled, et al.. (2021). Traceable Nanoscale Measurements of High Dielectric Constant by Scanning Microwave Microscopy. Nanomaterials. 11(11). 3104–3104. 4 indexed citations
11.
Pailloux, F., et al.. (2021). A novel approach for 3D morphological characterization of silica nanoparticle population through HAADF-STEM. Measurement. 180. 109521–109521. 3 indexed citations
12.
Delvallée, Alexandra, et al.. (2020). A substitution method for nanoscale capacitance calibration using scanning microwave microscopy. Measurement Science and Technology. 31(7). 74009–74009. 6 indexed citations
13.
Delvallée, Alexandra, et al.. (2019). Methodology to evaluate the uncertainty associated with nanoparticle dimensional measurements by SEM. Measurement Science and Technology. 30(8). 85004–85004. 19 indexed citations
14.
Delvallée, Alexandra, et al.. (2019). A new method for measuring nanoparticle diameter from a set of SEM images using a remarkable point. Ultramicroscopy. 207. 112847–112847. 18 indexed citations
15.
Delvallée, Alexandra, S. Ducourtieux, Laurent Devoille, et al.. (2019). Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology. Beilstein Journal of Nanotechnology. 10. 1523–1536. 24 indexed citations
16.
Hoffmann, Johannes, Alexandra Delvallée, Christophe Licitra, et al.. (2018). Scanning microwave microscopy applied to semiconducting GaAs structures. Review of Scientific Instruments. 89(2). 23704–23704. 13 indexed citations
17.
Chivas‐Joly, Carine, François Gaie-Levrel, C. Motzkus, et al.. (2015). Characterization of aerosols and fibers emitted from composite materials combustion. Journal of Hazardous Materials. 301. 153–162. 16 indexed citations
18.
Delvallée, Alexandra, et al.. (2015). Toward an uncertainty budget for measuring nanoparticles by AFM. Metrologia. 53(1). 41–50. 21 indexed citations
19.
Delvallée, Alexandra, et al.. (2015). Direct comparison of AFM and SEM measurements on the same set of nanoparticles. Measurement Science and Technology. 26(8). 85601–85601. 52 indexed citations
20.
Feltin, Nicolas, et al.. (2013). CARMEN : une plateforme de caractérisation métrologique dédiée aux nanomatériaux. 41–54. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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