M. Zeier

3.0k total citations
37 papers, 335 citations indexed

About

M. Zeier is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering and Atomic and Molecular Physics, and Optics. According to data from OpenAlex, M. Zeier has authored 37 papers receiving a total of 335 indexed citations (citations by other indexed papers that have themselves been cited), including 27 papers in Electrical and Electronic Engineering, 10 papers in Biomedical Engineering and 8 papers in Atomic and Molecular Physics, and Optics. Recurrent topics in M. Zeier's work include Microwave and Dielectric Measurement Techniques (21 papers), Microwave Engineering and Waveguides (12 papers) and Electromagnetic Compatibility and Measurements (7 papers). M. Zeier is often cited by papers focused on Microwave and Dielectric Measurement Techniques (21 papers), Microwave Engineering and Waveguides (12 papers) and Electromagnetic Compatibility and Measurements (7 papers). M. Zeier collaborates with scholars based in Switzerland, France and Germany. M. Zeier's co-authors include Johannes Hoffmann, Ferry Kienberger, Jens Niegemann, Georg Gramse, H. Huber, B. Jeckelmann, B. Zihlmann, I. Sick, Martin Hudlička and A. Feltham and has published in prestigious journals such as SHILAP Revista de lepidopterología, Applied Physics Letters and Nuclear Physics A.

In The Last Decade

M. Zeier

35 papers receiving 317 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
M. Zeier Switzerland	12	241	105	58	30	17	37	335
H.P. Chou Taiwan	9	162 0.7×	81 0.8×	30 0.5×	14 0.5×	15 0.9×	37	249
Kenichi Miyaguchi Japan	10	416 1.7×	80 0.8×	28 0.5×	12 0.4×	5 0.3×	44	464
Carlo Petrone Switzerland	9	136 0.6×	142 1.4×	6 0.1×	35 1.2×	13 0.8×	54	229
J. Uythoven Switzerland	8	161 0.7×	122 1.2×	41 0.7×	58 1.9×	5 0.3×	63	213
M. Otsuka Japan	7	332 1.4×	129 1.2×	15 0.3×	49 1.6×	13 0.8×	32	409
Johann Meisner Germany	8	139 0.6×	17 0.2×	30 0.5×	9 0.3×	16 0.9×	42	184
K.T. Hsu Taiwan	7	159 0.7×	62 0.6×	64 1.1×	31 1.0×	5 0.3×	102	255
J. Billan Switzerland	9	192 0.8×	199 1.9×	18 0.3×	37 1.2×	11 0.6×	38	251
B.J. Blalock United States	12	340 1.4×	115 1.1×	33 0.6×	24 0.8×	6 0.4×	28	397
C.I. Lee United States	10	446 1.9×	42 0.4×	25 0.4×	16 0.5×	24 1.4×	16	465

Countries citing papers authored by M. Zeier

Since Specialization

Citations

This map shows the geographic impact of M. Zeier's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Zeier with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Zeier more than expected).

Fields of papers citing papers by M. Zeier

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Zeier. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Zeier. The network helps show where M. Zeier may publish in the future.

Co-authorship network of co-authors of M. Zeier

This figure shows the co-authorship network connecting the top 25 collaborators of M. Zeier. A scholar is included among the top collaborators of M. Zeier based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with M. Zeier. M. Zeier is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

1.

Zeier, M., et al.. (2025). VNA Tools—A Metrology Software Supporting the Digital Traceability Chain. SHILAP Revista de lepidopterología. 5(4). 72–72.

2.

Klüss, Joni, Jari Hällström, Wei Yan, et al.. (2025). Comparison of partial discharge (PD) calibrators from 0.1 pC to 10 nC. Metrologia. 62(1A). 1002–1002.

3.

Zeier, M., et al.. (2024). Coaxial tips for a scanning microwave microscope and its calibration with dielectric references. Measurement Science and Technology. 35(8). 85010–85010. 1 indexed citations

4.

Hoffmann, Johannes, et al.. (2021). Standard Load Method: A New Calibration Technique for Material Characterization at Terahertz Frequencies. IEEE Transactions on Instrumentation and Measurement. 70. 1–10. 13 indexed citations

5.

Zeier, M., et al.. (2021). PDF/A-3 solution for digital calibration certificates. Measurement Sensors. 18. 100282–100282. 11 indexed citations

6.

Quang, Toai Le, et al.. (2021). Advanced calibration kit for scanning microwave microscope: Design, fabrication, and measurement. Review of Scientific Instruments. 92(2). 23705–23705. 1 indexed citations

7.

Hoffmann, Johannes, et al.. (2020). VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating. 1–2. 1 indexed citations

8.

Arz, Uwe, T. Probst, Koert F.D. Kuhlmann, et al.. (2019). Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers. White Rose Research Online (University of Leeds, The University of Sheffield, University of York). 6 indexed citations

9.

Hoffmann, Johannes, et al.. (2019). THz Detector Calibration Based on Microwave Power Standards. 402–403. 1 indexed citations

10.

Hoffmann, Johannes, Alexandra Delvallée, Christophe Licitra, et al.. (2018). Scanning microwave microscopy applied to semiconducting GaAs structures. Review of Scientific Instruments. 89(2). 23704–23704. 13 indexed citations

11.

Hoffmann, Johannes, et al.. (2016). Traceable calibration with 1.0mm coaxial standards. 1–4. 4 indexed citations

12.

Hoffmann, Johannes, et al.. (2016). Considerations for using waveguide extenders. 1–2. 2 indexed citations

13.

Hoffmann, Johannes, et al.. (2015). Comparison of methods for measurement of equivalent source match. 730–733. 2 indexed citations

14.

Gramse, Georg, et al.. (2014). Measuring low loss dielectric substrates with scanning probe microscopes. Applied Physics Letters. 105(1). 28 indexed citations

15.

Zeier, M., et al.. (2014). Stability tests of electronic calibration units. 16–17. 2 indexed citations

16.

Zeier, M., et al.. (2012). A calibration algorithm for nearfield scanning microwave microscopes. 108. 1–4. 32 indexed citations

17.

Zeier, M., et al.. (2010). Comparison of 1.85mm line reflect line and offset short calibration. 1–7. 12 indexed citations

18.

Jeckelmann, B. & M. Zeier. (2010). Final report on RMO key comparison EUROMET.EM-K2: Comparison of resistance standards at 10 MΩ and 1 GΩ. Metrologia. 47(1A). 1006–1006. 6 indexed citations

19.

Zeier, M., et al.. (2004). EUROMET.EM.RF-S16 Final Report: Comparison of scattering parameter measurements in the coaxial 2.4 mm line system. Metrologia. 42(1A). 1001–1001. 2 indexed citations

20.

Zeier, M., H. Anklin, W. Glöckle, et al.. (1999). Polarization transfer in. Nuclear Physics A. 654(3-4). 541–557. 3 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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