Alex Dommann
About
In The Last Decade
Alex Dommann
125 papers receiving 2.0k citations
Hit Papers
Peers
Comparison fields: 5 of 111
- Electrical and Electronic Engineering 1.0k
- Materials Chemistry 739
- Biomedical Engineering 586
- Atomic and Molecular Physics, and Optics 434
- Mechanics of Materials 297
Countries citing papers authored by Alex Dommann
This map shows the geographic impact of Alex Dommann's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Alex Dommann with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Alex Dommann more than expected).
Fields of papers citing papers by Alex Dommann
This network shows the impact of papers produced by Alex Dommann. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Alex Dommann. The network helps show where Alex Dommann may publish in the future.
Co-authorship network of co-authors of Alex Dommann
This figure shows the co-authorship network connecting the top 25 collaborators of Alex Dommann. A scholar is included among the top collaborators of Alex Dommann based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Alex Dommann. Alex Dommann is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 1 | |
| 3 | 2 | |
| 4 | 7 | |
| 5 | 18 | |
| 6 | 12 | |
| 7 | 4 | |
| 8 | 3 | |
| 9 | 10 | |
| 10 | 47 | |
| 11 | 28 | |
| 12 | 10 | |
| 13 | Analysis of stress in silicon-based microsystems by X-ray diffraction techniques | 1 |
| 14 | 31 | |
| 15 | 11 | |
| 16 | Reliable hermetic MEMS chip-scale packaging | 1 |
| 17 | Advanced In- and Out-off plane High Resolution X-ray Strain Analysis on MEMS | 3 |
| 18 | 128 | |
| 19 | 3 | |
| 20 | 56 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.