A.C. Zonnevylle

489 total citations
13 papers, 342 citations indexed

About

A.C. Zonnevylle is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films and Biomedical Engineering. According to data from OpenAlex, A.C. Zonnevylle has authored 13 papers receiving a total of 342 indexed citations (citations by other indexed papers that have themselves been cited), including 7 papers in Electrical and Electronic Engineering, 6 papers in Surfaces, Coatings and Films and 5 papers in Biomedical Engineering. Recurrent topics in A.C. Zonnevylle's work include Advancements in Photolithography Techniques (5 papers), Electron and X-Ray Spectroscopy Techniques (5 papers) and Advanced Electron Microscopy Techniques and Applications (4 papers). A.C. Zonnevylle is often cited by papers focused on Advancements in Photolithography Techniques (5 papers), Electron and X-Ray Spectroscopy Techniques (5 papers) and Advanced Electron Microscopy Techniques and Applications (4 papers). A.C. Zonnevylle collaborates with scholars based in Netherlands, Switzerland and Germany. A.C. Zonnevylle's co-authors include Nalan Liv, Jacob P. Hoogenboom, P. Kruit, Philip W. Voorneveld, James C.H. Hardwick, Hans Morreau, Hein W. Verspaget, Daniël W. Hommes, Liudmila L. Kodach and Gijs R. van den Brink and has published in prestigious journals such as Gastroenterology, PLoS ONE and Scientific Reports.

In The Last Decade

A.C. Zonnevylle

13 papers receiving 336 citations

Peers

Countries citing papers authored by A.C. Zonnevylle

Since Specialization

Citations

This map shows the geographic impact of A.C. Zonnevylle's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A.C. Zonnevylle with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A.C. Zonnevylle more than expected).

Fields of papers citing papers by A.C. Zonnevylle

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A.C. Zonnevylle. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A.C. Zonnevylle. The network helps show where A.C. Zonnevylle may publish in the future.

Co-authorship network of co-authors of A.C. Zonnevylle

This figure shows the co-authorship network connecting the top 25 collaborators of A.C. Zonnevylle. A scholar is included among the top collaborators of A.C. Zonnevylle based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A.C. Zonnevylle. A.C. Zonnevylle is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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13 of 13 papers shown

#	Work	Indexed citations
1	Estimating Step Heights from Top-Down SEM Images 2019 ·Microscopy and Microanalysis ·(unknown), Jens Bolten, A.C. Zonnevylle, P. Kruit, K. HAGEN	9
2	Charge-induced pattern displacement in E-beam lithography 2019 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·(unknown), (unknown), A.C. Zonnevylle, (unknown), (unknown), K. HAGEN	16
3	Electron beam lithography on curved or tilted surfaces: Simulations and experiments 2019 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·(unknown), A.C. Zonnevylle, (unknown), (unknown), Ulrich Hofmann, K. HAGEN	5
4	Individual beam control in multi electron beam systems 2017 ·Research Repository (Delft University of Technology) ·A.C. Zonnevylle	2
5	Automated sub-5 nm image registration in integrated correlative fluorescence and electron microscopy using cathodoluminescence pointers 2017 ·Scientific Reports ·(unknown), Nalan Liv, A.C. Zonnevylle, (unknown), Lenard M. Voortman, P. Kruit, Jacob P. Hoogenboom	15
6	Loss of SMAD4 Alters BMP Signaling to Promote Colorectal Cancer Cell Metastasis via Activation of Rho and ROCK 2014 ·Gastroenterology ·Philip W. Voorneveld, Liudmila L. Kodach, Rutger J. Jacobs, Nalan Liv, A.C. Zonnevylle, Jacob P. Hoogenboom, Izäk Biemond, Hein W. Verspaget, Daniël W. Hommes, Karien E. de Rooij, Carel J.M. van Noesel, Hans Morreau, Tom van Wezel, G. Johan A. Offerhaus, Gijs R. van den Brink, Maikel P. Peppelenbosch, Peter ten Dijke, James C.H. Hardwick	145
7	Multi-electron-beam deflector array 2014 ·Microelectronic Engineering ·A.C. Zonnevylle, (unknown), K. HAGEN, P. Kruit	2
8	Simultaneous Correlative Scanning Electron and High-NA Fluorescence Microscopy 2013 ·PLoS ONE ·Nalan Liv, A.C. Zonnevylle, (unknown), (unknown), Philip W. Voorneveld, Miriam S. Lucas, James C.H. Hardwick, Roger Wepf, P. Kruit, Jacob P. Hoogenboom	73
9	Integration of a high‐NA light microscope in a scanning electron microscope 2013 ·Journal of Microscopy ·A.C. Zonnevylle, (unknown), Nalan Liv, (unknown), (unknown), P. Kruit, Jacob P. Hoogenboom	57
10	Cathodoluminescence Microscopy of nanostructures on glass substrates 2013 ·Optics Express ·(unknown), (unknown), Robert J. Moerland, Nalan Liv, A.C. Zonnevylle, P. Kruit, Jacob P. Hoogenboom	13
11	Deflection properties of an electrostatic electron lens with a shifted electrode 2013 ·Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ·A.C. Zonnevylle, (unknown), K. HAGEN, P. Kruit	2
12	Electrostatic rotator for alignment purposes in multi electron beam systems 2009 ·Microelectronic Engineering ·A.C. Zonnevylle, (unknown), P. Kruit, Marek Wieland, F.M. Postma, (unknown)	1
13	Directed assembly of nano-particles with the help of charge patterns created with scanning electron microscope 2008 ·Microelectronic Engineering ·A.C. Zonnevylle, K. HAGEN, P. Kruit, A. Schmidt−Ott	2

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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