A. vom Felde
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
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- Advanced Chemical Physics Studies
- Surface and Thin Film Phenomena
- Spectroscopy and Quantum Chemical Studies
Papers in
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- Electron and X-Ray Spectroscopy Techniques 7
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- Advanced Chemical Physics Studies 10
- Surface and Thin Film Phenomena 6
- Semiconductor Quantum Structures and Devices 2
A. vom Felde
18 papers receiving 521 citations
Peers
Comparison fields: 5 of 40
- Surfaces, Coatings and Films 92
- Atomic and Molecular Physics, and Optics 289
- Condensed Matter Physics 70
- Radiation 52
- Computational Mechanics 100
Countries citing papers authored by A. vom Felde
This map shows the geographic impact of A. vom Felde's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. vom Felde with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. vom Felde more than expected).
Fields of papers citing papers by A. vom Felde
This network shows the impact of papers produced by A. vom Felde. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. vom Felde. The network helps show where A. vom Felde may publish in the future.
Co-authors
The 23 scholars most cited alongside A. vom Felde, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 0 | |
| 2 | 1995 | 1 | |
| 3 | Controlled Sub-nm Oxide Growth and its Application to High Speed Bipolar Poly-Emitter Transistors | 1994 | 1 |
| 4 | 1993 | 6 | |
| 5 | 1992 | 7 | |
| 6 | 1992 | 9 | |
| 7 | 1992 | 2 | |
| 8 | 1992 | 3 | |
| 9 | 1990 | 4 | |
| 10 | 1990 | 22 | |
| 11 | 1990 | 6 | |
| 12 | 1990 | 10 | |
| 13 | 1990 | 5 | |
| 14 | 1989 | 55 | |
| 15 | 1989 | 147 | |
| 16 | 1988 | 28 | |
| 17 | 1987 | 24 | |
| 18 | 1985 | 10 | |
| 19 | 1984 | 210 |
About A. vom Felde
A. vom Felde is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering and Materials Chemistry, having authored 19 papers that have together received 550 indexed citations. Recurring topics across this work include Advanced Chemical Physics Studies (10 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Semiconductor materials and devices (7 papers), Surface and Thin Film Phenomena (6 papers), Catalytic Processes in Materials Science (4 papers), Molecular Junctions and Nanostructures (3 papers), GaN-based semiconductor devices and materials (3 papers) and Semiconductor Quantum Structures and Devices (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (92 citations), Atomic and Molecular Physics, and Optics (289 citations), Condensed Matter Physics (70 citations), Radiation (52 citations) and Computational Mechanics (100 citations). A. vom Felde has collaborated with scholars based in United States and Germany. Frequent co-authors include J. Fink, B. Scheerer, G. Linker, D. Kaletta, J. Pflüger, M. J. Cardillo, C. C. Bahr, W. Ekardt, G. S. Higashi and Yves J. Chabal. Their work appears in journals such as Physical review. B, Condensed matter, Surface Science, Chemical Physics Letters, Physical Review Letters and Journal of Electron Spectroscopy and Related Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.