A. Turos

3.1k total citations
193 papers, 2.5k citations indexed

About

A. Turos is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Computational Mechanics. According to data from OpenAlex, A. Turos has authored 193 papers receiving a total of 2.5k indexed citations (citations by other indexed papers that have themselves been cited), including 92 papers in Electrical and Electronic Engineering, 83 papers in Materials Chemistry and 79 papers in Computational Mechanics. Recurrent topics in A. Turos's work include Ion-surface interactions and analysis (78 papers), Semiconductor materials and devices (42 papers) and Integrated Circuits and Semiconductor Failure Analysis (31 papers). A. Turos is often cited by papers focused on Ion-surface interactions and analysis (78 papers), Semiconductor materials and devices (42 papers) and Integrated Circuits and Semiconductor Failure Analysis (31 papers). A. Turos collaborates with scholars based in Poland, Germany and France. A. Turos's co-authors include O. Meyer, Hj. Matzke, J. Jagielski, Ł. Nowicki, A. Stonert, R. Ratajczak, A.M. Abdul-Kader, L.S. Wieluński, F. Garrido and A. Piątkowska and has published in prestigious journals such as Physical Review Letters, SHILAP Revista de lepidopterología and Physical review. B, Condensed matter.

In The Last Decade

A. Turos

184 papers receiving 2.5k citations

Peers

A. Turos
Comparison fields: 5 of 65
  • Materials Chemistry 1.5k
  • Computational Mechanics 861
  • Electrical and Electronic Engineering 801
  • Mechanics of Materials 375
  • Condensed Matter Physics 339
Replace J. Jagielski with:
J. Jagielski Poland
Jean‐Marc Costantini France
R. C. Birtcher United States
Weilin Jiang United States
A. Iwase Japan
R. Grötzschel Germany
J.R. Tesmer United States
В.А. Скуратов Russia
L. Thomé France
A. Meftah France
J. Jagielski Poland View profile →
Citations per field, relative to A. Turos
A. Turos · 1×
Citations per year, relative to A. Turos
A. Turos · 1×

Countries citing papers authored by A. Turos

Since Specialization
Citations

This map shows the geographic impact of A. Turos's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Turos with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Turos more than expected).

Fields of papers citing papers by A. Turos

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Turos. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Turos. The network helps show where A. Turos may publish in the future.

Co-authorship network of co-authors of A. Turos

This figure shows the co-authorship network connecting the top 25 collaborators of A. Turos. A scholar is included among the top collaborators of A. Turos based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Turos. A. Turos is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
# Work Indexed citations
1 2
2 6
3 13
4 4
5
HRXRD study of ZnO single crystals bombarded with Ar ions
2
6 44
7
Badanie heterostruktur związków AIIIN zawierających warstwy ultracienkie
0
8
Azotek krzemu stosowany w technologii planarnych fotodiod wykonanych na bazie InP
0
9
Właściwości warstwy wierzchniej polietylenu modyfikowanego wiązką jonów argonu
0
10 4
11 1
12
Influence of Ar and He implantation on surface morphology of polymers
3
13
Polygonisation of Ionic Single Crystals --- a New Effect of Swift Ion Bombardment
6
14
Thermally activated defect transformations in III-V compound semiconductors
2
15 25
16 0
17 2
18 6
19
APPLICATION OF THE COULOMB BACKSCATTERING OF THE HEAVY CHARGED PARTICLES. II. CHEMICAL ANALYSIS OF SURFACE LAYERS.
0
20
APPLICATION OF THE COULOMB BACKSCATTERING OF THE HEAVY CHARGED PARTICLES. I. THICKNESS MEASUREMENTS OF THIN FOILS AND SURFACE LAYERS.
0

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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