A. Franks
- Radiation top 5%
- Advanced X-ray Imaging Techniques 19
- Surfaces, Coatings and Films top 10%
- Optical Coatings and Gratings 5
- Mechanical Engineering top 10%
- Advanced Measurement and Metrology Techniques 13
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- Particle Accelerators and Free-Electron Lasers 7
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- Force Microscopy Techniques and Applications 6
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- Surface Roughness and Optical Measurements 5
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- Advanced Surface Polishing Techniques 5
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- Crystallography and Radiation Phenomena 4
- Co-authors
- K. E. PuttickKenneth J. SmithB. GaleEdward W. PalmerMargaret StedmanW. EhrenbergM.C. HutleyAndrew Yacoot
- Partner nations
- United KingdomUnited StatesNetherlands
In The Last Decade
A. Franks
53 papers receiving 651 citations
Peers
Comparison fields: 5 of 104
- Radiation 137
- Surfaces, Coatings and Films 74
- Structural Biology 12
- Statistics, Probability and Uncertainty 51
- Mechanical Engineering 202
Countries citing papers authored by A. Franks
This map shows the geographic impact of A. Franks's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Franks with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Franks more than expected).
Fields of papers citing papers by A. Franks
This network shows the impact of papers produced by A. Franks. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Franks. The network helps show where A. Franks may publish in the future.
Co-authorship network
The 25 scholars most cited alongside A. Franks, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2000 | 5 | |
| 2 | Measurement of the microthrust of the field emission electric propulsion unit. | 1996 | 1 |
| 3 | 1990 | 3 | |
| 4 | 1989 | 105 | |
| 5 | 1988 | 1 | |
| 6 | 1986 | 2 | |
| 7 | 1984 | 1 | |
| 8 | 1983 | 8 | |
| 9 | 1982 | 1 | |
| 10 | 1980 | 1 | |
| 11 | Recent Developments in X-Ray Diffraction Gratings at NPL | 1976 | 0 |
| 12 | 1975 | 24 | |
| 13 | 1974 | 12 | |
| 14 | 1964 | 14 | |
| 15 | 1962 | 2 | |
| 16 | 1959 | 5 | |
| 17 | 1959 | 7 | |
| 18 | 1956 | 6 | |
| 19 | 1955 | 14 | |
| 20 | 1955 | 67 |
About A. Franks
A. Franks is a scholar working on Radiation, Chemical Health and Safety and Surfaces, Coatings and Films, having authored 56 papers that have together received 708 indexed citations. Recurring topics across this work include Advanced X-ray Imaging Techniques (19 papers), Advanced Measurement and Metrology Techniques (13 papers), Particle Accelerators and Free-Electron Lasers (7 papers), Force Microscopy Techniques and Applications (6 papers), Surface Roughness and Optical Measurements (5 papers), Advanced Surface Polishing Techniques (5 papers), Optical Coatings and Gratings (5 papers) and Crystallography and Radiation Phenomena (4 papers). The work is most often cited by research in Radiation (137 citations), Surfaces, Coatings and Films (74 citations) and Structural Biology (12 citations). A. Franks has collaborated with scholars based in United Kingdom, United States and Netherlands. Frequent co-authors include K. E. Puttick, Kenneth J. Smith, B. Gale, Edward W. Palmer, Margaret Stedman, W. Ehrenberg, M.C. Hutley, Andrew Yacoot, Keith Jackson and R. J. Speer. Their work appears in journals such as Nature, Nanotechnology, Optical Engineering, Measurement Science and Technology and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.