A. Buczkowski

475 total citations
42 papers, 375 citations indexed

About

A. Buczkowski is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Materials Chemistry. According to data from OpenAlex, A. Buczkowski has authored 42 papers receiving a total of 375 indexed citations (citations by other indexed papers that have themselves been cited), including 37 papers in Electrical and Electronic Engineering, 21 papers in Atomic and Molecular Physics, and Optics and 7 papers in Materials Chemistry. Recurrent topics in A. Buczkowski's work include Silicon and Solar Cell Technologies (32 papers), Semiconductor materials and interfaces (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). A. Buczkowski is often cited by papers focused on Silicon and Solar Cell Technologies (32 papers), Semiconductor materials and interfaces (21 papers) and Integrated Circuits and Semiconductor Failure Analysis (16 papers). A. Buczkowski collaborates with scholars based in United States, Japan and Poland. A. Buczkowski's co-authors include G. A. Rozgonyi, Fumio Shimura, Z. J. Radzimski, Andrzej Romanowski, F.‐G. Kirscht, Donovan Finn, M. Fletcher, Kazumichi Katayama, Sergei Rouvimov and Jacek A. Majewski and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

A. Buczkowski

38 papers receiving 344 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
A. Buczkowski United States 12 334 155 91 40 27 42 375
G. Giroult-Matlakowski France 6 334 1.0× 108 0.7× 96 1.1× 36 0.9× 33 1.2× 12 354
R. G. Mazur United States 7 268 0.8× 156 1.0× 56 0.6× 31 0.8× 10 0.4× 17 301
Shinsuke Sadamitsu Japan 13 348 1.0× 122 0.8× 138 1.5× 54 1.4× 13 0.5× 20 376
P. Warren France 13 457 1.4× 270 1.7× 195 2.1× 48 1.2× 13 0.5× 40 485
M. Arienzo United States 12 436 1.3× 190 1.2× 175 1.9× 32 0.8× 14 0.5× 31 478
Janet Jacobs United Kingdom 9 248 0.7× 131 0.8× 169 1.9× 64 1.6× 9 0.3× 25 335
Nobuo Toyokura Japan 9 289 0.9× 109 0.7× 71 0.8× 24 0.6× 16 0.6× 17 330
E. Ishida United States 7 309 0.9× 107 0.7× 68 0.7× 53 1.3× 19 0.7× 17 357
T.W. Ekstedt United States 6 446 1.3× 66 0.4× 90 1.0× 35 0.9× 7 0.3× 9 461
Paul Gundel Germany 13 437 1.3× 131 0.8× 134 1.5× 22 0.6× 6 0.2× 34 462

Countries citing papers authored by A. Buczkowski

Since Specialization
Citations

This map shows the geographic impact of A. Buczkowski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Buczkowski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Buczkowski more than expected).

Fields of papers citing papers by A. Buczkowski

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Buczkowski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Buczkowski. The network helps show where A. Buczkowski may publish in the future.

Co-authorship network of co-authors of A. Buczkowski

This figure shows the co-authorship network connecting the top 25 collaborators of A. Buczkowski. A scholar is included among the top collaborators of A. Buczkowski based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with A. Buczkowski. A. Buczkowski is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Buczkowski, A., et al.. (2006). Non-Contact, Image-Based Photoluminescence Metrology for Ion Implantation and Annealing Process Inspection. AIP conference proceedings. 866. 566–569. 1 indexed citations
2.
Borland, John, W. Krull, D. C. Jacobson, et al.. (2006). 45nm Node p+ USJ Formation With High Dopant Activation And Low Damage. 4–9. 7 indexed citations
3.
Buczkowski, A., et al.. (2003). Photoluminescence Intensity Analysis in Application to Contactless Characterization of Silicon Wafers. Journal of The Electrochemical Society. 150(8). G436–G436. 14 indexed citations
4.
Schroder, D.K., et al.. (2001). Silicon Epitaxial Layer Lifetime Characterization. Journal of The Electrochemical Society. 148(8). G411–G411. 17 indexed citations
5.
Wilson, Marshall, et al.. (1999). New COCOS(Corona Oxide Characterization of Semiconductor) method for monitoring the reliability of thin gate oxides.. Proc SPIE. 3895. 373–384.
6.
Romanowski, Andrzej, A. Buczkowski, Abdennaceur Karoui, & G. A. Rozgonyi. (1998). Frequency-resolved microwave reflection photoconductance. Journal of Applied Physics. 83(12). 7730–7735. 3 indexed citations
7.
Buczkowski, A., et al.. (1995). Lifetime Identification of Thermal Oxidation Process Induced Contamination in Silicon Wafers. Materials science forum. 196-201. 1817–1822. 4 indexed citations
8.
Szlufcik, Jozef, Koen De Clercq, Jef Poortmans, et al.. (1994). Improvement in Multicrystalline Silicon Solar Cells after Thermal Treatment of PECVD Silicon Nitride AR Coating. 1018–1021. 13 indexed citations
9.
Buczkowski, A., et al.. (1993). Photoconductance Minority Carrier Lifetime vs. Surface Photovoltage Diffusion Length In Silicon. Journal of The Electrochemical Society. 140(11). 3240–3245. 10 indexed citations
10.
Ikeda, Naoki, A. Buczkowski, & Fumio Shimura. (1993). Noncontact characterization for grown-in defects in Czochralski silicon wafers with a laser/microwave photoconductance method. Applied Physics Letters. 63(21). 2914–2916. 5 indexed citations
11.
Buczkowski, A., et al.. (1993). Enhanced surface/interface recombination and surface inversion of Ni decorated Si/Si(Ge)/Si heterostructures. Journal of Applied Physics. 73(12). 8412–8418. 2 indexed citations
12.
Montgomery, Jeffrey S., A. Buczkowski, Fumio Shimura, et al.. (1993). A Study of Surface and Subsurface Properties of Si (100) After Hydrogen Ion-Beam Exposure. MRS Proceedings. 315(1). 231–236. 1 indexed citations
13.
Buczkowski, A., Z. J. Radzimski, G. A. Rozgonyi, & Fumio Shimura. (1991). Bulk and surface components of recombination lifetime based on a two-laser microwave reflection technique. Journal of Applied Physics. 69(9). 6495–6499. 45 indexed citations
14.
Buczkowski, A., et al.. (1991). The Gettering and Electrical Activity of Ni, Au, and Cu in Epitaxial Si/Si(2%Ge)/Si during RTA. MRS Proceedings. 224. 4 indexed citations
15.
Buczkowski, A., Z. J. Radzimski, & G. A. Rozgonyi. (1991). Conductivity-type conversion in multiple-implant/multiple-anneal SOI. IEEE Transactions on Electron Devices. 38(1). 61–66. 4 indexed citations
16.
Buczkowski, A., et al.. (1990). Noncontact energy level analysis of metallic impurities in silicon crystals. Applied Physics Letters. 57(26). 2832–2834. 19 indexed citations
17.
Jeżowska‐Trzebiatowska, B., et al.. (1986). Neodymium-chromium doped phosphate glasses as luminescent solar concentrators. Solar Energy Materials. 13(4). 267–277. 7 indexed citations
18.
Romanowski, Andrzej & A. Buczkowski. (1985). The measurement of the diffusion length and the recombination velocity at the grain boundary in polycrystalline solar cells by the SEM-EBIC technique. Solid-State Electronics. 28(7). 645–652. 10 indexed citations
19.
Romanowski, Andrzej & A. Buczkowski. (1985). The contrast characteristics of the grain boundary near the boundary layer in polycrystalline solar cells. Solid-State Electronics. 28(12). 1199–1206. 2 indexed citations
20.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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