Shinsuke Sadamitsu

476 total citations
20 papers, 376 citations indexed

About

Shinsuke Sadamitsu is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Biomedical Engineering. According to data from OpenAlex, Shinsuke Sadamitsu has authored 20 papers receiving a total of 376 indexed citations (citations by other indexed papers that have themselves been cited), including 18 papers in Electrical and Electronic Engineering, 9 papers in Atomic and Molecular Physics, and Optics and 4 papers in Biomedical Engineering. Recurrent topics in Shinsuke Sadamitsu's work include Silicon and Solar Cell Technologies (17 papers), Semiconductor materials and interfaces (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). Shinsuke Sadamitsu is often cited by papers focused on Silicon and Solar Cell Technologies (17 papers), Semiconductor materials and interfaces (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (6 papers). Shinsuke Sadamitsu collaborates with scholars based in Japan and United Kingdom. Shinsuke Sadamitsu's co-authors include Shigeo Sumita, Masataka Hourai, Tatsuhiko Shigematsu, Nobukatsu Fujino, Masakazu Sano, Koji Sueoka, Toshio Shiraiwa, Kazuo Hiramoto, Hiroki Murakami and Hisashi Katahama and has published in prestigious journals such as Journal of The Electrochemical Society, Japanese Journal of Applied Physics and Materials science forum.

In The Last Decade

Shinsuke Sadamitsu

20 papers receiving 327 citations

Peers

Countries citing papers authored by Shinsuke Sadamitsu

Since Specialization

Citations

This map shows the geographic impact of Shinsuke Sadamitsu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Shinsuke Sadamitsu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Shinsuke Sadamitsu more than expected).

Fields of papers citing papers by Shinsuke Sadamitsu

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Shinsuke Sadamitsu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Shinsuke Sadamitsu. The network helps show where Shinsuke Sadamitsu may publish in the future.

Co-authorship network of co-authors of Shinsuke Sadamitsu

This figure shows the co-authorship network connecting the top 25 collaborators of Shinsuke Sadamitsu. A scholar is included among the top collaborators of Shinsuke Sadamitsu based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Shinsuke Sadamitsu. Shinsuke Sadamitsu is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Effect of Heavy Carbon, Nitrogen and Boron Doping on Oxygen Precipitation Behavior in Silicon Epitaxial Wafers 2001 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Koji Sueoka, (unknown), Mitsuharu Yonemura, (unknown), (unknown), (unknown), Shinsuke Sadamitsu	14
2	Internal Gettering for Ni Contamination in Czochralski Silicon Wafers 2000 ·Journal of The Electrochemical Society ·Koji Sueoka, Shinsuke Sadamitsu, (unknown), Takayuki Kihara, Hisashi Katahama	20
3	Oxygen Precipitation Behaviour and Internal Gettering in Epitaxial and Polished Czochralski Silicon Wafers 1999 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Koji Sueoka, (unknown), Mitsuharu Yonemura, Shinsuke Sadamitsu, (unknown), (unknown), (unknown), Hisashi Katahama	4
4	Effect of Oxide Precipitate Size on Slip Generation in Large Diameter Epitaxial Wafers 1998 ·Japanese Journal of Applied Physics ·(unknown), Koji Sueoka, Hisashi Katahama, (unknown), Shinsuke Sadamitsu	1
5	Intrinsic Gettering of Nickel and Copper for Advanced Low Temperature Device Processes 1998 ·MRS Proceedings ·(unknown), Nelly M. Reilly, Shinsuke Sadamitsu, (unknown), Masakazu Sano	1
6	Analysis of Local Lattice Strains Around Plate-Like Oxygen Precipitates in Czochralski-Silicon Wafers by Convergent-Beam Electron Diffraction 1997 ·Japanese Journal of Applied Physics ·Tetsuya Okuyama, Masaru Nakayama, Shinsuke Sadamitsu, (unknown), Yoshitsugu Tomokiyo	16
7	Gettering in Advanced Low Temperature Processes 1997 ·Diffusion and defect data, solid state data. Part B, Solid state phenomena/Solid state phenomena ·Shinsuke Sadamitsu, (unknown), (unknown), Neil J. Reilly, (unknown), Mizuka Sano, Hideki Tsuya	6
8	Gettering Characteristics of Heavy Metal Impurities in Silicon Wafers with Polysilicon Back Seal and Internal Gettering 1997 ·Japanese Journal of Applied Physics ·(unknown), Shinsuke Sadamitsu, (unknown), (unknown), Masakazu Sano	16
9	Growth Parameters Determining the Type of Grown-In Defects in Czockralski Silicon Crystals 1995 ·Materials science forum ·Masataka Hourai, (unknown), Takuji Nagashima, Hiroshi Fujiwara, (unknown), Shinsuke Sadamitsu, (unknown), T Shigematsu	26
10	A Model for the Formation of Oxidation-Induced Stacking Faults in Czochralski Silicon 1995 ·Japanese Journal of Applied Physics ·Shinsuke Sadamitsu, (unknown), Koji Sueoka, (unknown), Tatsuhiko Shigematsu	18
11	Observation of Ring‐OSF Nuclei in CZ‐Si Using Short‐Time Annealing and Infrared Light Scattering Tomography 1995 ·Journal of The Electrochemical Society ·(unknown), Shinsuke Sadamitsu, Masataka Hourai, Shigeo Sumita, Tatsuhiko Shigematsu	6
12	Generation of Oxidation-Induced Stacking Faults in Czochralski-Grown Silicon Crystals Exhibiting a Ring-like Distributed Stacking Fault Region 1995 ·Japanese Journal of Applied Physics ·(unknown), Shinsuke Sadamitsu, (unknown), Tatsuhiko Shigematsu	12
13	Dependence of the Grown-in Defect Distribution on Growth Rates in Czochralski Silicon 1993 ·Japanese Journal of Applied Physics ·Shinsuke Sadamitsu, (unknown), (unknown), Masataka Hourai, Shigeo Sumita, Tatsuhiko Shigematsu	103
14	Axial Microscopic Distribution of Grown-in Defects in Czochralski-Grown Silicon Crystals 1993 ·Japanese Journal of Applied Physics ·(unknown), Shinsuke Sadamitsu, Hiroki Murakami, Masataka Hourai, Shigeo Sumita, Tatsuhiko Shigematsu	33
15	Transmission Electron Microscopy Observation of Defects Induced by Fe Contamination on Si(100) Surface 1991 ·Japanese Journal of Applied Physics ·Shinsuke Sadamitsu, (unknown), Masataka Hourai, Shigeo Sumita, Nobukatsu Fujino	19
16	Degradation of Gate Oxide Integrity by Metal Impurities 1989 ·Japanese Journal of Applied Physics ·Kazuo Hiramoto, Masakazu Sano, Shinsuke Sadamitsu, Nobukatsu Fujino	32
17	TEM Observation of Defects Induced by Ni Contamination on a Si(100) Surface 1989 ·Japanese Journal of Applied Physics ·Shinsuke Sadamitsu, Masakazu Sano, Masataka Hourai, Shigeo Sumita, Nobukatsu Fujino, Toshio Shiraiwa	12
18	Dependence of Gettering Efficiency on Metal Impurities 1989 ·Japanese Journal of Applied Physics ·(unknown), Masakazu Sano, Shinsuke Sadamitsu, Shigeo Sumita, Nobukatsu Fujino, Toshio Shiraiwa	14
19	TEM Observation of Defects Induced by Cu Contamination on Si(100) Surface 1988 ·Japanese Journal of Applied Physics ·Shinsuke Sadamitsu, Shigeo Sumita, Nobukatsu Fujino, Toshio Shiraiwa	17
20	High voltage electron microscope study of defects in silicon 1983 ·Physica B+C ·Ryuichiro Oshima, Shinsuke Sadamitsu, Francisco Eiichi Fujita	6

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