A. Arranz
Impact in
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
- Mechanics of Materials top 5%
- Metal and Thin Film Mechanics
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 18
-
- Ion-surface interactions and analysis 18
- Co-authors
- C. PalacioGuillermo OrellanaÁ. Navarro TobarV. Pérez-DiesteDiego J. Dı́azEnrique MuñozJ. ÁvilaDavid García‐Fresnadillo
In The Last Decade
A. Arranz
60 papers receiving 767 citations
Peers
Comparison fields: 5 of 58
- Surfaces, Coatings and Films 114
- Mechanics of Materials 240
- Materials Chemistry 356
- Computational Mechanics 150
- Electrical and Electronic Engineering 414
Countries citing papers authored by A. Arranz
This map shows the geographic impact of A. Arranz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Arranz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Arranz more than expected).
Fields of papers citing papers by A. Arranz
This network shows the impact of papers produced by A. Arranz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Arranz. The network helps show where A. Arranz may publish in the future.
Co-authors
The 25 scholars most cited alongside A. Arranz, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2024 | 6 | |
| 2 | 2024 | 1 | |
| 3 | 2023 | 9 | |
| 4 | 2023 | 7 | |
| 5 | Una nueva concepción para la usura: Presupuestos y restitución | 2021 | 1 |
| 6 | 2013 | 3 | |
| 7 | 2013 | 2 | |
| 8 | 2012 | 1 | |
| 9 | 2008 | 9 | |
| 10 | 2008 | 2 | |
| 11 | 2008 | 9 | |
| 12 | 2008 | 60 | |
| 13 | 2006 | 16 | |
| 14 | 2006 | 37 | |
| 15 | 2005 | 20 | |
| 16 | 2005 | 18 | |
| 17 | 2002 | 17 | |
| 18 | 2002 | 7 | |
| 19 | 2000 | 24 | |
| 20 | 2000 | 9 |
About A. Arranz
A. Arranz is a scholar working on Surfaces, Coatings and Films, Computational Mechanics, Electrical and Electronic Engineering, Mechanics of Materials and Electrochemistry, having authored 60 papers that have together received 775 indexed citations. Recurring topics across this work include Semiconductor materials and devices (32 papers), Ion-surface interactions and analysis (18 papers), Electron and X-Ray Spectroscopy Techniques (18 papers), Metal and Thin Film Mechanics (14 papers), Semiconductor materials and interfaces (8 papers), Surface and Thin Film Phenomena (6 papers), Quantum Dots Synthesis And Properties (5 papers) and Chalcogenide Semiconductor Thin Films (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (114 citations), Mechanics of Materials (240 citations), Materials Chemistry (356 citations), Computational Mechanics (150 citations) and Electrical and Electronic Engineering (414 citations). A. Arranz has collaborated with scholars based in Spain, France and Chile. Frequent co-authors include C. Palacio, Guillermo Orellana, Á. Navarro Tobar, V. Pérez-Dieste, Diego J. Dı́az, Enrique Muñoz, J. Ávila, David García‐Fresnadillo, Juan López‐Gejo and Elías Muñoz. Their work appears in journals such as Surface Science, Thin Solid Films, Surface and Interface Analysis, The Journal of Physical Chemistry B and Applied Physics A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.