Immediate Impact
2 standout
Citing Papers
Stability, Reliability, and Robustness of GaN Power Devices: A Review
2023 Standout
Condition Monitoring for Device Reliability in Power Electronic Converters: A Review
2010 Standout
Works of N. Buard being referenced
Characterization of Single-Event Burnout in Power MOSFET Using Backside Laser Testing
2006
Author Peers
| Author | Last Decade | Papers | Cites | |||
|---|---|---|---|---|---|---|
| N. Buard | 317 | 74 | 51 | 21 | 339 | |
| Anthony M. Phan | 362 | 101 | 54 | 32 | 388 | |
| Alan D. Tipton | 359 | 120 | 38 | 10 | 373 | |
| W.G. Abdel-Kader | 286 | 52 | 53 | 21 | 317 | |
| D.L. Oberg | 290 | 65 | 49 | 17 | 372 | |
| K.B. Crawford | 265 | 90 | 31 | 24 | 304 | |
| B. Sagnes | 347 | 130 | 46 | 19 | 363 | |
| M. Muschitiello | 292 | 17 | 30 | 34 | 328 | |
| C. Carmichael | 323 | 172 | 18 | 21 | 359 | |
| Nathaniel A. Dodds | 314 | 68 | 70 | 32 | 339 | |
| D. Falguère | 292 | 53 | 79 | 27 | 363 |
All Works
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