W.G. Abdel-Kader

448 total citations
22 papers, 359 citations indexed

About

W.G. Abdel-Kader is a scholar working on Electrical and Electronic Engineering, Radiation and Hardware and Architecture. According to data from OpenAlex, W.G. Abdel-Kader has authored 22 papers receiving a total of 359 indexed citations (citations by other indexed papers that have themselves been cited), including 19 papers in Electrical and Electronic Engineering, 7 papers in Radiation and 5 papers in Hardware and Architecture. Recurrent topics in W.G. Abdel-Kader's work include Radiation Effects in Electronics (16 papers), Semiconductor materials and devices (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). W.G. Abdel-Kader is often cited by papers focused on Radiation Effects in Electronics (16 papers), Semiconductor materials and devices (9 papers) and Integrated Circuits and Semiconductor Failure Analysis (7 papers). W.G. Abdel-Kader collaborates with scholars based in United States and Netherlands. W.G. Abdel-Kader's co-authors include P.J. McNulty, G. Farrell, Robert A. Reed, David R. Roth, W.J. Stapor, W. A. Kolasinski, Leif Scheick, E. G. Stassinopoulos, E.G. Mullen and R. Harboe-Sørensen and has published in prestigious journals such as Journal of Applied Physics, Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms and IEEE Transactions on Nuclear Science.

In The Last Decade

W.G. Abdel-Kader

21 papers receiving 347 citations

Peers

W.G. Abdel-Kader

EEE

RADIA

PRM

NHEP

J.B. Langworthy United States

D.L. Oberg United States

Matteo Cecchetto Switzerland

O. Brandt Switzerland

S. S. Semikh Russia

M. Martinez France

D. Pantano Italy

H. Shindou Japan

C. Zamantzas Switzerland

K. Yue China

J.B. Langworthy United States

W.G. Abdel-Kader

275 ×0.9

EEE

37 ×0.6

RADIA

33 ×0.6

PRM

39 ×0.7

49 ×1.1

NHEP

Citations per year, relative to W.G. Abdel-Kader W.G. Abdel-Kader (= 1×) peers J.B. Langworthy

Countries citing papers authored by W.G. Abdel-Kader

Since Specialization

Citations

This map shows the geographic impact of W.G. Abdel-Kader's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by W.G. Abdel-Kader with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites W.G. Abdel-Kader more than expected).

Fields of papers citing papers by W.G. Abdel-Kader

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by W.G. Abdel-Kader. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by W.G. Abdel-Kader. The network helps show where W.G. Abdel-Kader may publish in the future.

Co-authorship network of co-authors of W.G. Abdel-Kader

This figure shows the co-authorship network connecting the top 25 collaborators of W.G. Abdel-Kader. A scholar is included among the top collaborators of W.G. Abdel-Kader based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with W.G. Abdel-Kader. W.G. Abdel-Kader is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

McNulty, P.J., J.D. Kinnison, R. H. Maurer, et al.. (2004). Energy-deposition events measured by the CRRES PHA experiment. IEEE Transactions on Nuclear Science. 51(6). 3381–3387. 2 indexed citations

Kinnison, J.D., R. H. Maurer, David R. Roth, P.J. McNulty, & W.G. Abdel-Kader. (2003). Neutron-induced pion production in silicon-based circuits. IEEE Transactions on Nuclear Science. 50(6). 2251–2255. 6 indexed citations

McNulty, P.J., et al.. (2002). Single and multiple proton-induced NIEL events in silicon. 526–531.

McNulty, P.J., et al.. (2002). Charge removal from FGMOS floating gates. IEEE Transactions on Nuclear Science. 49(6). 3016–3021. 18 indexed citations

Reed, Robert A., P.J. McNulty, & W.G. Abdel-Kader. (1994). Implications of angle of incidence in SEU testing of modern circuits. IEEE Transactions on Nuclear Science. 41(6). 2049–2054. 31 indexed citations

McNulty, P.J., W.G. Abdel-Kader, & G. Farrell. (1994). Proton induced spallation reactions. Radiation Physics and Chemistry. 43(1-2). 139–149. 37 indexed citations

Roth, David R., et al.. (1993). Monitoring SEU parameters at reduced bias (CMOS SRAM). IEEE Transactions on Nuclear Science. 40(6). 1721–1724. 21 indexed citations

McNulty, P.J., et al.. (1993). Simple model for proton-induced latch-up. IEEE Transactions on Nuclear Science. 40(6). 1947–1951. 21 indexed citations

McNulty, P.J., et al.. (1991). Comparison of the charge collecting properties of junctions and the SEU [single event upset] response of microelectronic circuits. Nuclear Tracks and Radiation Measurements. 19. 929–938. 1 indexed citations

10.

McNulty, P.J., et al.. (1991). Test of SEU algorithms against preliminary CRRES satellite data. IEEE Transactions on Nuclear Science. 38(6). 1642–1646. 24 indexed citations

11.

Stapor, W.J., E.L. Petersen, J.B. Langworthy, et al.. (1991). Proton and heavy ion upsets in GaAs MESFET devices. IEEE Transactions on Nuclear Science. 38(6). 1460–1466. 26 indexed citations

12.

McNulty, P.J., et al.. (1991). Modeling charge collection and single event upsets in microelectronics. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 61(1). 52–60. 27 indexed citations

13.

Normand, E., et al.. (1991). Quantitative comparison of single event upsets induced by protons and neutrons (RAM devices). IEEE Transactions on Nuclear Science. 38(6). 1457–1462. 8 indexed citations

14.

McNulty, P.J., et al.. (1991). Comparison of the charge collecting properties of junctions and the SEU response of microelectronic circuits. International Journal of Radiation Applications and Instrumentation Part D Nuclear Tracks and Radiation Measurements. 19(1-4). 929–938. 17 indexed citations

15.

Abdel-Kader, W.G., et al.. (1991). Charge collection in partially depleted GaAs test structures induced by alphas, heavy ions, and protons. Journal of Applied Physics. 69(1). 475–480. 1 indexed citations

16.

McNulty, P.J., et al.. (1989). Soft fails in microelectronic circuits due to proton-induced nuclear reactions in material surrounding the SEU-sensitive volume. Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms. 40-41. 1300–1305. 9 indexed citations

17.

McNulty, P.J., et al.. (1987). Effectiveness of CMOS Charge Reflection Barriers in Space Radiation Environments. IEEE Transactions on Nuclear Science. 34(6). 1796–1799. 3 indexed citations

18.

McNulty, P.J., et al.. (1986). Comparison of Soft Errors Induced by Heavy Ions and Protons. IEEE Transactions on Nuclear Science. 33(6). 1571–1576. 31 indexed citations

19.

McNulty, P.J., et al.. (1985). Methods for Calculating SEU Rates for Bipolar and NMOS Circuits. IEEE Transactions on Nuclear Science. 32(6). 4180–4184. 19 indexed citations

20.

Farrell, G., P.J. McNulty, & W.G. Abdel-Kader. (1984). Microdosimetric Analysis of Proton Induced Reactions in Silicon and Gallium Arsenide. IEEE Transactions on Nuclear Science. 31(6). 1073–1077. 20 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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