Countries where authors publish in Microscopy Microanalysis Microstructures
Since Specialization
Citations
This map shows the geographic impact of research published in Microscopy Microanalysis Microstructures. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by papers published in Microscopy Microanalysis Microstructures with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Microscopy Microanalysis Microstructures more than expected).
Fields of papers published in Microscopy Microanalysis Microstructures
This network shows the impact of papers published in Microscopy Microanalysis Microstructures. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers published in Microscopy Microanalysis Microstructures.
About Microscopy Microanalysis Microstructures
The 346 papers published in Microscopy Microanalysis Microstructures in the last decades have received a total of 4.3k indexed citations . Papers published in Microscopy Microanalysis Microstructures usually cover Structural Biology (37 papers), Surfaces, Coatings and Films (107 papers), Radiation (42 papers), Atomic and Molecular Physics, and Optics (92 papers) and Metals and Alloys (7 papers) specifically the topics of Electron and X-Ray Spectroscopy Techniques (106 papers), Ion-surface interactions and analysis (40 papers), Advanced Electron Microscopy Techniques and Applications (37 papers), Force Microscopy Techniques and Applications (34 papers), X-ray Spectroscopy and Fluorescence Analysis (30 papers), Advanced Materials Characterization Techniques (28 papers), Semiconductor materials and devices (27 papers) and Surface and Thin Film Phenomena (22 papers). The most active scholars publishing in Microscopy Microanalysis Microstructures are B. Schueler, Éric Van Cappellen, R. Coratger, F. Ajustron, Dror Sarid, Martin Hÿtch, Ondrej L. Krivanek, Herbert Schmid, J. Bruley and Ferdinand Hofer.
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