Zhonghe Ren
- Industrial and Manufacturing Engineering top 2%
- Computer Vision and Pattern Recognition top 10%
- Mechanical Engineering
- Electrical and Electronic Engineering
- Computational Mechanics
- Topics
- Additive Manufacturing Materials and Processes (2 papers)Industrial Vision Systems and Defect Detection (2 papers)Surface Roughness and Optical Measurements (2 papers)
- Cited by
- Industrial and Manufacturing EngineeringComputer Vision and Pattern RecognitionMedia Technology
- Journals
- Optics ExpressOre Geology ReviewsInternational Journal of Precision Engineering and Manufacturing-Green Technology
- Partner nations
- ChinaIrelandUnited Kingdom
In The Last Decade
Zhonghe Ren
6 papers receiving 383 citations
Hit Papers
Peers
Comparison fields: 5 of 72
- Industrial and Manufacturing Engineering 249
- Computer Vision and Pattern Recognition 134
- Mechanical Engineering 97
- Electrical and Electronic Engineering 60
- Computational Mechanics 55
Countries citing papers authored by Zhonghe Ren
This map shows the geographic impact of Zhonghe Ren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Zhonghe Ren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Zhonghe Ren more than expected).
Fields of papers citing papers by Zhonghe Ren
This network shows the impact of papers produced by Zhonghe Ren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Zhonghe Ren. The network helps show where Zhonghe Ren may publish in the future.
Co-authorship network of co-authors of Zhonghe Ren
This figure shows the co-authorship network connecting the top 25 collaborators of Zhonghe Ren. A scholar is included among the top collaborators of Zhonghe Ren based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Zhonghe Ren. Zhonghe Ren is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 5 | |
| 2 | 5 | |
| 3 | 7 | |
| 4 | State of the Art in Defect Detection Based on Machine Visionbreakdown → | 377 |
| 5 | 3 | |
| 6 | 1 |
About Zhonghe Ren
Zhonghe Ren is a scholar working on Industrial and Manufacturing Engineering, Human-Computer Interaction and Geochemistry and Petrology, having authored 6 papers that have together received 398 indexed citations. Recurring topics across this work include Additive Manufacturing Materials and Processes (2 papers), Industrial Vision Systems and Defect Detection (2 papers) and Surface Roughness and Optical Measurements (2 papers). The work is most often cited by research in Industrial and Manufacturing Engineering (249 citations), Computer Vision and Pattern Recognition (134 citations) and Media Technology (35 citations). Zhonghe Ren has collaborated with scholars based in China, Ireland and United Kingdom. Frequent co-authors include Fengzhou Fang, You Wu, Ning Yan, Rui Niu, Zhihui Zhang, Dawei Lv, Yujia Wang, A.J. van Loon, James C. Hower and Yi Yang. Their work appears in journals such as Optics Express, Ore Geology Reviews and International Journal of Precision Engineering and Manufacturing-Green Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.