Yusuke Nakano

722 citations
98 papers · 509 · h-index 12

Impact in

Papers in

    • Electrical Fault Detection and Protection 14
    • Electrostatic Discharge in Electronics 12
    • Plasma Diagnostics and Applications 11
    • High voltage insulation and dielectric phenomena 32
    • Diamond and Carbon-based Materials Research 12

Yusuke Nakano

84 papers receiving 494 citations

Peers

Yusuke Nakano
Comparison fields: 5 of 82
  • Radiological and Ultrasound Technology 37
  • Atomic and Molecular Physics, and Optics 130
  • Materials Chemistry 186
  • Electrical and Electronic Engineering 223
  • Safety, Risk, Reliability and Quality 28
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Citations per year

Countries citing papers authored by Yusuke Nakano

Since Specialization
Citations

This map shows the geographic impact of Yusuke Nakano's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yusuke Nakano with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yusuke Nakano more than expected).

Fields of papers citing papers by Yusuke Nakano

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Yusuke Nakano. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yusuke Nakano. The network helps show where Yusuke Nakano may publish in the future.

Co-authors

The 25 scholars most cited alongside Yusuke Nakano, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Yusuke Nakano Line = papers co-authored together Yusuke Nakano links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 98 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201037
2 200726
3 201026
4 200822
5 201422
6 199121
7 201419
8 202015
9 201313
10 200612
11 201511
12 201411
13 202010
14 201610
15 201610
16 20229
17 20189
18 20169
19 20159
20 20198

About Yusuke Nakano

Yusuke Nakano is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Mechanics of Materials and Mechanical Engineering, having authored 98 papers that have together received 509 indexed citations. Recurring topics across this work include Vacuum and Plasma Arcs (43 papers), High voltage insulation and dielectric phenomena (32 papers), Electrical Fault Detection and Protection (14 papers), Diamond and Carbon-based Materials Research (12 papers), Electrostatic Discharge in Electronics (12 papers), Plasma Diagnostics and Applications (11 papers), Plasma Applications and Diagnostics (8 papers) and Metal and Thin Film Mechanics (7 papers). The work is most often cited by research in Radiological and Ultrasound Technology (37 citations), Atomic and Molecular Physics, and Optics (130 citations), Materials Chemistry (186 citations), Electrical and Electronic Engineering (223 citations) and Safety, Risk, Reliability and Quality (28 citations). Yusuke Nakano has collaborated with scholars based in Japan, Indonesia and Germany. Frequent co-authors include Yasunori Tanaka, H. Kojima, Naoki Hayakawa, Tatsuo Ishijima, Mutsuo Inoue, Kenji Tsuchiya, Fumihiko Tanaka, Daisuke Hamanaka, H. Kofuji and Hitoshi Okubo. Their work appears in journals such as IEEE Transactions on Dielectrics and Electrical Insulation, Journal of Physics D Applied Physics, Plasma Chemistry and Plasma Processing, Journal of Photopolymer Science and Technology and IEEE Transactions on Power Delivery.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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