Young-Sik Ghim

796 total citations
55 papers, 591 citations indexed

About

Young-Sik Ghim is a scholar working on Computer Vision and Pattern Recognition, Mechanical Engineering and Computational Mechanics. According to data from OpenAlex, Young-Sik Ghim has authored 55 papers receiving a total of 591 indexed citations (citations by other indexed papers that have themselves been cited), including 42 papers in Computer Vision and Pattern Recognition, 29 papers in Mechanical Engineering and 28 papers in Computational Mechanics. Recurrent topics in Young-Sik Ghim's work include Optical measurement and interference techniques (42 papers), Advanced Measurement and Metrology Techniques (28 papers) and Surface Roughness and Optical Measurements (24 papers). Young-Sik Ghim is often cited by papers focused on Optical measurement and interference techniques (42 papers), Advanced Measurement and Metrology Techniques (28 papers) and Surface Roughness and Optical Measurements (24 papers). Young-Sik Ghim collaborates with scholars based in South Korea, United States and Yemen. Young-Sik Ghim's co-authors include Hyug-Gyo Rhee, Seung‐Woo Kim, Angela Davies, Yun-Woo Lee, Ho‐Soon Yang, Ki-Nam Joo, Yue Zhou, Hyukmo Kang, Joohyung Lee and Ho-Soon Yang and has published in prestigious journals such as Applied Physics Letters, Scientific Reports and IEEE Transactions on Industrial Electronics.

In The Last Decade

Young-Sik Ghim

50 papers receiving 548 citations

Peers

Young-Sik Ghim

CVPR

EEE

Heejoo Choi United States

Thomas Dresel Germany

Xavier Colonna de Lega United States

Chunyu Zhao United States

Qun Yuan China

Ki-Nam Joo South Korea

Antonı́n Mikš Czechia

Guipeng Tie China

Shanyong Chen China

Rajpal S. Sirohi India

Heejoo Choi United States

Young-Sik Ghim

249 ×0.7

CVPR

264 ×1.1

320 ×1.4

179 ×0.8

187 ×1.4

EEE

Citations per year, relative to Young-Sik Ghim Young-Sik Ghim (= 1×) peers Heejoo Choi

Countries citing papers authored by Young-Sik Ghim

Since Specialization

Citations

This map shows the geographic impact of Young-Sik Ghim's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Young-Sik Ghim with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Young-Sik Ghim more than expected).

Fields of papers citing papers by Young-Sik Ghim

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Young-Sik Ghim. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Young-Sik Ghim. The network helps show where Young-Sik Ghim may publish in the future.

Co-authorship network of co-authors of Young-Sik Ghim

This figure shows the co-authorship network connecting the top 25 collaborators of Young-Sik Ghim. A scholar is included among the top collaborators of Young-Sik Ghim based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Young-Sik Ghim. Young-Sik Ghim is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Park, In Kyu, et al.. (2025). Deep-learning based fringe-print-through error and noise removal for dynamic phase-shifting interferometry. Optics & Laser Technology. 191. 113313–113313.

Joo, Ki-Nam, et al.. (2025). Deep learning-based single-shot lateral shearing interferometry. Optics and Lasers in Engineering. 191. 109010–109010.

Rhee, Hyug-Gyo, et al.. (2024). Wavefront error peak removal by carrier phase reconstruction technique for slope measurement type sensors. Optics and Lasers in Engineering. 181. 108352–108352. 4 indexed citations

Ghim, Young-Sik, et al.. (2024). Deep learning-based phase measuring deflectometry for one-shot measurement and inspection of specular free-form surfaces. 2–2. 1 indexed citations

Ghim, Young-Sik, et al.. (2022). Real-time 3D measurement of freeform surfaces by dynamic deflectometry based on diagonal spatial carrier-frequency pattern projection. Measurement. 200. 111684–111684. 13 indexed citations

Rhee, Hyug-Gyo, et al.. (2021). Design and Lithographic Fabrication of Elliptical Zone Plate Array with High Fill Factor. Current Optics and Photonics. 5(1). 8–15. 2 indexed citations

Ghim, Young-Sik, et al.. (2019). Single-shot deflectometry for dynamic 3D surface profile measurement by modified spatial-carrier frequency phase-shifting method. Scientific Reports. 9(1). 3157–3157. 29 indexed citations

Ghim, Young-Sik, Hyug-Gyo Rhee, & Angela Davies. (2017). Simultaneous measurements of top surface and its underlying film surfaces in multilayer film structure. Scientific Reports. 7(1). 11843–11843. 23 indexed citations

Rhee, Hyug-Gyo, et al.. (2017). Direct Laser Fabrication Method for a Binary Diffractive Optical Element. 11(2). 59–66.

10.

Rhee, Hyug-Gyo, et al.. (2017). Dual-line fabrication method in direct laser lithography to reduce the manufacturing time of diffractive optics elements. Optics Express. 25(3). 1636–1636. 4 indexed citations

11.

Rhee, Hyug-Gyo, et al.. (2016). Performance Evaluation of MTF Peak Detection Methods by a Statistical Analysis for Phone Camera Modules. Journal of the Optical Society of Korea. 20(1). 150–155. 1 indexed citations

12.

Nam, Ho‐Seok, et al.. (2015). Modeling of edge tool influence functions for computer controlled optical surfacing process. The International Journal of Advanced Manufacturing Technology. 83(5-8). 911–917. 17 indexed citations

13.

Rhee, Hyug-Gyo, et al.. (2015). Field-Curvature Correction According to the Curvature of a CMOS Image-Sensor Using Air-Gap Optimization. Journal of the Optical Society of Korea. 19(6). 658–664. 3 indexed citations

14.

Ghim, Young-Sik & Angela Davies. (2012). Complete fringe order determination in scanning white-light interferometry using a Fourier-based technique. Applied Optics. 51(12). 1922–1922. 36 indexed citations

15.

Zhou, Yue, Young-Sik Ghim, & Angela Davies. (2012). Self calibration for slope-dependent errors in optical profilometry by using the random ball test. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8493. 84930H–84930H. 3 indexed citations

16.

Ghim, Young-Sik, et al.. (2010). Reflectometry-based wavelength scanning interferometry for thickness measurements of very thin wafers. Optics Express. 18(7). 6522–6522. 21 indexed citations

17.

Ghim, Young-Sik & Seung‐Woo Kim. (2009). Spectrally resolved white-light interferometry for 3D inspection of a thin-film layer structure. Applied Optics. 48(4). 799–799. 36 indexed citations

18.

Ghim, Young-Sik, et al.. (2009). Micro-optic reflection and transmission interferometer for complete microlens characterization. Measurement Science and Technology. 20(2). 25901–25901. 12 indexed citations

19.

Ghim, Young-Sik, et al.. (2007). Dispersive white light interferometry for 3D inspection of thin film layers of flat panel displays. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6616. 66160T–66160T. 1 indexed citations

20.

Ghim, Young-Sik & Seung‐Woo Kim. (2007). Fast, precise, tomographic measurements of thin films. Applied Physics Letters. 91(9). 43 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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