Xavier Colonna de Lega

1.0k total citations
35 papers, 723 citations indexed

About

Xavier Colonna de Lega is a scholar working on Computer Vision and Pattern Recognition, Biomedical Engineering and Mechanical Engineering. According to data from OpenAlex, Xavier Colonna de Lega has authored 35 papers receiving a total of 723 indexed citations (citations by other indexed papers that have themselves been cited), including 28 papers in Computer Vision and Pattern Recognition, 16 papers in Biomedical Engineering and 14 papers in Mechanical Engineering. Recurrent topics in Xavier Colonna de Lega's work include Optical measurement and interference techniques (28 papers), Advanced Measurement and Metrology Techniques (14 papers) and Surface Roughness and Optical Measurements (13 papers). Xavier Colonna de Lega is often cited by papers focused on Optical measurement and interference techniques (28 papers), Advanced Measurement and Metrology Techniques (14 papers) and Surface Roughness and Optical Measurements (13 papers). Xavier Colonna de Lega collaborates with scholars based in United States, Switzerland and United Kingdom. Xavier Colonna de Lega's co-authors include Peter J. de Groot, Pierre Jacquot, D. A. Grigg, Richard Leach, Rong Su, Jan Liesener, L. Deck, John T. Roth, Jeremy Coupland and Mathias Lehmann and has published in prestigious journals such as Optics Letters, Optics Express and Journal of the Optical Society of America A.

In The Last Decade

Xavier Colonna de Lega

34 papers receiving 661 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
Xavier Colonna de Lega United States 14 517 335 295 283 173 35 723
Thomas Dresel Germany 9 396 0.8× 218 0.7× 228 0.8× 247 0.9× 134 0.8× 29 601
Stanley S. C. Chim United States 4 305 0.6× 195 0.6× 159 0.5× 187 0.7× 103 0.6× 7 445
Young-Sik Ghim South Korea 14 372 0.7× 237 0.7× 219 0.7× 244 0.9× 122 0.7× 55 591
Heejoo Choi United States 15 249 0.5× 320 1.0× 179 0.6× 264 0.9× 174 1.0× 85 644
Ki-Nam Joo South Korea 15 212 0.4× 161 0.5× 111 0.4× 313 1.1× 243 1.4× 61 604
Chunyu Zhao United States 13 228 0.4× 168 0.5× 99 0.3× 197 0.7× 244 1.4× 47 490
Guipeng Tie China 14 162 0.3× 448 1.3× 247 0.8× 334 1.2× 73 0.4× 80 654
Shanyong Chen China 16 594 1.1× 302 0.9× 223 0.8× 503 1.8× 206 1.2× 93 844
R. Burow Germany 6 602 1.2× 104 0.3× 239 0.8× 374 1.3× 205 1.2× 12 712
K.-E. Elßner Germany 6 566 1.1× 100 0.3× 226 0.8× 340 1.2× 192 1.1× 10 666

Countries citing papers authored by Xavier Colonna de Lega

Since Specialization
Citations

This map shows the geographic impact of Xavier Colonna de Lega's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xavier Colonna de Lega with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xavier Colonna de Lega more than expected).

Fields of papers citing papers by Xavier Colonna de Lega

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Xavier Colonna de Lega. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xavier Colonna de Lega. The network helps show where Xavier Colonna de Lega may publish in the future.

Co-authorship network of co-authors of Xavier Colonna de Lega

This figure shows the co-authorship network connecting the top 25 collaborators of Xavier Colonna de Lega. A scholar is included among the top collaborators of Xavier Colonna de Lega based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Xavier Colonna de Lega. Xavier Colonna de Lega is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Groot, Peter J. de, et al.. (2024). Linear systems characterization of the topographical spatial resolution of optical instruments. Applied Optics. 63(15). 4201–4201. 2 indexed citations
2.
Thompson, Adam, et al.. (2017). True-color 3D surface metrology for additive manufacturing using interference microscopy. Repository@Nottingham (University of Nottingham). 6 indexed citations
3.
Lega, Xavier Colonna de, et al.. (2014). Measuring High-Slope and Super-Smooth Optics with High-Dynamic-Range Coherence Scanning Interferometry. OW1B.3–OW1B.3. 21 indexed citations
4.
Lega, Xavier Colonna de, et al.. (2014). Interferometric microscope with true color imaging. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 9203. 92030S–92030S. 3 indexed citations
5.
Lega, Xavier Colonna de & Peter J. de Groot. (2012). Lateral resolution and instrument transfer function as criteria for selecting surface metrology instruments. OTu1D.4–OTu1D.4. 23 indexed citations
6.
Lega, Xavier Colonna de, et al.. (2009). Multi-purpose optical profiler for characterization of materials, film stacks, and for absolute topography measurement. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7272. 72723Z–72723Z. 1 indexed citations
7.
Groot, Peter J. de, et al.. (2008). Metrology of optically-unresolved features using interferometric surface profiling and RCWA modeling. Optics Express. 16(6). 3970–3970. 26 indexed citations
8.
Lega, Xavier Colonna de & Peter J. de Groot. (2008). Characterization of materials and film stacks for accurate surface topography measurement using a white-light optical profiler. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 6995. 69950P–69950P. 15 indexed citations
9.
Groot, Peter J. de & Xavier Colonna de Lega. (2008). Transparent film profiling and analysis by interference microscopy. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 38 indexed citations
10.
Groot, Peter J. de & Xavier Colonna de Lega. (2007). Angle-resolved three-dimensional analysis of surface films by coherence scanning interferometry. Optics Letters. 32(12). 1638–1638. 34 indexed citations
11.
Grigg, D. A., et al.. (2004). Static and dynamic characterization of MEMS and MOEMS devices using optical interference microscopy. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 5455. 429–429. 25 indexed citations
12.
Groot, Peter J. de & Xavier Colonna de Lega. (2004). Signal modeling for low-coherence height-scanning interference microscopy. Applied Optics. 43(25). 4821–4821. 115 indexed citations
13.
Groot, Peter J. de, et al.. (2002). Determination of fringe order in white-light interference microscopy. Applied Optics. 41(22). 4571–4571. 153 indexed citations
14.
Groot, Peter J. de, Xavier Colonna de Lega, & D. A. Grigg. (2002). Step height measurements using a combination of a laser displacement gage and a broadband interferometric surface profiler. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 4778. 127–127. 10 indexed citations
15.
Groot, Peter J. de, et al.. (2002). Optical interferometry for measurement of the geometric dimensions of industrial parts. Applied Optics. 41(19). 3853–3853. 48 indexed citations
16.
Groot, Peter J. de, L. Deck, & Xavier Colonna de Lega. (1998). Adjustable coherence depth in a geometrically desensitized interferometer. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3479. 14–14. 3 indexed citations
17.
Lega, Xavier Colonna de, et al.. (1998). <title>Characterization of a geometrically desensitized interferometer for flatness testing</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 3520. 284–292. 3 indexed citations
18.
19.
Jacquot, Pierre, et al.. (1994). <title>Common-path holographic interferometer for flatness testing</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 2248. 125–135.
20.
Garnier, B. J. & Xavier Colonna de Lega. (1992). Low-vision aid using a high-minus intraocular lens. Applied Optics. 31(19). 3632–3632. 1 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

Explore authors with similar magnitude of impact

Breakdown of academic impact, for papers by Thomas Dresel Breakdown of academic impact, for papers by Stanley S. C. Chim Breakdown of academic impact, for papers by Young-Sik Ghim Breakdown of academic impact, for papers by Heejoo Choi Breakdown of academic impact, for papers by Ki-Nam Joo Breakdown of academic impact, for papers by Chunyu Zhao Breakdown of academic impact, for papers by Guipeng Tie Breakdown of academic impact, for papers by Shanyong Chen Breakdown of academic impact, for papers by R. Burow Breakdown of academic impact, for papers by K.-E. Elßner
Rankless by CCL
2026