Yicheng Wang
- Electrical and Electronic Engineering top 10%
- Mechanics of Materials top 10%
- Atomic and Molecular Physics, and Optics
- Materials Chemistry
- Radiology, Nuclear Medicine and Imaging
- Co-authors
- James K. OlthoffMark A. SobolewskiA. N. GoyetteR. J. Van BruntL. G. ChristophorouB.C. WaltripZe LiuJon R. Pratt
- Topics
- Plasma Diagnostics and Applications (9 papers)Advanced Electrical Measurement Techniques (7 papers)Sensor Technology and Measurement Systems (6 papers)
- Cited by
- Mechanics of MaterialsElectrical and Electronic EngineeringAtomic and Molecular Physics, and Optics
- Partner nations
- United StatesChinaCanada
In The Last Decade
Yicheng Wang
36 papers receiving 481 citations
Peers
Comparison fields: 5 of 53
- Electrical and Electronic Engineering 383
- Mechanics of Materials 189
- Atomic and Molecular Physics, and Optics 98
- Materials Chemistry 80
- Radiology, Nuclear Medicine and Imaging 58
Countries citing papers authored by Yicheng Wang
This map shows the geographic impact of Yicheng Wang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yicheng Wang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yicheng Wang more than expected).
Fields of papers citing papers by Yicheng Wang
This network shows the impact of papers produced by Yicheng Wang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yicheng Wang. The network helps show where Yicheng Wang may publish in the future.
Co-authorship network of co-authors of Yicheng Wang
This figure shows the co-authorship network connecting the top 25 collaborators of Yicheng Wang. A scholar is included among the top collaborators of Yicheng Wang based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yicheng Wang. Yicheng Wang is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 1 | |
| 3 | 4 | |
| 4 | 1 | |
| 5 | 2 | |
| 6 | 2 | |
| 7 | 6 | |
| 8 | 1 | |
| 9 | 28 | |
| 10 | 2 | |
| 11 | 1 | |
| 12 | 7 | |
| 13 | 13 | |
| 14 | 26 | |
| 15 | 3 | |
| 16 | 57 | |
| 17 | 21 | |
| 18 | 64 | |
| 19 | 93 | |
| 20 | 44 |
About Yicheng Wang
Yicheng Wang is a scholar working on Statistics, Probability and Uncertainty, Electrical and Electronic Engineering and Spectroscopy, having authored 39 papers that have together received 497 indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (9 papers), Advanced Electrical Measurement Techniques (7 papers) and Sensor Technology and Measurement Systems (6 papers). The work is most often cited by research in Mechanics of Materials (189 citations), Electrical and Electronic Engineering (383 citations) and Atomic and Molecular Physics, and Optics (98 citations). Yicheng Wang has collaborated with scholars based in United States, China and Canada. Frequent co-authors include James K. Olthoff, Mark A. Sobolewski, A. N. Goyette, R. J. Van Brunt, L. G. Christophorou, B.C. Waltrip, Ze Liu, Jon R. Pratt, Xi Li and Neil M. Zimmerman. Their work appears in journals such as The Journal of Chemical Physics, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.