Mark A. Sobolewski
- Electrical and Electronic Engineering top 5%
- Mechanics of Materials top 2%
- Materials Chemistry
- Atomic and Molecular Physics, and Optics top 10%
- Radiology, Nuclear Medicine and Imaging
- Co-authors
- Yicheng WangC. R. HelmsKristen L. SteffensJames K. OlthoffJung‐Hyung KimA. N. GoyetteB. FelkerJ.G. Langan
- Topics
- Plasma Diagnostics and Applications (40 papers)Semiconductor materials and devices (17 papers)Metal and Thin Film Mechanics (15 papers)
- Partner nations
- United StatesSerbiaPoland
In The Last Decade
Mark A. Sobolewski
49 papers receiving 993 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 967
- Mechanics of Materials 458
- Materials Chemistry 216
- Atomic and Molecular Physics, and Optics 194
- Radiology, Nuclear Medicine and Imaging 111
Countries citing papers authored by Mark A. Sobolewski
This map shows the geographic impact of Mark A. Sobolewski's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Mark A. Sobolewski with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Mark A. Sobolewski more than expected).
Fields of papers citing papers by Mark A. Sobolewski
This network shows the impact of papers produced by Mark A. Sobolewski. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Mark A. Sobolewski. The network helps show where Mark A. Sobolewski may publish in the future.
Co-authorship network of co-authors of Mark A. Sobolewski
This figure shows the co-authorship network connecting the top 25 collaborators of Mark A. Sobolewski. A scholar is included among the top collaborators of Mark A. Sobolewski based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Mark A. Sobolewski. Mark A. Sobolewski is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 2 | |
| 2 | 2 | |
| 3 | 1 | |
| 4 | 10 | |
| 5 | 6 | |
| 6 | 6 | |
| 7 | 14 | |
| 8 | 23 | |
| 9 | 17 | |
| 10 | 30 | |
| 11 | 75 | |
| 12 | 25 | |
| 13 | 2 | |
| 14 | 9 | |
| 15 | Mass Spectrometric and Optical Emission Diagnostics for RF Plasma Reactors | 1 |
| 16 | 22 | |
| 17 | 48 | |
| 18 | 22 | |
| 19 | 6 | |
| 20 | 10 |
About Mark A. Sobolewski
Mark A. Sobolewski is a scholar working on Mechanics of Materials, Electrical and Electronic Engineering and Surfaces, Coatings and Films, having authored 49 papers that have together received 1.0k indexed citations. Recurring topics across this work include Plasma Diagnostics and Applications (40 papers), Semiconductor materials and devices (17 papers) and Metal and Thin Film Mechanics (15 papers). The work is most often cited by research in Mechanics of Materials (458 citations), Electrical and Electronic Engineering (967 citations) and Surfaces, Coatings and Films (44 citations). Mark A. Sobolewski has collaborated with scholars based in United States, Serbia and Poland. Frequent co-authors include Yicheng Wang, C. R. Helms, Kristen L. Steffens, James K. Olthoff, Jung‐Hyung Kim, A. N. Goyette, B. Felker, J.G. Langan, R. Browning and David L. Lahr. Their work appears in journals such as Physical review. B, Condensed matter, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.