Yasuhiro Fukuda
About
In The Last Decade
Yasuhiro Fukuda
93 papers receiving 1.6k citations
Peers
Comparison fields: 5 of 124
- Parasitology 351
- Molecular Biology 339
- Biomedical Engineering 278
- Materials Chemistry 254
- Building and Construction 237
Countries citing papers authored by Yasuhiro Fukuda
This map shows the geographic impact of Yasuhiro Fukuda's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Yasuhiro Fukuda with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Yasuhiro Fukuda more than expected).
Fields of papers citing papers by Yasuhiro Fukuda
This network shows the impact of papers produced by Yasuhiro Fukuda. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Yasuhiro Fukuda. The network helps show where Yasuhiro Fukuda may publish in the future.
Co-authorship network of co-authors of Yasuhiro Fukuda
This figure shows the co-authorship network connecting the top 25 collaborators of Yasuhiro Fukuda. A scholar is included among the top collaborators of Yasuhiro Fukuda based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Yasuhiro Fukuda. Yasuhiro Fukuda is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 0 | |
| 2 | 0 | |
| 3 | 0 | |
| 4 | 0 | |
| 5 | 6 | |
| 6 | 4 | |
| 7 | 0 | |
| 8 | 7 | |
| 9 | 14 | |
| 10 | 1 | |
| 11 | 36 | |
| 12 | 25 | |
| 13 | 49 | |
| 14 | 0 | |
| 15 | 27 | |
| 16 | ESD parameter extraction by TLP measurement | 3 |
| 17 | 14 | |
| 18 | 1 | |
| 19 | ESD evaluation by TLP method on advanced semiconductor devices | 1 |
| 20 | Improvement of "Soft Breakdown" Leakage of off-State nMOSFETs Induced by HBM ESD Events Using Drain Engineering for LDD Structure (Special Section on Reliability) | 1 |
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.