Xinxin Tian

504 citations
45 papers · 345 indexed · h-index 11
Topics
Electromagnetic Compatibility and Measurements (28 papers)Electromagnetic Compatibility and Noise Suppression (23 papers)Microwave and Dielectric Measurement Techniques (17 papers)

In The Last Decade

Xinxin Tian

39 papers receiving 339 citations

Peers

Xinxin Tian
Comparison fields: 5 of 32
  • Electrical and Electronic Engineering 326
  • Aerospace Engineering 84
  • Biomedical Engineering 48
  • Mechanical Engineering 39
  • Ocean Engineering 13
Replace Yanbin Yang with:
Yanbin Yang China
Ad C. F. Reniers Netherlands
Dong‐Ho Lee South Korea
Amin Shameli United States
Ralf Reuter Germany
Duo‐Long Wu China
M. Nieves Ruiz Spain
Reza Molavi Canada
Sam Connor United States
M. Megahed United States
Xinxin Tian relative to Yanbin Yang China Yanbin Yang's profile →
Citations per field
00.5×
Yanbin Yang · 1×
Citations per year

Countries citing papers authored by Xinxin Tian

Since Specialization
Citations

This map shows the geographic impact of Xinxin Tian's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Xinxin Tian with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Xinxin Tian more than expected).

Fields of papers citing papers by Xinxin Tian

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Xinxin Tian. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Xinxin Tian. The network helps show where Xinxin Tian may publish in the future.

Co-authorship network of co-authors of Xinxin Tian

This figure shows the co-authorship network connecting the top 25 collaborators of Xinxin Tian. A scholar is included among the top collaborators of Xinxin Tian based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Xinxin Tian. Xinxin Tian is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
#WorkIndexed citations
1 0
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3 4
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7 7
8 2
9 12
10 0
11 20
12 18
13 15
14 9
15 4
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17 21
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20 3

About Xinxin Tian

Xinxin Tian is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering and Hardware and Architecture, having authored 45 papers that have together received 345 indexed citations. Recurring topics across this work include Electromagnetic Compatibility and Measurements (28 papers), Electromagnetic Compatibility and Noise Suppression (23 papers) and Microwave and Dielectric Measurement Techniques (17 papers). The work is most often cited by research in Electrical and Electronic Engineering (326 citations), Aerospace Engineering (84 citations) and Hardware and Architecture (10 citations). Xinxin Tian has collaborated with scholars based in China, United States and South Korea. Frequent co-authors include Weiheng Shao, Wenxiao Fang, Duo‐Long Wu, Yiqiang Chen, Yunfei En, Xiu Yin Zhang, Yun Huang, Lei Wang, Yaojiang Zhang and Jian‐Feng Li. Their work appears in journals such as IEEE Access, IEEE Transactions on Microwave Theory and Techniques and IEEE Transactions on Antennas and Propagation.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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