V.V.N. Obreja

820 citations

51 papers · 685 indexed · h-index 10

Electrical and Electronic Engineering top 10%
Electronic, Optical and Magnetic Materials top 10%
Polymers and Plastics top 10%
Materials Chemistry
Biomedical Engineering

Co-authors: K. Nuttall Octavian Buiu Marioara Avram Gheorghe Brezeanu Daniel Puiu Poenar S. Hall Paul Svasta Ciprian Ionescu
Topics: Silicon Carbide Semiconductor Technologies (33 papers)Advancements in Semiconductor Devices and Circuit Design (29 papers)Silicon and Solar Cell Technologies (17 papers)
Cited by: Electronic, Optical and Magnetic Materials Polymers and Plastics Electrical and Electronic Engineering
Journals: IEEE Transactions on Electron Devices Solid-State Electronics Microelectronics Reliability
Partner nations: Romania United Kingdom Singapore

In The Last Decade

V.V.N. Obreja

51 papers receiving 667 citations

Peers

Countries citing papers authored by V.V.N. Obreja

Since Specialization

Citations

This map shows the geographic impact of V.V.N. Obreja's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V.V.N. Obreja with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V.V.N. Obreja more than expected).

Fields of papers citing papers by V.V.N. Obreja

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V.V.N. Obreja. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V.V.N. Obreja. The network helps show where V.V.N. Obreja may publish in the future.

Co-authorship network of co-authors of V.V.N. Obreja

This figure shows the co-authorship network connecting the top 25 collaborators of V.V.N. Obreja. A scholar is included among the top collaborators of V.V.N. Obreja based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V.V.N. Obreja. V.V.N. Obreja is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

#	Work	Indexed citations
1	Supercapacitors specialities - Materials review 2014 ·AIP conference proceedings ·V.V.N. Obreja	39
2	Edge current induced failure of semiconductor PN junction during operation in the breakdown region of electrical characteristic 2010 ·Microelectronics Reliability ·V.V.N. Obreja,(unknown),Daniel Puiu Poenar,Octavian Buiu	6
3	Bulk and edge (surface) leakage reverse current in PN junctions from commercial semiconductor devices 2009 ·V.V.N. Obreja,(unknown)	1
4	Advance in the assembling and packaging of supercapacitor modules for higher performance 2008 ·V.V.N. Obreja	5
5	The semiconductor - dielectric interface from PN junction periphery and its influence on reliability of power devices at high temperature 2008 ·V.V.N. Obreja	1
6	The blocking leakage current of packaged silicon devices after their storage at 250 °C ambient temperature 2008 ·V.V.N. Obreja	1
7	The Voltage Dependence of Reverse Current of Semiconductor PN Junctions and its Distribution over the Device Area 2007 ·V.V.N. Obreja	3
8	On the Reliability of Power Silicon Rectifier Diodes above the Maximum Permissible Operation Junction Temperature 2006 ·V.V.N. Obreja	7
9	The Reverse Leakage Current of Present-Day Manufactured Silicon PN Junctions and Their Maximum Permissible Operation Temperature 2006 ·V.V.N. Obreja	5
10	Failure Analysis of Diode (Thyristor) Dice from Power Semiconductor Modules after Operation above the Maximum Specified Temperature 2006 ·V.V.N. Obreja,(unknown),E. Manea,(unknown),Paul Svasta	2
11	Reverse Leakage Current Instability of Power Fast Switching Diodes Operating at High Junction Temperature 2006 ·V.V.N. Obreja,(unknown),K. Nuttall	10
12	Reverse current instability of power silicon diodes (thyristors) at high temperature and the junction surface leakage current 2005 ·V.V.N. Obreja,(unknown),K. Nuttall,Octavian Buiu	9
13	The junction edge leakage current and the blocking I-V characteristics of commercial glass passivated thyristor devices 2005 ·V.V.N. Obreja,E. Manea,(unknown),Marioara Avram,(unknown)	2
14	Peaks in temperature wstribution over the area of operating power semiconductor junctions related to the surface leakage current 2005 ·V.V.N. Obreja,(unknown),K. Nuttall,(unknown)	8
15	Non-uniform junction temperature distribution in high voltage silicon diodes operating above 150 °C 2004 ·V.V.N. Obreja,(unknown),Marioara Avram,(unknown)	2
16	Catastrophic failure of power silicon PN junctions at high temperature induced by the surface leakage reverse current 2004 ·V.V.N. Obreja,Octavian Buiu,K. Nuttall,(unknown),(unknown),Pei Pan	3
17	The operation temperature of silicon power thyristors and the blocking leakage current 2004 ·2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551) ·V.V.N. Obreja,(unknown),(unknown),K. Nuttall,Octavian Buiu	9
18	Surface leakage current related failure of power silicon devices operated at high junction temperature 2003 ·Microelectronics Reliability ·K. Nuttall,Octavian Buiu,V.V.N. Obreja	11
19	Investigation on operation of silicon power devices in the breakdown region of electrical characteristic 2002 ·V.V.N. Obreja	5
20	An experimental investigation on the nature of reverse current of silicon power pn-junctions 2002 ·IEEE Transactions on Electron Devices ·V.V.N. Obreja	29

About V.V.N. Obreja

V.V.N. Obreja is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials and Automotive Engineering, having authored 51 papers that have together received 685 indexed citations. Recurring topics across this work include Silicon Carbide Semiconductor Technologies (33 papers), Advancements in Semiconductor Devices and Circuit Design (29 papers) and Silicon and Solar Cell Technologies (17 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (364 citations), Polymers and Plastics (151 citations) and Electrical and Electronic Engineering (506 citations). V.V.N. Obreja has collaborated with scholars based in Romania, United Kingdom and Singapore. Frequent co-authors include K. Nuttall, Octavian Buiu, Marioara Avram, Gheorghe Brezeanu, Daniel Puiu Poenar, S. Hall, Paul Svasta, Ciprian Ionescu, Erika Lakatos and E. Manea. Their work appears in journals such as IEEE Transactions on Electron Devices, Solid-State Electronics and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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