K. Nuttall

849 total citations
43 papers, 651 citations indexed

About

K. Nuttall is a scholar working on Electrical and Electronic Engineering, Materials Chemistry and Safety, Risk, Reliability and Quality. According to data from OpenAlex, K. Nuttall has authored 43 papers receiving a total of 651 indexed citations (citations by other indexed papers that have themselves been cited), including 24 papers in Electrical and Electronic Engineering, 15 papers in Materials Chemistry and 6 papers in Safety, Risk, Reliability and Quality. Recurrent topics in K. Nuttall's work include Advancements in Semiconductor Devices and Circuit Design (18 papers), Silicon Carbide Semiconductor Technologies (17 papers) and Nuclear Materials and Properties (11 papers). K. Nuttall is often cited by papers focused on Advancements in Semiconductor Devices and Circuit Design (18 papers), Silicon Carbide Semiconductor Technologies (17 papers) and Nuclear Materials and Properties (11 papers). K. Nuttall collaborates with scholars based in United Kingdom, Romania and Canada. K. Nuttall's co-authors include L.A. Simpson, M. P. Püls, R. Dutton, V.V.N. Obreja, R. Nicholson, M.T.C. Fang, Jiu Dun Yan, D. P. Thompson, Octavian Buiu and D. R. Faulkner and has published in prestigious journals such as Journal of Materials Science, Journal of Physics D Applied Physics and Journal of Nuclear Materials.

In The Last Decade

K. Nuttall

42 papers receiving 583 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
K. Nuttall United Kingdom 13 366 205 162 145 78 43 651
S. Kobayashi Japan 16 406 1.1× 273 1.3× 168 1.0× 321 2.2× 69 0.9× 57 772
Jonghwa Chang South Korea 12 189 0.5× 36 0.2× 186 1.1× 221 1.5× 21 0.3× 40 517
R. R. Dils United States 6 172 0.5× 130 0.6× 184 1.1× 200 1.4× 72 0.9× 13 518
Iván Fernández Spain 19 531 1.5× 148 0.7× 366 2.3× 109 0.8× 11 0.1× 57 834
Konstantin Zolnikov Russia 16 414 1.1× 77 0.4× 56 0.3× 219 1.5× 48 0.6× 133 719
Fei Huang China 15 225 0.6× 409 2.0× 199 1.2× 150 1.0× 26 0.3× 52 696
K. Shinzato Japan 13 201 0.5× 63 0.3× 144 0.9× 137 0.9× 39 0.5× 23 513
K. Ioki Germany 14 495 1.4× 28 0.1× 215 1.3× 190 1.3× 17 0.2× 61 703
Dong-Seong Sohn South Korea 16 699 1.9× 58 0.3× 500 3.1× 154 1.1× 5 0.1× 91 854
A.E. Rusanov Russia 16 993 2.7× 41 0.2× 730 4.5× 390 2.7× 10 0.1× 23 1.2k

Countries citing papers authored by K. Nuttall

Since Specialization
Citations

This map shows the geographic impact of K. Nuttall's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Nuttall with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Nuttall more than expected).

Fields of papers citing papers by K. Nuttall

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Nuttall. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Nuttall. The network helps show where K. Nuttall may publish in the future.

Co-authorship network of co-authors of K. Nuttall

This figure shows the co-authorship network connecting the top 25 collaborators of K. Nuttall. A scholar is included among the top collaborators of K. Nuttall based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with K. Nuttall. K. Nuttall is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Obreja, V.V.N., et al.. (2006). Reverse Leakage Current Instability of Power Fast Switching Diodes Operating at High Junction Temperature. 43. 537–540. 10 indexed citations
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Obreja, V.V.N., et al.. (2004). The operation temperature of silicon power thyristors and the blocking leakage current. 2004 IEEE 35th Annual Power Electronics Specialists Conference (IEEE Cat. No.04CH37551). 43. 2990–2993. 9 indexed citations
6.
Nuttall, K., Octavian Buiu, & V.V.N. Obreja. (2003). Surface leakage current related failure of power silicon devices operated at high junction temperature. Microelectronics Reliability. 43(9-11). 1913–1918. 11 indexed citations
7.
Wu, Qinghua, et al.. (2003). Power System Load Modeling by Evolutionary Computation Based on System Measurements. Electric Power Components and Systems. 31(5). 423–439. 5 indexed citations
8.
Wu, Qinghua, et al.. (2002). Accurate fault location based on transients extraction using mathematical morphology. Electronics Letters. 38(24). 1583–1585. 17 indexed citations
9.
McDaid, Liam, S. Hall, K. Nuttall, & W. Eccleston. (1992). Comparison of instabilities observed in electrical characteristics of silicon-on-insulator MOSFETs, both above and below threshold voltage. Electronics Letters. 28(15). 1441–1442. 1 indexed citations
10.
Nuttall, K., et al.. (1991). The Canadian approach to safe, permanent disposal of nuclear fuel waste. Nuclear Engineering and Design. 129(1). 109–117. 19 indexed citations
11.
Nuttall, K., et al.. (1987). Control of avalanche injection in bipolar transistors through the use of graded collector impurity profiles. IEE Proceedings I Solid State and Electron Devices. 134(5). 141–141. 1 indexed citations
12.
Walker, Peter, et al.. (1985). A numerical analysis of the resurf diode structure. IEE Proceedings I Solid State and Electron Devices. 132(6). 285–285. 2 indexed citations
13.
Cameron, D.J., et al.. (1983). The Development of Durable, Man-Made Containment Systems for Fuel Isolation. Canadian Metallurgical Quarterly. 22(1). 87–101. 8 indexed citations
14.
Nuttall, K., et al.. (1981). A study of the current distribution established in npn epitaxial transistors during current mode second breakdown. International Journal of Electronics. 50(2). 93–108. 1 indexed citations
15.
Nuttall, K., et al.. (1978). Investigation into the survival of epitaxial bipolar transistors in current mode second breakdown. Electronics Letters. 14(4). 100–101. 4 indexed citations
16.
Dutton, R., K. Nuttall, M. P. Püls, & L.A. Simpson. (1977). Mechanisms of hydrogen induced delayed cracking in hydride forming materials. Metallurgical Transactions A. 8(10). 1553–1562. 196 indexed citations
17.
Nuttall, K., et al.. (1976). Metallographic observations of the interaction of hydride, stress and crack growth at 600°K in a Zr-2.5% Nb alloy. Scripta Metallurgica. 10(11). 979–982. 13 indexed citations
18.
Nuttall, K. & D. P. Thompson. (1974). Observations on the microstructure of hot-pressed silicon nitride. Journal of Materials Science. 9(5). 850–853. 28 indexed citations
19.
Nuttall, K.. (1971). Strain-rate sensitivity in superplastic metals. International Journal of Mechanical Sciences. 13(1). 83–85. 4 indexed citations
20.
Nuttall, K., et al.. (1968). Behaviour of silicon pn junctions at temperatures between 4-2 and 300° K†. International Journal of Electronics. 24(1). 69–78. 4 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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