V. Ku
Impact in
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- Plasma Diagnostics and Applications
- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Electrohydrodynamics and Fluid Dynamics
- Integrated Circuits and Semiconductor Failure Analysis
- Electrostatic Discharge in Electronics
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- Dust and Plasma Wave Phenomena
Papers in ⓘ
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- Dust and Plasma Wave Phenomena 3
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- Semiconductor materials and devices 4
- Plasma Diagnostics and Applications 4
- Advancements in Semiconductor Devices and Circuit Design 2
- Electrohydrodynamics and Fluid Dynamics 2
- Integrated Circuits and Semiconductor Failure Analysis 1
- Co-authors
- J. E. Allen (3 shared papers)B. M. Annaratone (3 shared papers)N. Rovedo (1 shared paper)V. Chan (1 shared paper)D. Lea (1 shared paper)Padraic Shafer (1 shared paper)Xiangdong Chen (1 shared paper)Shih-Fen Huang (1 shared paper)
- Journals
- Journal of Applied Physics (3 papers)ECS Transactions (2 papers)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)
- Partner nations
- United KingdomUnited StatesGermany
In The Last Decade
V. Ku
7 papers receiving 163 citations
Peers
Comparison fields: 5 of 19
- Electrical and Electronic Engineering 177
- Atomic and Molecular Physics, and Optics 60
- Mechanics of Materials 27
- Radiology, Nuclear Medicine and Imaging 24
- Nuclear and High Energy Physics 10
Countries citing papers authored by V. Ku
This map shows the geographic impact of V. Ku's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Ku with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Ku more than expected).
Fields of papers citing papers by V. Ku
This network shows the impact of papers produced by V. Ku. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Ku. The network helps show where V. Ku may publish in the future.
Co-authors
The 25 scholars most cited alongside V. Ku, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 58 | |
| 2 | 1995 | 51 | |
| 3 | 1998 | 45 | |
| 4 | 1998 | 19 | |
| 5 | 1999 | 5 | |
| 6 | 2008 | 2 | |
| 7 | 2008 | 1 |
About V. Ku
V. Ku is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Aerospace Engineering and Biomedical Engineering, having authored 7 papers that have together received 181 indexed citations. Recurring topics across this work include Semiconductor materials and devices (4 papers), Plasma Diagnostics and Applications (4 papers), Dust and Plasma Wave Phenomena (3 papers), Copper Interconnects and Reliability (2 papers), Advancements in Semiconductor Devices and Circuit Design (2 papers), Electrohydrodynamics and Fluid Dynamics (2 papers), Integrated Circuits and Semiconductor Failure Analysis (1 paper) and Particle accelerators and beam dynamics (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (177 citations), Atomic and Molecular Physics, and Optics (60 citations), Mechanics of Materials (27 citations), Radiology, Nuclear Medicine and Imaging (24 citations) and Nuclear and High Energy Physics (10 citations). V. Ku has collaborated with scholars based in United Kingdom, United States and Germany. Frequent co-authors include J. E. Allen, B. M. Annaratone, N. Rovedo, V. Chan, D. Lea, Padraic Shafer, Xiangdong Chen, Shih-Fen Huang, R. Rengarajan and Terence B. Hook. Their work appears in journals such as Journal of Applied Physics, ECS Transactions and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.