V. Gehanno

18 papers receiving 623 citations

Peers

V. Gehanno
Comparison fields: 5 of 44
  • Electronic, Optical and Magnetic Materials 346
  • Atomic and Molecular Physics, and Optics 487
  • Condensed Matter Physics 136
  • General Materials Science 29
  • Structural Biology 8
Replace Y. Hosoe with:
Y. Hosoe Japan
S. S. Malhotra United States
M. Al-Khafaji United Kingdom
B. C. Lim Singapore
D. Halley France
D. Spoddig Germany
X. Bian Canada
Kentaro Toyoki Japan
K. Rubin United States
R. J. M. van de Veerdonk United States
V. Gehanno relative to Y. Hosoe Japan Y. Hosoe's profile →
Citations per field
00.5×
Y. Hosoe · 1×
Citations per year

Countries citing papers authored by V. Gehanno

Since Specialization
Citations

This map shows the geographic impact of V. Gehanno's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Gehanno with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Gehanno more than expected).

Fields of papers citing papers by V. Gehanno

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Gehanno. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Gehanno. The network helps show where V. Gehanno may publish in the future.

Co-authors

The 25 scholars most cited alongside V. Gehanno, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with V. Gehanno Line = papers co-authored together V. Gehanno links everyone, so they are left out of the graph.

All Works

18 of 18 papers shown
#Work
1 1997164
2 1999114
3 199791
4 199966
5 199930
6 199828
7 199925
8 200120
9 200220
10 199818
11 199914
12 200112
13 200211
14 19997
15 19986
16 19955
17 19993
18 19961

About V. Gehanno

V. Gehanno is a scholar working on Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Condensed Matter Physics, Electrical and Electronic Engineering and Materials Chemistry, having authored 18 papers that have together received 635 indexed citations. Recurring topics across this work include Magnetic properties of thin films (14 papers), Magnetic Properties and Applications (12 papers), Magnetic Properties of Alloys (4 papers), Phase-change materials and chalcogenides (3 papers), Theoretical and Computational Physics (2 papers), Semiconductor materials and devices (2 papers), Chalcogenide Semiconductor Thin Films (2 papers) and Electron and X-Ray Spectroscopy Techniques (1 paper). The work is most often cited by research in Electronic, Optical and Magnetic Materials (346 citations), Atomic and Molecular Physics, and Optics (487 citations), Condensed Matter Physics (136 citations), General Materials Science (29 citations) and Structural Biology (8 citations). V. Gehanno has collaborated with scholars based in France, Portugal and United Kingdom. Frequent co-authors include A. Marty, B. Gilles, Y. Samson, P. P. Freitas, A. Chamberod, Susana Cardoso, Ricardo Ferreira, Bernardo Almeida, A. Kling and J.C. Soares. Their work appears in journals such as Journal of Magnetism and Magnetic Materials, IEEE Transactions on Magnetics, Journal of Applied Physics, Physical review. B, Condensed matter and The European Physical Journal B.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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