V. Damian

485 total citations
68 papers, 393 citations indexed

About

V. Damian is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering and Computer Vision and Pattern Recognition. According to data from OpenAlex, V. Damian has authored 68 papers receiving a total of 393 indexed citations (citations by other indexed papers that have themselves been cited), including 26 papers in Electrical and Electronic Engineering, 23 papers in Mechanical Engineering and 17 papers in Computer Vision and Pattern Recognition. Recurrent topics in V. Damian's work include Advanced Measurement and Metrology Techniques (23 papers), Optical measurement and interference techniques (17 papers) and Photonic and Optical Devices (13 papers). V. Damian is often cited by papers focused on Advanced Measurement and Metrology Techniques (23 papers), Optical measurement and interference techniques (17 papers) and Photonic and Optical Devices (13 papers). V. Damian collaborates with scholars based in Romania, France and Czechia. V. Damian's co-authors include Nicolae Hurduc, Adrian Dobroiu, Ion Sava, C. Logofatu, Ana-Maria Resmeriță, Liviu Săcărescu, Gabriela Lisă, Iuliana Stoica, Mihai A. Petrovici and Angela Staicu and has published in prestigious journals such as Polymer, Journal of Applied Polymer Science and Measurement Science and Technology.

In The Last Decade

V. Damian

62 papers receiving 377 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
V. Damian Romania	11	104	104	101	83	80	68	393
Xiaotian Li China	14	85 0.8×	87 0.8×	183 1.8×	11 0.1×	44 0.6×	44	473
Helen D. Ford United Kingdom	13	72 0.7×	56 0.5×	112 1.1×	21 0.3×	14 0.2×	47	497
Mehmet Nacı Incı Türkiye	12	61 0.6×	41 0.4×	261 2.6×	27 0.3×	29 0.4×	49	436
Jin-Yuan Hsieh Taiwan	12	23 0.2×	56 0.5×	60 0.6×	21 0.3×	26 0.3×	45	434
Chunhui Niu China	11	70 0.7×	18 0.2×	137 1.4×	15 0.2×	52 0.7×	46	353
Serhat Özder Türkiye	10	119 1.1×	38 0.4×	165 1.6×	53 0.6×	5 0.1×	48	340
C. Beitia France	11	22 0.2×	43 0.4×	361 3.6×	63 0.8×	11 0.1×	39	649
Il Kweon Moon South Korea	8	16 0.2×	64 0.6×	54 0.5×	14 0.2×	29 0.4×	22	342
Bowen Zhang China	13	112 1.1×	15 0.1×	51 0.5×	123 1.5×	23 0.3×	25	528

Countries citing papers authored by V. Damian

Since Specialization

Citations

This map shows the geographic impact of V. Damian's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by V. Damian with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites V. Damian more than expected).

Fields of papers citing papers by V. Damian

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by V. Damian. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by V. Damian. The network helps show where V. Damian may publish in the future.

Co-authorship network of co-authors of V. Damian

This figure shows the co-authorship network connecting the top 25 collaborators of V. Damian. A scholar is included among the top collaborators of V. Damian based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with V. Damian. V. Damian is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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20 of 20 papers shown

Damian, V., et al.. (2018). Super resolution terahertz imaging by subpixel estimation: application to hyperspectral beam profiling. Journal of Optics. 20(5). 55701–55701. 3 indexed citations

Damian, V., et al.. (2016). 3D THz hyperspectrum applied in security check-in. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 10010. 100100Y–100100Y. 8 indexed citations

Damian, V., et al.. (2015). Single pixel sensing for THz laser beam profiler based on Hadamard Transform. Optics & Laser Technology. 79. 173–178. 27 indexed citations

Staicu, Angela, et al.. (2015). Minimal invasive control of paintings cleaning by LIBS. Optics & Laser Technology. 77. 187–192. 17 indexed citations

Damian, V., Iuliana Stoica, Constanţa Ibănescu, et al.. (2014). Surface relief gratings induced by pulsed laser irradiation in low glass‐transition temperature azopolysiloxanes. Journal of Applied Polymer Science. 131(24). 12 indexed citations

Staicu, Angela, et al.. (2012). Laser induced breakdown spectroscopy stratigraphic characterization of multilayered painted surfaces. Spectrochimica Acta Part B Atomic Spectroscopy. 74-75. 151–155. 11 indexed citations

Damian, V., et al.. (2012). Optical analyses of pulsed interferometric patterning of azo-polysiloxanes. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 8411. 841128–841128. 1 indexed citations

Damian, V., et al.. (2009). Fourier transform spectra of quantum dots. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7469. 74690E–74690E. 2 indexed citations

Rosu, M., et al.. (2008). IntelliWave interferometric analysis software in laser interferometry laboratory. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 7297. 729718–729718. 1 indexed citations

10.

Logofatu, C., et al.. (2007). <title>Fourier transform digital holography</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 678522–678522. 2 indexed citations

11.

Damian, V., et al.. (2007). <title>Optical encoder measurement technology</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 663506–663506. 4 indexed citations

12.

Logofatu, C., et al.. (2006). Abelès method revisited. Applied Optics. 45(6). 1120–1120. 4 indexed citations

13.

Garoi, F., et al.. (2005). <title>Absolute measurement of length with nanometric resolution</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 59720K–59720K. 1 indexed citations

14.

Damian, V., et al.. (2005). Polymer thin film refractive index determination. 2. 441–444. 1 indexed citations

15.

Damian, V., et al.. (2005). On a diffractive optical element. 2. 513–516. 1 indexed citations

16.

Dobroiu, Adrian, et al.. (2004). <title>Statistical errors on Newton fringe pattern digital processing</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 788–796. 10 indexed citations

17.

Damian, V., et al.. (2004). <title>Flatness nanometrology of large optically rough areas</title>. Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE. 797–802. 1 indexed citations

18.

Dobroiu, Adrian, et al.. (2002). Tilt-compensating algorithm for phase-shift interferometry. Applied Optics. 41(13). 2435–2435. 21 indexed citations

19.

Dobroiu, Adrian, et al.. (1998). Self-calibrating algorithm for three-sample phase-shift interferometry by contrast levelling. Measurement Science and Technology. 9(5). 744–750. 15 indexed citations

20.

Dobroiu, Adrian, et al.. (1997). Statistical self-calibrating algorithm for three-sample phase-shift interferometry. Measurement Science and Technology. 8(7). 738–745. 13 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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