T.F. Retajczyk
Impact in
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- Semiconductor materials and devices
- Thin-Film Transistor Technologies
- Advanced MEMS and NEMS Technologies
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- Semiconductor materials and interfaces
Papers in ⓘ
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- Analytical Chemistry and Sensors 2
- Co-authors
- A. K. Sinha (1 shared paper)S. P. Murarka (2 shared papers)D. B. Fraser (1 shared paper)T. T. Sheng (1 shared paper)David K. Roe (1 shared paper)Y. Okinaka (1 shared paper)R. Sard (1 shared paper)R.H. Krambeck (2 shared papers)
- Journals
- IEEE Journal of Solid-State Circuits (3 papers)Journal of Applied Physics (2 papers)Journal of The Electrochemical Society (2 papers)Microelectronics Reliability (1 paper)Applied Physics Letters (1 paper)
- Partner nations
- United States
In The Last Decade
T.F. Retajczyk
13 papers receiving 306 citations
Peers
Comparison fields: 5 of 40
- Electrical and Electronic Engineering 229
- Atomic and Molecular Physics, and Optics 102
- Mechanics of Materials 74
- Electronic, Optical and Magnetic Materials 55
- Ceramics and Composites 16
Countries citing papers authored by T.F. Retajczyk
This map shows the geographic impact of T.F. Retajczyk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.F. Retajczyk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.F. Retajczyk more than expected).
Fields of papers citing papers by T.F. Retajczyk
This network shows the impact of papers produced by T.F. Retajczyk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.F. Retajczyk. The network helps show where T.F. Retajczyk may publish in the future.
Co-authors
The 19 scholars most cited alongside T.F. Retajczyk, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1980 | 130 | |
| 2 | 1983 | 63 | |
| 3 | 1980 | 57 | |
| 4 | 1980 | 26 | |
| 5 | 1974 | 22 | |
| 6 | 1968 | 10 | |
| 7 | 1985 | 10 | |
| 8 | 1974 | 6 | |
| 9 | 1974 | 5 | |
| 10 | 1976 | 3 | |
| 11 | 1973 | 2 | |
| 12 | 1976 | 2 | |
| 13 | 1977 | 2 | |
| 14 | 1983 | 1 | |
| 15 | 1976 | 1 |
About T.F. Retajczyk
T.F. Retajczyk is a scholar working on Bioengineering, Instrumentation, Ceramics and Composites, Electrical and Electronic Engineering and Electrochemistry, having authored 15 papers that have together received 340 indexed citations. Recurring topics across this work include Semiconductor materials and devices (6 papers), Metal and Thin Film Mechanics (3 papers), CCD and CMOS Imaging Sensors (3 papers), Semiconductor materials and interfaces (3 papers), Transition Metal Oxide Nanomaterials (2 papers), Analytical Chemistry and Sensors (2 papers), Recycling and Waste Management Techniques (1 paper) and Analog and Mixed-Signal Circuit Design (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (229 citations), Atomic and Molecular Physics, and Optics (102 citations), Mechanics of Materials (74 citations), Electronic, Optical and Magnetic Materials (55 citations) and Ceramics and Composites (16 citations). T.F. Retajczyk has collaborated with scholars based in United States. Frequent co-authors include A. K. Sinha, S. P. Murarka, A. K. Sinha, D. B. Fraser, T. T. Sheng, David K. Roe, Y. Okinaka, R. Sard, R.H. Krambeck and A.M. Mohsen. Their work appears in journals such as IEEE Journal of Solid-State Circuits, Journal of Applied Physics, Journal of The Electrochemical Society, Microelectronics Reliability and Applied Physics Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.