T.F. Retajczyk

421 total citations
15 papers, 340 citations indexed

About

T.F. Retajczyk is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics and Mechanics of Materials. According to data from OpenAlex, T.F. Retajczyk has authored 15 papers receiving a total of 340 indexed citations (citations by other indexed papers that have themselves been cited), including 10 papers in Electrical and Electronic Engineering, 4 papers in Atomic and Molecular Physics, and Optics and 3 papers in Mechanics of Materials. Recurrent topics in T.F. Retajczyk's work include Semiconductor materials and devices (6 papers), CCD and CMOS Imaging Sensors (3 papers) and Semiconductor materials and interfaces (3 papers). T.F. Retajczyk is often cited by papers focused on Semiconductor materials and devices (6 papers), CCD and CMOS Imaging Sensors (3 papers) and Semiconductor materials and interfaces (3 papers). T.F. Retajczyk collaborates with scholars based in United States. T.F. Retajczyk's co-authors include A. K. Sinha, S. P. Murarka, A. K. Sinha, D. B. Fraser, T. T. Sheng, David K. Roe, R. Sard, Y. Okinaka, R. V. Knoell and Shefali Vaidya and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.

In The Last Decade

T.F. Retajczyk

13 papers receiving 306 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name	h						Papers	Cites
T.F. Retajczyk United States	7	229	106	102	77	74	15	340
H. A. Vander Plas United States	9	216 0.9×	124 1.2×	115 1.1×	29 0.4×	41 0.6×	15	295
D. H. Hensler United States	6	198 0.9×	83 0.8×	66 0.6×	56 0.7×	65 0.9×	8	353
D. Chidambarrao United States	12	398 1.7×	114 1.1×	132 1.3×	94 1.2×	76 1.0×	43	514
James G. Ryan United States	10	224 1.0×	117 1.1×	66 0.6×	68 0.9×	82 1.1×	25	352
A Stoffel Germany	10	251 1.1×	67 0.6×	114 1.1×	133 1.7×	40 0.5×	20	341
S. H. Rou United States	11	201 0.9×	332 3.1×	67 0.7×	132 1.7×	62 0.8×	25	406
K. Hieber Germany	9	253 1.1×	65 0.6×	98 1.0×	33 0.4×	148 2.0×	25	345
L. Nesbit United States	10	311 1.4×	264 2.5×	78 0.8×	115 1.5×	42 0.6×	14	452
N. Owada Japan	9	214 0.9×	77 0.7×	60 0.6×	126 1.6×	65 0.9×	24	306
M. Finetti Finland	15	509 2.2×	112 1.1×	368 3.6×	38 0.5×	57 0.8×	44	597

Countries citing papers authored by T.F. Retajczyk

Since Specialization

Citations

This map shows the geographic impact of T.F. Retajczyk's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T.F. Retajczyk with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T.F. Retajczyk more than expected).

Fields of papers citing papers by T.F. Retajczyk

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T.F. Retajczyk. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T.F. Retajczyk. The network helps show where T.F. Retajczyk may publish in the future.

Co-authorship network of co-authors of T.F. Retajczyk

This figure shows the co-authorship network connecting the top 25 collaborators of T.F. Retajczyk. A scholar is included among the top collaborators of T.F. Retajczyk based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T.F. Retajczyk. T.F. Retajczyk is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

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15 of 15 papers shown

Vaidya, Shefali, T.F. Retajczyk, & R. V. Knoell. (1985). Effect of dopant implantation on the properties of TaSi2/poly-Si composites. Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena. 3(3). 846–852. 10 indexed citations

Retajczyk, T.F. & P.K. Gallagher. (1983). Properties of plasma-deposited films using ethylene and fluoroethylenes as starting monomers. Materials Letters. 2(1). 23–26. 1 indexed citations

Murarka, S. P. & T.F. Retajczyk. (1983). Effect of phosphorus doping on stress in silicon and polycrystalline silicon. Journal of Applied Physics. 54(4). 2069–2072. 63 indexed citations

Retajczyk, T.F. & A. K. Sinha. (1980). Elastic stiffness and thermal expansion coefficient of BN films. Applied Physics Letters. 36(2). 161–163. 57 indexed citations

Murarka, S. P., D. B. Fraser, T.F. Retajczyk, & T. T. Sheng. (1980). Cosputtered molybdenum silicides on thermal SiO2. Journal of Applied Physics. 51(10). 5380–5385. 26 indexed citations

Retajczyk, T.F. & A. K. Sinha. (1980). Elastic stiffness and thermal expansion coefficients of various refractory silicides and silicon nitride films. Thin Solid Films. 70(2). 241–247. 130 indexed citations

Retajczyk, T.F. & Wayne A. Larsen. (1977). Statistical methods for estimating variance components for integrated circuits device parameters. Microelectronics Reliability. 16(5). 561–566. 2 indexed citations

Mohsen, A.M. & T.F. Retajczyk. (1976). Fabrication and performance of offset-mask charge-coupled devices. IEEE Transactions on Electron Devices. 23(2). 248–256. 1 indexed citations

Mohsen, A.M. & T.F. Retajczyk. (1976). Fabrication and performance of offset-mask charge-coupled devices. IEEE Journal of Solid-State Circuits. 11(1). 180–188. 2 indexed citations

10.

Krambeck, R.H., T.F. Retajczyk, & L.D. Yau. (1976). Low frequency transfer efficiency of E-beam fabricated conductively connected charge-coupled device. IEEE Journal of Solid-State Circuits. 11(1). 171–180. 3 indexed citations

11.

Mohsen, A.M., T.F. Retajczyk, & Carlo H. Séquin. (1974). Offset mask charge coupled devices for memory applications. 4–4. 5 indexed citations

12.

Okinaka, Y., et al.. (1974). Some Practical Aspects of Electroless Gold Plating. Journal of The Electrochemical Society. 121(1). 56–56. 22 indexed citations

13.

Krambeck, R.H., T.F. Retajczyk, D. J. Silversmith, & R.J. Strain. (1974). A 4160-bit C4D serial memory. IEEE Journal of Solid-State Circuits. 9(6). 436–443. 6 indexed citations

14.

Knolle, W. R. & T.F. Retajczyk. (1973). Monitoring Sodium Contamination in Silicon Devices and Processing Materials by Flame Emission Spectrometry. Journal of The Electrochemical Society. 120(8). 1106–1106. 2 indexed citations

15.

Retajczyk, T.F. & David K. Roe. (1968). Phase selective sampling in a.c. polarography and application to direct measurement of double-layer capacity. Journal of Electroanalytical Chemistry. 16(1). 21–32. 10 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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