Tarek Lutz
- Materials Chemistry
- Electrical and Electronic Engineering
- Biomedical Engineering
- Atomic and Molecular Physics, and Optics
- Mechanical Engineering
- Co-authors
- Georg S. DuesbergJohn J. BolandShishir KumarPeter Niraj NirmalrajSoon Jung JungJustin D. HolmesMarkus BoeseGareth P. Keeley
- Topics
- Advancements in Photolithography Techniques (6 papers)Graphene research and applications (5 papers)Electron and X-Ray Spectroscopy Techniques (5 papers)
- Cited by
- Materials ChemistryElectrical and Electronic EngineeringElectronic, Optical and Magnetic Materials
- Partner nations
- GermanyIrelandUnited Kingdom
In The Last Decade
Tarek Lutz
23 papers receiving 437 citations
Peers
Comparison fields: 5 of 44
- Materials Chemistry 277
- Electrical and Electronic Engineering 212
- Biomedical Engineering 137
- Atomic and Molecular Physics, and Optics 69
- Mechanical Engineering 67
Countries citing papers authored by Tarek Lutz
This map shows the geographic impact of Tarek Lutz's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Tarek Lutz with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Tarek Lutz more than expected).
Fields of papers citing papers by Tarek Lutz
This network shows the impact of papers produced by Tarek Lutz. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Tarek Lutz. The network helps show where Tarek Lutz may publish in the future.
Co-authorship network of co-authors of Tarek Lutz
This figure shows the co-authorship network connecting the top 25 collaborators of Tarek Lutz. A scholar is included among the top collaborators of Tarek Lutz based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with Tarek Lutz. Tarek Lutz is excluded from the visualization to improve readability, since they are connected to all nodes in the network.
All Works
| # | Work | Indexed citations |
|---|---|---|
| 1 | 1 | |
| 2 | 0 | |
| 3 | 4 | |
| 4 | 12 | |
| 5 | 24 | |
| 6 | 30 | |
| 7 | 11 | |
| 8 | 18 | |
| 9 | 21 | |
| 10 | 11 | |
| 11 | 10 | |
| 12 | 20 | |
| 13 | 168 | |
| 14 | 38 | |
| 15 | 8 | |
| 16 | 12 | |
| 17 | 3 | |
| 18 | 2 | |
| 19 | 2 | |
| 20 | 12 |
About Tarek Lutz
Tarek Lutz is a scholar working on Surfaces, Coatings and Films, Metals and Alloys and Materials Chemistry, having authored 25 papers that have together received 448 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (6 papers), Graphene research and applications (5 papers) and Electron and X-Ray Spectroscopy Techniques (5 papers). The work is most often cited by research in Materials Chemistry (277 citations), Electrical and Electronic Engineering (212 citations) and Electronic, Optical and Magnetic Materials (64 citations). Tarek Lutz has collaborated with scholars based in Germany, Ireland and United Kingdom. Frequent co-authors include Georg S. Duesberg, John J. Boland, Shishir Kumar, Peter Niraj Nirmalraj, Soon Jung Jung, Justin D. Holmes, Markus Boese, Gareth P. Keeley, Werner J. Blau and Niall McEvoy. Their work appears in journals such as Nano Letters, Applied Physics Letters and Journal of Applied Physics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.