T W Ryan

702 total citations
33 papers, 589 citations indexed

About

T W Ryan is a scholar working on Materials Chemistry, Atomic and Molecular Physics, and Optics and Condensed Matter Physics. According to data from OpenAlex, T W Ryan has authored 33 papers receiving a total of 589 indexed citations (citations by other indexed papers that have themselves been cited), including 16 papers in Materials Chemistry, 12 papers in Atomic and Molecular Physics, and Optics and 8 papers in Condensed Matter Physics. Recurrent topics in T W Ryan's work include Solid-state spectroscopy and crystallography (9 papers), Inorganic Fluorides and Related Compounds (5 papers) and Semiconductor materials and interfaces (4 papers). T W Ryan is often cited by papers focused on Solid-state spectroscopy and crystallography (9 papers), Inorganic Fluorides and Related Compounds (5 papers) and Semiconductor materials and interfaces (4 papers). T W Ryan collaborates with scholars based in United Kingdom, Netherlands and United States. T W Ryan's co-authors include R. A. Cowley, R. J. Nelmes, A. Gibaud, E. Courtens, S. Bates, C. J. Howard, W. F. Kuhs, J. E. Tibballs, C. A. Lucas and Erling Fjær and has published in prestigious journals such as Physical Review Letters, Physical review. B, Condensed matter and Applied Physics Letters.

In The Last Decade

T W Ryan

31 papers receiving 547 citations

Peers — A (Enhanced Table)

Peers by citation overlap · career bar shows stage (early→late) cites · hero ref

Name h Career Trend Papers Cites
T W Ryan United Kingdom 14 371 170 153 108 106 33 589
P. Kéghélian France 12 653 1.8× 93 0.5× 193 1.3× 116 1.1× 54 0.5× 15 795
Mareo Ishigame Japan 14 422 1.1× 110 0.6× 157 1.0× 240 2.2× 73 0.7× 35 626
T. Yamadaya Japan 14 212 0.6× 201 1.2× 82 0.5× 77 0.7× 219 2.1× 43 479
В. И. Зиненко Russia 12 456 1.2× 272 1.6× 121 0.8× 198 1.8× 96 0.9× 107 630
M. Lemonnier France 14 272 0.7× 64 0.4× 152 1.0× 164 1.5× 88 0.8× 28 698
Edward Siegel United States 10 468 1.3× 247 1.5× 140 0.9× 157 1.5× 55 0.5× 37 653
J. Guo United States 15 391 1.1× 136 0.8× 249 1.6× 124 1.1× 234 2.2× 24 719
N. Ayres de Campos Portugal 16 659 1.8× 228 1.3× 192 1.3× 427 4.0× 152 1.4× 66 1.1k
F. Wallrafen Germany 15 429 1.2× 210 1.2× 144 0.9× 185 1.7× 31 0.3× 42 611
J. R. Schneider Germany 12 253 0.7× 62 0.4× 150 1.0× 80 0.7× 145 1.4× 31 527

Countries citing papers authored by T W Ryan

Since Specialization
Citations

This map shows the geographic impact of T W Ryan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T W Ryan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T W Ryan more than expected).

Fields of papers citing papers by T W Ryan

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by T W Ryan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T W Ryan. The network helps show where T W Ryan may publish in the future.

Co-authorship network of co-authors of T W Ryan

This figure shows the co-authorship network connecting the top 25 collaborators of T W Ryan. A scholar is included among the top collaborators of T W Ryan based on the total number of citations received by their joint publications. Widths of edges represent the number of papers authors have co-authored together. Node borders signify the number of papers an author published with T W Ryan. T W Ryan is excluded from the visualization to improve readability, since they are connected to all nodes in the network.

All Works

20 of 20 papers shown
1.
Ryan, T W, et al.. (2007). XRD and Photoluminescence Whole-Wafer Mapping of 4H-SiC Wafers. Materials science forum. 556-557. 299–302. 2 indexed citations
2.
Ryan, T W. (2001). The Development of Instrumentation for Thin-Film X-ray Diffraction. Journal of Chemical Education. 78(5). 613–613. 9 indexed citations
3.
Ryan, T W, et al.. (2000). XRD and Optical Characterisation of GaN and Associated Substrate Materials. Materials science forum. 321-324. 1056–1061. 2 indexed citations
4.
Xiao, Q. F., R. J. Kennedy, T W Ryan, & Brian York. (1998). Multifiber Polycapillary Collimator for X-Ray Powder Diffraction. Materials science forum. 278-281. 236–241. 5 indexed citations
5.
Koppensteiner, E., T W Ryan, M. Heuken, & J. Söllner. (1993). Combining four-crystal seven-reflection and three-crystal five-reflection diffractometry for the characterization of ZnSe layers grown on GaAs by MOVPE. Journal of Physics D Applied Physics. 26(4A). A35–A40. 10 indexed citations
6.
Aarnink, W.A.M., M.A.J. Verhoeven, G.J. Gerritsma, et al.. (1992). (305) SrTiO3 as substrate for coherently tilted epitaxial YBa2Cu3Ox thin films. Applied Physics Letters. 61(5). 607–609. 19 indexed citations
7.
Bársony, I., et al.. (1991). X-Ray Diffraction Analysis of Damage and Doping Effects in Low-Dose, High-Energy Implanted Silicon. MRS Proceedings. 235. 1 indexed citations
8.
Ryan, T W, et al.. (1990). Characterization of a large linear ion source. Journal of Vacuum Science & Technology A Vacuum Surfaces and Films. 8(4). 3284–3288. 2 indexed citations
9.
Lischka, K., E.J. Fantner, T W Ryan, & H. Sitter. (1989). X-ray rocking curves from (100) and (111) CdTe grown on (100) GaAs by hot wall epitaxy. Applied Physics Letters. 55(13). 1309–1311. 16 indexed citations
10.
Bates, S., et al.. (1987). Grazing Incidence X-Ray Scattering Studies of Single Quantum Wells. Advances in X-ray Analysis. 31. 155–160. 4 indexed citations
11.
Cowley, R. A. & T W Ryan. (1987). X-ray scattering studies of thin films and surfaces: thermal oxides on silicon. Journal of Physics D Applied Physics. 20(1). 61–68. 103 indexed citations
12.
Gibaud, A., T W Ryan, & R. J. Nelmes. (1987). Critical fluctuations in RbCaF3. I. A high-resolution X-ray scattering study. Journal of Physics C Solid State Physics. 20(25). 3833–3848. 30 indexed citations
13.
Ryan, T W, et al.. (1987). X-ray scattering from a single-quantum-well heterostructure. Semiconductor Science and Technology. 2(4). 241–243. 17 indexed citations
14.
Ryan, T W, R. J. Nelmes, R. A. Cowley, & A. Gibaud. (1986). Observation of Two Length Scales for the Critical Fluctuations of RbCaF3. Physical Review Letters. 56(25). 2704–2707. 54 indexed citations
15.
Ryan, T W. (1986). A high-resolution X-ray scattering study of monoclinic incommensurate BaMnF4. Journal of Physics C Solid State Physics. 19(8). 1097–1106. 15 indexed citations
16.
Ryan, T W, R. A. Cowley, & S. R. Andrews. (1986). An experimental study of the effect of random fields in BaMnF4: a material with continuous symmetry. Journal of Physics C Solid State Physics. 19(6). L113–L118. 12 indexed citations
17.
Cowley, R. A., T W Ryan, & E. Courtens. (1986). The structure of the glass phase of Rb1?x(ND4)xD2PO4. The European Physical Journal B. 65(2). 181–192. 46 indexed citations
18.
Fjær, Erling, R. A. Cowley, & T W Ryan. (1985). X-ray diffraction study of incommensurate (N(CH3)4)2CoCl4-consequences of radiation damage. Journal of Physics C Solid State Physics. 18(2). L41–L46. 29 indexed citations
19.
Nelmes, R. J., W. F. Kuhs, C. J. Howard, J. E. Tibballs, & T W Ryan. (1985). Structural ordering below Tcin KDP and DKDP. Journal of Physics C Solid State Physics. 18(24). L711–L716. 32 indexed citations
20.
Cox, D. E., S. M. Shapiro, R. J. Nelmes, et al.. (1983). X-ray- and neutron-diffraction measurements on BaMnF4. Physical review. B, Condensed matter. 28(3). 1640–1643. 29 indexed citations

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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